PROCEEDINGS VOLUME 5273
XXXV ANNUAL SYMPOSIUM ON OPTICAL MATERIALS FOR HIGH POWER LASERS: BOULDER DAMAGE SYMPOSIUM | 22-24 SEPTEMBER 2003
Laser-Induced Damage in Optical Materials: 2003
XXXV ANNUAL SYMPOSIUM ON OPTICAL MATERIALS FOR HIGH POWER LASERS: BOULDER DAMAGE SYMPOSIUM
22-24 September 2003
Boulder, Colorado, United States
Fundamental Mechanisms
Proc. SPIE 5273, Coalescence of phenomenological laser damage, materials properties, and laser intensity: moving toward quantitative relationships, 0000 (10 June 2004); doi: 10.1117/12.516705
Surfaces and Mirrors
Proc. SPIE 5273, Cleaning to the monolayer level, 0000 (10 June 2004); doi: 10.1117/12.516715
Fundamental Mechanisms
Proc. SPIE 5273, Ways of creating color laser-induced images, 0000 (10 June 2004); doi: 10.1117/12.521020
Proc. SPIE 5273, Mechanisms of radiation-induced defect generation in fused silica, 0000 (10 June 2004); doi: 10.1117/12.521739
Surfaces and Mirrors
Proc. SPIE 5273, Localized silica re-fusion for laser damage mitigation, 0000 (10 June 2004); doi: 10.1117/12.521861
Fundamental Mechanisms
Proc. SPIE 5273, Interpretation of the result of a laser damage measurement, 0000 (10 June 2004); doi: 10.1117/12.521964
Proc. SPIE 5273, Calculation of the electric field magnitude at total internal reflection surfaces, 0000 (10 June 2004); doi: 10.1117/12.521988
Thin Films
Proc. SPIE 5273, Single-shot and multishot laser-induced damage of HfO2/SiO2 multilayer at YAG third harmonic, 0000 (10 June 2004); doi: 10.1117/12.522783
Materials and Measurements
Proc. SPIE 5273, Reflectance measurement of the CdZnTe surfaces below and above the damage threshold value, 0000 (10 June 2004); doi: 10.1117/12.523266
Fundamental Mechanisms
Proc. SPIE 5273, Homogeneous layer model for scattering from nonabsorbing multilayer surfaces, 0000 (10 June 2004); doi: 10.1117/12.523269
Materials and Measurements
Proc. SPIE 5273, Novel approach to realizing quasi-phase-matched gallium arsenide optical parametric oscillators for use in mid-IR laser systems, 0000 (10 June 2004); doi: 10.1117/12.523302
Proc. SPIE 5273, Chalcogenide glass films for the bonding of GaAs optical parametric oscillator elements, 0000 (10 June 2004); doi: 10.1117/12.523307
Proc. SPIE 5273, Laser calorimetry as a tool for the optimisation of mid-infrared OPO materials, 0000 (10 June 2004); doi: 10.1117/12.523316
Thin Films
Proc. SPIE 5273, Electric-field enhancement by nodular defects in multilayer coatings irradiated at normal and 45° incidence, 0000 (10 June 2004); doi: 10.1117/12.523453
Materials and Measurements
Proc. SPIE 5273, Photothermal multi-pixel imaging microscope, 0000 (10 June 2004); doi: 10.1117/12.523669
Surfaces and Mirrors
Proc. SPIE 5273, Enhanced performance of large 3w optics using UV and IR lasers, 0000 (10 June 2004); doi: 10.1117/12.523853
Proc. SPIE 5273, Design of a production process to enhance optical performance of 3w optics, 0000 (10 June 2004); doi: 10.1117/12.523857
Proc. SPIE 5273, Surface damage growth mitigation on KDP/DKDP optics using single-crystal diamond micromachining, 0000 (10 June 2004); doi: 10.1117/12.523859
Fundamental Mechanisms
Proc. SPIE 5273, Implications of nanoabsorber initiators for damage probability curves, pulselength scaling, and laser conditioning, 0000 (10 June 2004); doi: 10.1117/12.523862
