PROCEEDINGS VOLUME 5252
OPTICAL SYSTEMS DESIGN | 30 SEPTEMBER - 3 OCTOBER 2003
Optical Fabrication, Testing, and Metrology
OPTICAL SYSTEMS DESIGN
30 September - 3 October 2003
St. Etienne, France
Poster Session
Proc. SPIE 5252, Industrial process of aspherical lens surface manufacturing, 0000 (26 February 2004); doi: 10.1117/12.512860
Optical Manufacturing
Proc. SPIE 5252, It's the subtleties that make the difference, 0000 (26 February 2004); doi: 10.1117/12.512933
Proc. SPIE 5252, Fabrication of cube beamsplitters for white light interferometry, 0000 (26 February 2004); doi: 10.1117/12.513440
Proc. SPIE 5252, Optical contacting, 0000 (26 February 2004); doi: 10.1117/12.514265
Large Optics
Proc. SPIE 5252, LIL fused silica lenses and thin flat plates production, 0000 (26 February 2004); doi: 10.1117/12.514269
Proc. SPIE 5252, Interference test procedures for telescopic mirrors, 0000 (26 February 2004); doi: 10.1117/12.513582
Proc. SPIE 5252, Manufacture of large mirrors for ELTs: a fresh perspective, 0000 (26 February 2004); doi: 10.1117/12.514698
Proc. SPIE 5252, Gran Telescopio Canarias optics manufacture: progress report no. 2, 0000 (30 September 2003); doi: 10.1117/12.516010
Nonconventional Processes I
Proc. SPIE 5252, Automatic control of a thermal-based polishing process for aspherical optics, 0000 (26 February 2004); doi: 10.1117/12.513316
Proc. SPIE 5252, Manufacturing of optical molds using an integrated simulation and measurement interface, 0000 (26 February 2004); doi: 10.1117/12.513564
Proc. SPIE 5252, IR low-cost molded optics, 0000 (26 February 2004); doi: 10.1117/12.514814
Proc. SPIE 5252, High-precision IR molded lenses, 0000 (26 February 2004); doi: 10.1117/12.515565
Nonconventional Processes II
Proc. SPIE 5252, Precision cutting of glassy polymers: influence of aging on the cutting process, 0000 (26 February 2004); doi: 10.1117/12.515412
Proc. SPIE 5252, Local refusion of silica by a continuous CO2 laser for the mitigation of laser damage growth, 0000 (26 February 2004); doi: 10.1117/12.512910
Proc. SPIE 5252, Building high-damage-threshold surfaces at 351 nm, 0000 (26 February 2004); doi: 10.1117/12.512956
Gratings Manufacture and Metrology
Proc. SPIE 5252, Diffraction gratings production for LIL high-power laser: an overview, 0000 (26 February 2004); doi: 10.1117/12.513227
Proc. SPIE 5252, Metrology of focusing gratings and continuous phase plates for LIL and LMJ lasers, 0000 (26 February 2004); doi: 10.1117/12.512829
Proc. SPIE 5252, Resolution of the inverse problem of optical grating testing by means of a neural network, 0000 (26 February 2004); doi: 10.1117/12.514126
Proc. SPIE 5252, Picometer-resolution assessment of the period constancy in a FBG phase mask, 0000 (26 February 2004); doi: 10.1117/12.513696
Proc. SPIE 5252, Highly efficient polarization-independent transmission gratings for pulse stretching and compression, 0000 (26 February 2004); doi: 10.1117/12.514182
Proc. SPIE 5252, High-efficiency IR transmission gratings (GRISM) engraved into substrate, 0000 (26 February 2004); doi: 10.1117/12.514278
Small and Micro-optics
Proc. SPIE 5252, PLATIMO: versatile assembling facilities to bring concepts to prototypes and automated production, 0000 (26 February 2004); doi: 10.1117/12.513330
Proc. SPIE 5252, Resonant grating biosensor platform design and fabrication, 0000 (26 February 2004); doi: 10.1117/12.513695
Proc. SPIE 5252, The effect of optical fiber endface surface roughness on light coupling, 0000 (26 February 2004); doi: 10.1117/12.516522
Proc. SPIE 5252, Unique cost-effective approach for multisurfaced micro-aspheric lens prototyping and fabrication by single-point diamond turning and micro-injection molding technology, 0000 (26 February 2004); doi: 10.1117/12.513200
Proc. SPIE 5252, Novel cladding-mode coupler formed by long-period fiber gratings and microsphere resonator, 0000 (26 February 2004); doi: 10.1117/12.512940
Poster Session
Proc. SPIE 5252, Design and fabrication of an all-fiber-optical add/drop element based on a taper-resonator-taper structure, 0000 (26 February 2004); doi: 10.1117/12.513206
Small and Micro-optics
