MICROWAVE AND OPTICAL TECHNOLOGY 2003
11-15 August 2003
Ostrava, Czech Republic
Plenary Session
Proc. SPIE 5445, Optical nonlinear devices, 0000 (7 April 2004); doi: 10.1117/12.557825
Proc. SPIE 5445, Terahertz wave generation and Raman amplification in semiconductors, 0000 (7 April 2004); doi: 10.1117/12.557826
Optical and Microwave Communication
Proc. SPIE 5445, Novel approach to all-optical packet routing, 0000 (7 April 2004); doi: 10.1117/12.557827
Proc. SPIE 5445, Optical code division multiplexing (OCDM)-based ultrafast photonic network, 0000 (7 April 2004); doi: 10.1117/12.557828
Proc. SPIE 5445, Recent technologies for MIMO channel signal transmission in future broadband mobile communication systems, 0000 (7 April 2004); doi: 10.1117/12.557829
Proc. SPIE 5445, Microwave absorption in liquid crystals and carbon nanotubes, 0000 (7 April 2004); doi: 10.1117/12.557830
Proc. SPIE 5445, Mars Exploration Rover telecommunications subsystem, 0000 (7 April 2004); doi: 10.1117/12.557832
Proc. SPIE 5445, Influence of the obstacles on the luminosity distribution in optical picocells, 0000 (7 April 2004); doi: 10.1117/12.557833
Proc. SPIE 5445, Simulation of nonlinear distortion in W-CDMA communication circuits, 0000 (7 April 2004); doi: 10.1117/12.557834
Proc. SPIE 5445, Suboptimum unequally spaced channel allocation techniques for minimising FWM effect in DWDM fiber optic systems, 0000 (7 April 2004); doi: 10.1117/12.557838
Proc. SPIE 5445, Bluetooth and security, 0000 (7 April 2004); doi: 10.1117/12.557839
Proc. SPIE 5445, Availability comparison of different protection mechanisms in an SDH ring network, 0000 (7 April 2004); doi: 10.1117/12.557842
Proc. SPIE 5445, Analysis of all-optical buffers for high-speed WDM networks, 0000 (7 April 2004); doi: 10.1117/12.558073
Proc. SPIE 5445, 21-channel phase-only sampling function for fiber Bragg grating devices, 0000 (7 April 2004); doi: 10.1117/12.558076
Proc. SPIE 5445, Analysis and modeling of the light distribution in optical microcell networks, 0000 (7 April 2004); doi: 10.1117/12.558084
Proc. SPIE 5445, New aspects of narrow bandpass optical filters for DWDM, 0000 (7 April 2004); doi: 10.1117/12.558089
Proc. SPIE 5445, Specific glass fiber technologies: lensing and laser fusion, 0000 (7 April 2004); doi: 10.1117/12.558095
Proc. SPIE 5445, Coverage estimation-based system design in wireless communications, 0000 (7 April 2004); doi: 10.1117/12.558111
Proc. SPIE 5445, All-optical regenerators and latches, 0000 (7 April 2004); doi: 10.1117/12.558120
Photonics and Optics
Proc. SPIE 5445, An electrically tunable infrared filter on base of Fabry-Perot interferometer, 0000 (7 April 2004); doi: 10.1117/12.558124
Proc. SPIE 5445, A simple mutual pulse injection-seeding scheme by the use of two Fabry-Perot laser diodes, 0000 (7 April 2004); doi: 10.1117/12.558385
Proc. SPIE 5445, All-optical functions based on cross gain modulation in cascaded SOAs, 0000 (7 April 2004); doi: 10.1117/12.558391
Proc. SPIE 5445, Measurement and modeling of high-performance lateral p-i-n photodetectors, 0000 (7 April 2004); doi: 10.1117/12.558399
Proc. SPIE 5445, Measurement of the phase spectra of transparent thin films using white-light interferometry, 0000 (7 April 2004); doi: 10.1117/12.558411
Proc. SPIE 5445, White-light spectral interferometry used for dispersion characterization of highly birefringent optical fibers, 0000 (7 April 2004); doi: 10.1117/12.558413
Proc. SPIE 5445, Application of micromirror arrays for Hadamard transform optics, 0000 (7 April 2004); doi: 10.1117/12.558419
Proc. SPIE 5445, Beam ellipticity compensation by holographic optics, 0000 (7 April 2004); doi: 10.1117/12.558453
Proc. SPIE 5445, On the reflection coefficient properties of optical-Cantor prefractal multilayers, 0000 (7 April 2004); doi: 10.1117/12.558466
Proc. SPIE 5445, Intensity distribution in nondiffracting beams propagating in a nonlinear medium, 0000 (7 April 2004); doi: 10.1117/12.558482
Proc. SPIE 5445, Influence on SOA dynamic behaviors in presence of assist light at gain transparency, 0000 (7 April 2004); doi: 10.1117/12.558484
