PROCEEDINGS VOLUME 5265
PHOTONICS TECHNOLOGIES FOR ROBOTICS, AUTOMATION, AND MANUFACTURING | 27-31 OCTOBER 2003
Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology
IN THIS VOLUME

0 Sessions, 23 Papers, 0 Presentations
Session 1  (4)
Session 2  (4)
Session 3  (7)
Session 4  (4)
PHOTONICS TECHNOLOGIES FOR ROBOTICS, AUTOMATION, AND MANUFACTURING
27-31 October 2003
Providence, RI, United States
Keynote Paper
Proc. SPIE 5265, The promise and payoff of 2D and 3D machine vision: Where are we today?, 0000 (26 February 2004); doi: 10.1117/12.523472
Session 1
Proc. SPIE 5265, The use of holographic and diffractive optics for optimized machine vision illumination for critical dimension inspection, 0000 (26 February 2004); doi: 10.1117/12.512000
Proc. SPIE 5265, 3D precision surface measurement by dynamic structured light, 0000 (26 February 2004); doi: 10.1117/12.514442
Proc. SPIE 5265, TARGET: a flexible installation for inspection of industrial objects, 0000 (26 February 2004); doi: 10.1117/12.514606
Proc. SPIE 5265, Performance improvement of a 3D inspection process, 0000 (26 February 2004); doi: 10.1117/12.514798
Session 2
Proc. SPIE 5265, Multifunction sensor that measures the width and surface profile of a steel plate, 0000 (26 February 2004); doi: 10.1117/12.514988
Proc. SPIE 5265, Volume holographic imaging for surface metrology with long working distances, 0000 (26 February 2004); doi: 10.1117/12.515715
Proc. SPIE 5265, New optoelectronic methodology for nondestructive evaluation of MEMS at the wafer level, 0000 (26 February 2004); doi: 10.1117/12.515925
Proc. SPIE 5265, Specular-reflection-based flatness tester, 0000 (26 February 2004); doi: 10.1117/12.520705
Session 3
Proc. SPIE 5265, Sonoluminescence bubble measurements using vision-based algorithms, 0000 (26 February 2004); doi: 10.1117/12.516150
Proc. SPIE 5265, Framework for distributed and networked vision systems, 0000 (26 February 2004); doi: 10.1117/12.517466
Proc. SPIE 5265, Three-dimensional dynamic range reduction techniques, 0000 (26 February 2004); doi: 10.1117/12.517489
Proc. SPIE 5265, Modulation-amplitude-locked laser diode interferometry for distance measurement, 0000 (26 February 2004); doi: 10.1117/12.518640
Proc. SPIE 5265, Stroboscopic step height measurement with two-wavelength interferometer using a single diode laser source, 0000 (26 February 2004); doi: 10.1117/12.518642
Proc. SPIE 5265, Applied multifocus 3D microscopy, 0000 (26 February 2004); doi: 10.1117/12.518827
Proc. SPIE 5265, Full-field dynamic displacement and strain measurement using pulsed and high-speed 3D image correlation photogrammetry, 0000 (26 February 2004); doi: 10.1117/12.519196
Session 4
Proc. SPIE 5265, Total area strain mapping improves total quality of stampings, 0000 (26 February 2004); doi: 10.1117/12.519291
Proc. SPIE 5265, Camera performance considerations for automotive applications, 0000 (26 February 2004); doi: 10.1117/12.519406
Proc. SPIE 5265, Fast image processing using finite-state machines: software implementations, 0000 (26 February 2004); doi: 10.1117/12.519407
Proc. SPIE 5265, High-speed 3D scanner with real-time 3D processing, 0000 (26 February 2004); doi: 10.1117/12.519660
Poster Session
Proc. SPIE 5265, 2D packing using the Myriad framework, 0000 (26 February 2004); doi: 10.1117/12.517467
Proc. SPIE 5265, Calibration of an LCD projector with pinhole model in active stereovision applications, 0000 (26 February 2004); doi: 10.1117/12.518864
Proc. SPIE 5265, Color-encoded digital fringe projection technique for high-speed 3-D shape measurement: color coupling and imbalance compensation, 0000 (26 February 2004); doi: 10.1117/12.527760
Back to Top