PROCEEDINGS VOLUME 5398
SIXTH SEMINAR ON PROBLEMS OF THEORETICAL AND APPLIED ELECTRON AND ION OPTICS | 28-30 MAY 2003
Sixth Seminar on Problems of Theoretical and Applied Electron and Ion Optics
SIXTH SEMINAR ON PROBLEMS OF THEORETICAL AND APPLIED ELECTRON AND ION OPTICS
28-30 May 2003
Moscow, Russian Federation
Theoretical and Computer Electron Optics
Proc. SPIE 5398, Formation of subfemtosecond photoelectron bunches in time-dependent electric fields, 0000 (1 March 2004); doi: 10.1117/12.551745
Proc. SPIE 5398, A grid photocathode free of the first-order temporal chromatic aberration, 0000 (1 March 2004); doi: 10.1117/12.551757
Proc. SPIE 5398, Calculation of the intensive charged particle beams in the near-cathode subdomain, 0000 (1 March 2004); doi: 10.1117/12.551769
Proc. SPIE 5398, Calculation of the intensive charged particle beams with increased accuracy, 0000 (1 March 2004); doi: 10.1117/12.551796
Proc. SPIE 5398, Method of parameterization of exact electron trajectory equations, 0000 (1 March 2004); doi: 10.1117/12.551801
Proc. SPIE 5398, Studying focusing and space-time features of the new type of 3D electrostatic lenses, 0000 (1 March 2004); doi: 10.1117/12.551834
Proc. SPIE 5398, Extreme aberration properties of the combined immersion lenses and their prospects in ion nanolithography, 0000 (1 March 2004); doi: 10.1117/12.551869
Analytical and Technological Electron-Optical Devices and Equipment
Proc. SPIE 5398, Energy spectrum estimates for the ion-electron emission in the radioisotope battery, 0000 (1 March 2004); doi: 10.1117/12.551882
Proc. SPIE 5398, Influence of cylindrical pole sizes to parameters of high-dispersion mass-analyzer with inhomogeneous magnetic field, 0000 (1 March 2004); doi: 10.1117/12.551890
Proc. SPIE 5398, Electron-optical system of the photomultiplier with subnanosecond time resolution, 0000 (1 March 2004); doi: 10.1117/12.551903
Proc. SPIE 5398, Vacuum aspherization of high-precision optical elements of IR facilities, 0000 (1 March 2004); doi: 10.1117/12.551933
Proc. SPIE 5398, Influence of parameters of the plasma electron sources on the characteristics of narrow electron beam, 0000 (1 March 2004); doi: 10.1117/12.552017
Proc. SPIE 5398, Ion-beam energy spectrum monitoring system, 0000 (1 March 2004); doi: 10.1117/12.552027
Proc. SPIE 5398, Spread function and limit resolution of deflecting electrostatic energy analyzers, 0000 (1 March 2004); doi: 10.1117/12.552041
Intensive Electron Beam Simulation and Design
Proc. SPIE 5398, Development of electron-beam valves with reduced mass-dimensional parameters, 0000 (1 March 2004); doi: 10.1117/12.563193
Proc. SPIE 5398, Problems of optimization of electron-optical systems of electron beam valves, 0000 (1 March 2004); doi: 10.1117/12.552064
Proc. SPIE 5398, Experiments with electron beam injection in ionosphere plasma and rare gas, 0000 (1 March 2004); doi: 10.1117/12.552075
Proc. SPIE 5398, Bipolar beams, 0000 (1 March 2004); doi: 10.1117/12.552088
Proc. SPIE 5398, Proton-ion linear accelerator ILA-9, 0000 (1 March 2004); doi: 10.1117/12.552097
Proc. SPIE 5398, Focusing superconducting magnetic system of the electron-beam multicharge ion source MIS-1, 0000 (1 March 2004); doi: 10.1117/12.552110
Proc. SPIE 5398, Electron-optical system of a small-scale electron beam ion source, 0000 (1 March 2004); doi: 10.1117/12.552134
Electron and Ion-Beam Interactions with Matter
Proc. SPIE 5398, Electron beam with homogeneous solids interaction simulation using Monte-Carlo method in discrete looses approximation, 0000 (1 March 2004); doi: 10.1117/12.552147
Proc. SPIE 5398, Approximation of electron beam energy loss in homogeneous semiconducting materials, 0000 (1 March 2004); doi: 10.1117/12.552158
Proc. SPIE 5398, Model of independent sources used for calculation of distribution of minority charge carriers generated in two-layer semiconductor by electron beam, 0000 (1 March 2004); doi: 10.1117/12.552175
Proc. SPIE 5398, Polyimide coating texture development by ECR-plasma etching, 0000 (1 March 2004); doi: 10.1117/12.552179
Proc. SPIE 5398, Effect of plasma chemical etching on the properties of thin polyimide coatings differing by the chemical composition and molecular weight, 0000 (1 March 2004); doi: 10.1117/12.552210
Proc. SPIE 5398, Some possibilities of the use of confluence analysis for an interval parameter estimation of semiconductors in a cathodoluminescent microscopy, 0000 (1 March 2004); doi: 10.1117/12.552218
Proc. SPIE 5398, Modeling of dielectric polarization during an electron beam exposure, 0000 (1 March 2004); doi: 10.1117/12.552222
Proc. SPIE 5398, Collective electron oscillations in ceramic systems II, 0000 (1 March 2004); doi: 10.1117/12.555389
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