Proc. SPIE 5445, Normalized pump power and noise characteristics of an ytterbium-doped fiber amplifier, 0000 (7 April 2004); doi: 10.1117/12.558487
Proc. SPIE 5445, Packaging and characterization of micro-opto-electro-mechanical systems, 0000 (7 April 2004); doi: 10.1117/12.558489
Proc. SPIE 5445, Autocorrelation function of black body radiation, 0000 (7 April 2004); doi: 10.1117/12.558497
Proc. SPIE 5445, Optical parameter adjustment for silica nano- and micro-particle size distribution measurement using Mastersizer 2000, 0000 (7 April 2004); doi: 10.1117/12.558761
Optical Fibers and Planar Waveguides
Proc. SPIE 5445, Radiation modes for multilayered planar structures with application to rigorous analysis of MMIC elements, 0000 (7 April 2004); doi: 10.1117/12.558770
Proc. SPIE 5445, Integrated InP optical switches based on carrier-induced index variation, 0000 (7 April 2004); doi: 10.1117/12.558773
Proc. SPIE 5445, Propagation characteristics of circularly bent gradient-index planar waveguides with finite cladding thicknesses, 0000 (7 April 2004); doi: 10.1117/12.558781
Proc. SPIE 5445, Numerical evaluation of cabling effects on the cutoff frequency of optical fibers, 0000 (7 April 2004); doi: 10.1117/12.558785
Proc. SPIE 5445, Nonlinear TM surface waves in a left-handed material structure, 0000 (7 April 2004); doi: 10.1117/12.558792
Proc. SPIE 5445, The reflection and transmission characteristics of the waveguides with step discontinuities in millimeter wave, 0000 (7 April 2004); doi: 10.1117/12.558794
Proc. SPIE 5445, Implementation of negative mircomedium in coplanar waveguide technology, 0000 (7 April 2004); doi: 10.1117/12.558798
Proc. SPIE 5445, Polarizing and magneto-optical parameters of optical fibers, 0000 (7 April 2004); doi: 10.1117/12.560041
Gratings and Photonic Crystals
Proc. SPIE 5445, Electromagnetic scattering from multilayered crossed-arrays of circular cylinders, 0000 (7 April 2004); doi: 10.1117/12.560056
Proc. SPIE 5445, Analysis and applications of one-dimensional periodic dielectric gratings under plane wave excitation, 0000 (7 April 2004); doi: 10.1117/12.560068
Proc. SPIE 5445, Numerical analysis of lamellar grating type periodic semiconductor waveguide with rectangular cross section, 0000 (7 April 2004); doi: 10.1117/12.560090
Proc. SPIE 5445, Specular diffraction on nanometric grating, 0000 (7 April 2004); doi: 10.1117/12.560098
Proc. SPIE 5445, Fourier modal theory of rectangular dot gratings made of anisotropic and conducting materials, 0000 (7 April 2004); doi: 10.1117/12.560101
Proc. SPIE 5445, Electromagnetic scattering from periodic arrays of composite dielectric cylinder with internal cylindrical objects, 0000 (7 April 2004); doi: 10.1117/12.560113
Proc. SPIE 5445, Reconstruction of grating parameters from ellipsometric data, 0000 (7 April 2004); doi: 10.1117/12.560118
Proc. SPIE 5445, Some numerical models of dispersion curve fitting, 0000 (7 April 2004); doi: 10.1117/12.560128
Electromagnetic Field and Computational Electrodynamics
Proc. SPIE 5445, Multilevel solvers for three-dimensional optimal shape design with an application to magneto-optics, 0000 (7 April 2004); doi: 10.1117/12.560131
Proc. SPIE 5445, Fast calculation of the Green's functions of a boxed resonator through Ewald's technique, 0000 (7 April 2004); doi: 10.1117/12.560140
Proc. SPIE 5445, Plane wave scattering by bow-tie posts, 0000 (7 April 2004); doi: 10.1117/12.560151
Proc. SPIE 5445, Statistics of multiwedge diffraction, 0000 (7 April 2004); doi: 10.1117/12.560157
Proc. SPIE 5445, Electromagnetic field versus EXCEL, 0000 (7 April 2004); doi: 10.1117/12.560162
Proc. SPIE 5445, Efficient coupling integrals computation of waveguide step discontinuities using BI-RME and Nystrom methods, 0000 (7 April 2004); doi: 10.1117/12.560171
Proc. SPIE 5445, The dot-vacancy contribution to two-fold anisotropy of magnetic dot array, 0000 (7 April 2004); doi: 10.1117/12.560182
Proc. SPIE 5445, Circuit parameter definitions by means of scalar product of time varying quantities, 0000 (7 April 2004); doi: 10.1117/12.560644
Proc. SPIE 5445, Circuit parameter determination by means of measured voltage and current waveform, 0000 (7 April 2004); doi: 10.1117/12.560649