Surfaces and Mirrors
Proc. SPIE 5273, Influence of subsurface cracks on laser-induced surface damage, 0000 (10 June 2004); doi: 10.1117/12.523864
Fundamental Mechanisms
Proc. SPIE 5273, Development of a process model for CO2 laser mitigation of damage growth in fused silica, 0000 (10 June 2004); doi: 10.1117/12.523867
Proc. SPIE 5273, Effects of nonlinear absorption in BK7 and color glasses at 355 nm, 0000 (10 June 2004); doi: 10.1117/12.523870
Thin Films
Proc. SPIE 5273, Multilayer dielectric gratings for petawatt-class laser systems, 0000 (10 June 2004); doi: 10.1117/12.524015
Proc. SPIE 5273, Design/deposition process tradeoffs for high performance optical coatings in the DUV spectral region, 0000 (10 June 2004); doi: 10.1117/12.524042
Mini-Symposium on Understanding Optical Damage with Ultrashort Laser Pulses
Proc. SPIE 5273, Change of electronic properties due to ultrashort laser pulses, 0000 (10 June 2004); doi: 10.1117/12.524094
Proc. SPIE 5273, Ultrashort pulse damage of semiconductors, 0000 (10 June 2004); doi: 10.1117/12.524095
Fundamental Mechanisms
Proc. SPIE 5273, Stimulated Brillouin scattering and front surface damage, 0000 (10 June 2004); doi: 10.1117/12.524222
Proc. SPIE 5273, Comparative study of evolution of laser damage in HgCdTe, CdTe, and CdZnTe with nanosecond 1.06-um wavelength multiple pulses, 0000 (10 June 2004); doi: 10.1117/12.524235
Thin Films
Proc. SPIE 5273, Multiple ultrashort-pulse damage of AR-coated beta-barium borate, 0000 (10 June 2004); doi: 10.1117/12.524383
Surfaces and Mirrors
Proc. SPIE 5273, Study of surface contamination layer in silica thanks to laser damage investigation, 0000 (10 June 2004); doi: 10.1117/12.524394
Materials and Measurements
Proc. SPIE 5273, Size and complex index of nanocenters: optical measurements, 0000 (10 June 2004); doi: 10.1117/12.524397
Proc. SPIE 5273, Heterogeneous mixtures as NLO Christiansen filters for optical limiting, 0000 (10 June 2004); doi: 10.1117/12.524443
Mini-Symposium on Understanding Optical Damage with Ultrashort Laser Pulses
Proc. SPIE 5273, Femtosecond dynamics of highly excited dielectric thin films, 0000 (10 June 2004); doi: 10.1117/12.524456
Materials and Measurements
Proc. SPIE 5273, Innovative laser-hardened solid host material for nonlinear filters, 0000 (10 June 2004); doi: 10.1117/12.524526
Surfaces and Mirrors
Proc. SPIE 5273, Subsurface defects in silica detected by using cathodoluminescence and trapping of electrical charges measurements (Best Poster Presentation), 0000 (10 June 2004); doi: 10.1117/12.524544
Materials and Measurements
Proc. SPIE 5273, Spectral signatures and optic coefficients of surface and reservoir rocks at COIL, CO2, and Nd:YAG laser wavelengths, 0000 (10 June 2004); doi: 10.1117/12.524568
Thin Films
Proc. SPIE 5273, Femtosecond pulse damage behavior of oxide dielectric thin films, 0000 (10 June 2004); doi: 10.1117/12.524571
Materials and Measurements
Proc. SPIE 5273, Physiochemical properties of porous media (rocks) after being drilled using high-power lasers: analytical techniques, 0000 (10 June 2004); doi: 10.1117/12.524573
Thin Films
Proc. SPIE 5273, Diagnostic methods for CW laser damage testing, 0000 (10 June 2004); doi: 10.1117/12.524622
Materials and Measurements