Proc. SPIE 5252, Fabrication and determination of refractive index profile of the planar waveguides by wedge technique, 0000 (26 February 2004); doi: 10.1117/12.503918
Wavefront Sensing and Interferometry
Proc. SPIE 5252, Principles of highest-precision optical parts estimation on the basis of a point-diffraction interferometer, 0000 (26 February 2004); doi: 10.1117/12.512231
Proc. SPIE 5252, Absolute testing of aspheric surfaces, 0000 (26 February 2004); doi: 10.1117/12.513364
Proc. SPIE 5252, Interferometer with dynamic reference, 0000 (26 February 2004); doi: 10.1117/12.513399
Proc. SPIE 5252, Measuring the local radii of the curvature of an aspheric surface using two interferometric methods, 0000 (26 February 2004); doi: 10.1117/12.513436
Proc. SPIE 5252, Compact high resolution four wave lateral shearing interferometer, 0000 (26 February 2004); doi: 10.1117/12.513739
Proc. SPIE 5252, CGH null design and fabrication for CFH telescope simulator, 0000 (26 February 2004); doi: 10.1117/12.513382
Proc. SPIE 5252, Stitching interferometry: recent results and absolute calibration, 0000 (26 February 2004); doi: 10.1117/12.516164
Proc. SPIE 5252, Orthogonal polynomials: a set for square areas, 0000 (26 February 2004); doi: 10.1117/12.516169
Proc. SPIE 5252, Original optical metrologies of large components, 0000 (26 February 2004); doi: 10.1117/12.513279
Proc. SPIE 5252, Scanning wafer thickness and flatness interferometer, 0000 (26 February 2004); doi: 10.1117/12.515650
Optical Testing Without Coherent Light
Proc. SPIE 5252, Wavefront sensing for testing spherical surfaces and lens systems: a new approach, 0000 (26 February 2004); doi: 10.1117/12.512823
Proc. SPIE 5252, Transmission deflectometer for high-range lens slope measurement, 0000 (26 February 2004); doi: 10.1117/12.512937
Proc. SPIE 5252, Extended-field confocal imaging for 3D surface sensing, 0000 (26 February 2004); doi: 10.1117/12.513583
Proc. SPIE 5252, Calibration issues with Shack-Hartmann sensors for metrology applications, 0000 (26 February 2004); doi: 10.1117/12.513462
Proc. SPIE 5252, High-resolution metrology of optical components by spectral interferometry, 0000 (26 February 2004); doi: 10.1117/12.513400
Surface and Material Testing
Proc. SPIE 5252, Z-scan studies of the nonlinear refractive index of fused silica in the nanosecond regime, 0000 (26 February 2004); doi: 10.1117/12.512916
Proc. SPIE 5252, System test for high-NA objectives at the 157-nm wavelength, 0000 (26 February 2004); doi: 10.1117/12.513480
Proc. SPIE 5252, Automatic damage test benches: from samples to large-aperture optical components, 0000 (26 February 2004); doi: 10.1117/12.512939
Proc. SPIE 5252, Simultaneous determination of thermo- and electro-optic coefficients by Fabry-Pérot thermal scanning interferometry, 0000 (26 February 2004); doi: 10.1117/12.513284
Alignment and System Testing
Proc. SPIE 5252, Optical design, fabrication, and testing a prototype of the NIRSpec IFU, 0000 (26 February 2004); doi: 10.1117/12.512491
Proc. SPIE 5252, Case for standardized measurements on optical components mounted in laser systems, 0000 (26 February 2004); doi: 10.1117/12.512083
Proc. SPIE 5252, Development of an infrared collimator as optical ground support equipment for IASI instrument, 0000 (26 February 2004); doi: 10.1117/12.512310
Surface and Material Testing
Proc. SPIE 5252, New tools for high-precision positioning of optical elements in high-NA microscope objectives, 0000 (26 February 2004); doi: 10.1117/12.512835
Alignment and System Testing
Proc. SPIE 5252, Aberration analysis and adjustment of nonspherical lens in the linear CCDs three-dimensional measurement system, 0000 (26 February 2004); doi: 10.1117/12.508461
Poster Session
Proc. SPIE 5252, Alignment of two paraboloid off-axis sections by measuring the sagitta, 0000 (26 February 2004); doi: 10.1117/12.513194
Optical Manufacturing
Proc. SPIE 5252, Fabrication of aspheric optics: process challenges arising from a wide range of customer demands and diversity of machine technologies, 0000 (26 February 2004); doi: 10.1117/12.531892
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