Invited Session I
Proc. SPIE 5250, Density-related properties of metal oxide films, 0000 (25 February 2004); doi: 10.1117/12.513891
Proc. SPIE 5250, Optical thin films serving biotechnology: fluorescence enhancement of DNA chip, 0000 (25 February 2004); doi: 10.1117/12.516261
Nanotechnology and Structured Films I
Proc. SPIE 5250, Metal island films for optics, 0000 (25 February 2004); doi: 10.1117/12.511795
Proc. SPIE 5250, CdSe nanocrystals in sol-gel microcavities, 0000 (25 February 2004); doi: 10.1117/12.513417
Proc. SPIE 5250, Interferential powders for the spectral control of light scattering, 0000 (25 February 2004); doi: 10.1117/12.513428
Proc. SPIE 5250, Laterally heterogeneous optical films as design tools for reflectors and absorbers, 0000 (25 February 2004); doi: 10.1117/12.510981
Nanotechnology and Structured Films II
Proc. SPIE 5250, Modeling and characterizing thin film nanostructures for ultrahydrophobic surfaces with controlled optical scatter, 0000 (25 February 2004); doi: 10.1117/12.512694
Proc. SPIE 5250, Design and fabrication of biperiodic AR gratings for the infrared, 0000 (25 February 2004); doi: 10.1117/12.512709
Proc. SPIE 5250, New technological approach in phase-matched magneto-optic planar waveguide realization, 0000 (25 February 2004); doi: 10.1117/12.512915
Proc. SPIE 5250, Technology trimming of a resonant multilayer laser polarizer, 0000 (25 February 2004); doi: 10.1117/12.513691
EUV and VUV Topics I
Proc. SPIE 5250, Study of ion-beam-sputtered Mo/Si mirrors for EUV lithography mask: influence of sputtering gas, 0000 (25 February 2004); doi: 10.1117/12.512972
Proc. SPIE 5250, Ion-beam-deposited Mo/Si multilayers for EUV imaging applications in astrophysics, 0000 (25 February 2004); doi: 10.1117/12.514597
EUV and VUV Topics II
Proc. SPIE 5250, EUV and soft x-ray multilayer optics, 0000 (25 February 2004); doi: 10.1117/12.512502
Proc. SPIE 5250, Characterization of CaF<sub>2</sub> substrates for VUV fluoride coatings, 0000 (25 February 2004); doi: 10.1117/12.512691
Proc. SPIE 5250, Development of mechanical stress in fluoride multilayers for UV applications, 0000 (25 February 2004); doi: 10.1117/12.512952
Proc. SPIE 5250, 157- and 193-nm scatter, R, and T measurement technique, 0000 (25 February 2004); doi: 10.1117/12.513321
Proc. SPIE 5250, Radiation resistance of single- and multilayer coatings against synchrotron radiation, 0000 (25 February 2004); doi: 10.1117/12.514801
Invited Session II
Proc. SPIE 5250, Photothermal analysis of submicrometric scale defects in laser damage studies, 0000 (25 February 2004); doi: 10.1117/12.517387
Laser Damage and Related Effects I
Poster Session
Proc. SPIE 5250, High mechanical-damage-resistant sol-gel coating for high-power lasers, 0000 (25 February 2004); doi: 10.1117/12.513303
Laser Damage and Related Effects I
Laser Damage and Related Effects II
Characterization Topics I
Proc. SPIE 5250, Optical metrology of thin films using high-accuracy spectrophotometric measurements with oblique angles of incidence, 0000 (25 February 2004); doi: 10.1117/12.512700
Proc. SPIE 5250, Optical and structural inhomogeneity in reactive evaporated and IAD CeO2 films analyzed by x-ray diffraction and reverse optical engineering, 0000 (25 February 2004); doi: 10.1117/12.512958
Proc. SPIE 5250, Characterization of multilayer dielectric coatings by ellipsometry and x-ray grazing incidence reflectometry, 0000 (25 February 2004); doi: 10.1117/12.513340
Proc. SPIE 5250, Magneto-optical properties of yttrium iron garnet (YIG) thin films elaborated by radio frequency sputtering, 0000 (25 February 2004); doi: 10.1117/12.513274
Characterization Topics II
Proc. SPIE 5250, Colorimetric properties of the light scattered by various objects, 0000 (25 February 2004); doi: 10.1117/12.514050
Proc. SPIE 5250, deltan/deltat measurements of sol-gel ZrO2 thin films, 0000 (25 February 2004); doi: 10.1117/12.512716
Proc. SPIE 5250, Structural and optical characterizations of sol-gel-derived europium-doped YAG materials: powders and films, 0000 (25 February 2004); doi: 10.1117/12.513748
Proc. SPIE 5250, Optical characterization of pulsed-laser-deposited LiNbO3 waveguides, 0000 (25 February 2004); doi: 10.1117/12.513886
Invited Session III
Proc. SPIE 5250, Tunable thin film filters: review and perspectives, 0000 (25 February 2004); doi: 10.1117/12.516026
Proc. SPIE 5250, Key role of the coating total optical thickness in solving design problems, 0000 (25 February 2004); doi: 10.1117/12.513326
Characterization Topics III