Proc. SPIE 5273, Investigation of bulk laser damage and absorption of laser light in CsLiB6O10 crystals (Abstract Only), 0000 (10 June 2004); doi: 10.1117/12.524643
Fundamental Mechanisms
Proc. SPIE 5273, Interaction of an intense laser field with a dielectric containing metallic nanoparticles, 0000 (10 June 2004); doi: 10.1117/12.524727
Proc. SPIE 5273, Self-focusing and surface damage in fused-silica windows of variable thickness with UV nanosecond pulses, 0000 (10 June 2004); doi: 10.1117/12.524841
Materials and Measurements
Proc. SPIE 5273, The impact of laser damage on the lifetime of optical components in fusion lasers, 0000 (10 June 2004); doi: 10.1117/12.524843
Fundamental Mechanisms
Proc. SPIE 5273, Laser-induced damage growth with small and large beams: comparison between laboratory experiments and large-scale laser data, 0000 (10 June 2004); doi: 10.1117/12.524844
Surfaces and Mirrors
Proc. SPIE 5273, ArF-laser-induced photo chemical super mirror-finishing of Si wafer (Abstract Only), 0000 (10 June 2004); doi: 10.1117/12.524848
Materials and Measurements
Proc. SPIE 5273, Study and experimental setting of the Z-scan method for accurate nonlinear refractive index and absorption metrology, 0000 (10 June 2004); doi: 10.1117/12.524852
Proc. SPIE 5273, Z-scan theoretical and experimental studies for accurate measurements of the nonlinear refractive index and absorption of optical glasses near damage threshold, 0000 (10 June 2004); doi: 10.1117/12.524854
Proc. SPIE 5273, Photothermal microscopy for in-situ study of laser interaction with 100 nm diameter gold nanoparticles embedded in silica thin films, 0000 (10 June 2004); doi: 10.1117/12.524855
Proc. SPIE 5273, Photothermal microscopy for the study of laser damage initiation by measurement of absorption modification of silica seeded with gold nanoparticles, 0000 (10 June 2004); doi: 10.1117/12.524856
Proc. SPIE 5273, Laser-induced bulk damage of impurity-doped silica glasses (Abstract Only), 0000 (10 June 2004); doi: 10.1117/12.524858
Surfaces and Mirrors
Proc. SPIE 5273, Enhancement of surface-damage resistance by removing subsurface damage in fused silica, 0000 (10 June 2004); doi: 10.1117/12.524961
Mini-Symposium on Understanding Optical Damage with Ultrashort Laser Pulses
Proc. SPIE 5273, Investigations in the nonlinear behavior of dielectrics by using ultrashort pulses (Best Oral Presentation), 0000 (10 June 2004); doi: 10.1117/12.525132
Materials and Measurements
Proc. SPIE 5273, Results of a round-robin experiment in multiple-pulse LIDT measurement with ultrashort pulses, 0000 (10 June 2004); doi: 10.1117/12.525135
Mini-Symposium on Understanding Optical Damage with Ultrashort Laser Pulses
Proc. SPIE 5273, Micromachining of bulk transparent materials using nanojoule femtosecond laser pulses (Abstract Only), 0000 (10 June 2004); doi: 10.1117/12.525443
Surfaces and Mirrors
Proc. SPIE 5273, Surface investigation of VUV-optical components after exposure to high-energy synchrotron radiation, 0000 (10 June 2004); doi: 10.1117/12.525490
Proc. SPIE 5273, Magnetorheological finishing for imprinting continuous-phase plate structures onto optical surfaces, 0000 (10 June 2004); doi: 10.1117/12.527822
Materials and Measurements
Proc. SPIE 5273, A large-aperture high-energy laser system for optics and optical component testing, 0000 (10 June 2004); doi: 10.1117/12.528327