Proc. SPIE 5250, PVD coating for optical applications on temperature-resistant thermoplastics, 0000 (25 February 2004); doi: 10.1117/12.511798
Proc. SPIE 5250, Aging under mechanical stress: first experiments and related simulations for a silver-based multilayer mirror, 0000 (25 February 2004); doi: 10.1117/12.512968
Design and Monitoring Techniques I
Proc. SPIE 5250, Metal-dielectric coatings for variable transmission filters with wide rejection bands, 0000 (25 February 2004); doi: 10.1117/12.513402
Proc. SPIE 5250, Thin film approach for pi achromatic phase shifters, 0000 (25 February 2004); doi: 10.1117/12.513404
Proc. SPIE 5250, Multicycle AR coatings: a theoretical approach, 0000 (25 February 2004); doi: 10.1117/12.513416
Proc. SPIE 5250, Spatial distribution of electric energy in multilayer and inhomogeneous dielectric mirrors, 0000 (25 February 2004); doi: 10.1117/12.513570
Proc. SPIE 5250, Simple technique for the accurate design of square bandpass WDM interference filters, 0000 (25 February 2004); doi: 10.1117/12.513753
Proc. SPIE 5250, Cascaded solid-spaced filters for DWDM applications, 0000 (25 February 2004); doi: 10.1117/12.514048
Design and Monitoring Techniques II
Proc. SPIE 5250, Refined criteria for estimating limits of broadband AR coatings, 0000 (25 February 2004); doi: 10.1117/12.515611
Proc. SPIE 5250, Monitoring the last two (AR) layers in narrow-bandpass filters, 0000 (25 February 2004); doi: 10.1117/12.510715
Proc. SPIE 5250, Online characterization and reoptimization of optical coatings, 0000 (25 February 2004); doi: 10.1117/12.513379
Manufacturing and Processes I
Proc. SPIE 5250, Fully automated inline sputtering for optical coatings, 0000 (25 February 2004); doi: 10.1117/12.512944
Proc. SPIE 5250, High-refractive-index polymer coatings for optoelectronics applications, 0000 (25 February 2004); doi: 10.1117/12.513363
Manufacturing and Processes II
Proc. SPIE 5250, Manufacturing of four-quadrant phase mask for nulling interferometry in the thermal infrared, 0000 (25 February 2004); doi: 10.1117/12.513386
Proc. SPIE 5250, Preparation, characterization, and luminescence properties of Pr3+-doped CaTiO3 films processed by dip coating, 0000 (25 February 2004); doi: 10.1117/12.513733
Proc. SPIE 5250, Submicrometer scale growth morphology control: a new route for the making of photonic crystal structures?, 0000 (25 February 2004); doi: 10.1117/12.513376
Proc. SPIE 5250, Optical bonding of high-refractive-index semiconductors using index-matched chalcogenide glass, 0000 (25 February 2004); doi: 10.1117/12.513577
Invited Session IV
F. Beauville; D. Buskulic; R. Flaminio; F. Marion; A. Masserot; L. Massonnet; B. Mours; F. Moreau; J. Ramonet; E. Tournefier; D. Verkindt; O. Veziant; M. Yvert; Regis Barille; Vincenzino Dattilo; Daniel Enard; Franco Frasconi; Alberto Gennai; Paolo La Penna; Magali Loupias; Federico Paoletti; L. Bracci; Giovanni Calamai; E. Campagna; G. Conforto; E. Cuoco; I. Fiori; G. Guidi; G. Losurdo; Fabrizio Martelli; Massimo Mazzoni; B. Perniola; Ruagero N. Stanga; Flavio Vetrano; A. Vicere; D. Babusci; Gianfranco Giordano; Jean-Marie Mackowski; Nazario Morgado; Laurent Pinard; Alban Remillieux; Fausto Acernese; Fabrizio Barone; Enrico Calloni; Rosario De Rosa; Luciano Di Fiore; Antonio Eleuteri; Leopoldo Milano; Ketevan Qipiani; Iolanda Ricciardi; G. Russo; Salvatore Solimeno; M. Varvella; Francois Bondu; Alain Brillet; Eric Chassande-Mottin; Frederic Cleva; T. Cokelaer; J.-P. Coulon; B. Dujardin; J.-D. Fournier; H. Heitmann; Catherine N. Man; F. Mornet; J. Pacheco; A. Pai; Herve Trinquet; J.-Y. Vinet; N. Arnaud; M. Barsuglia; M. A. Bizouard; V. Brisson; F. Cavalier; M. Davier; P. Hello; P. Heusse; S. Kreckelberg; A. Claude Boccara; Vincent Loriette; J. Moreau; V. Reita; P. Amico; L. Bosi; Luca Gammaitoni; M. Punturo; F. Travasso; H. Vocca; L. Barsotti; S. Braccini; C. Bradaschia; G. Cella; C. Corda; A. Di Virgilio; I. Ferrante; F. Fidecaro; Adalberto Giazotto; E. Majorana; L. Holloway; R. Passaquieti; D. Passuello; R. Poggiani; A. Toncelli; M. Tonelli; L. Brocco; S. Frasca; C. Palomba; P. Puppo; P. Rapagnani; F. Ricci
Proc. SPIE 5250, Low-loss coatings for the VIRGO large mirrors, 0000 (25 February 2004); doi: 10.1117/12.516431
Proc. SPIE 5250, Solutions for high-productivity high-performance coating systems, 0000 (25 February 2004); doi: 10.1117/12.517388
Manufacturing and Processes III
Proc. SPIE 5250, Silicon oxynitride rugate filters grown by reactive pulse magnetron sputtering, 0000 (25 February 2004); doi: 10.1117/12.513332