PROCEEDINGS VOLUME 5523
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Current Developments in Lens Design and Optical Engineering V
IN THIS VOLUME

0 Sessions, 40 Papers, 0 Presentations
Space Optics  (5)
Applications  (9)
Theory  (4)
Metrology  (5)
Fabrication  (7)
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
Optical Design of Systems
Proc. SPIE 5523, Unique aspects of designing and tolerancing an optical testing system, 0000 (14 October 2004); doi: 10.1117/12.557321
Proc. SPIE 5523, Small catadioptric microscope optics, 0000 (14 October 2004); doi: 10.1117/12.561002
Proc. SPIE 5523, Visible-NIR imaging optics for a Fourier transform spectrometer, 0000 (14 October 2004); doi: 10.1117/12.559928
Proc. SPIE 5523, Ultrafast focal reducer design for ~2-m-class telescopes, 0000 (14 October 2004); doi: 10.1117/12.558945
Space Optics
Proc. SPIE 5523, SIRAS-G: the Spaceborne Infrared Atmospheric Sounder: laboratory instrument development, 0000 (14 October 2004); doi: 10.1117/12.560496
Proc. SPIE 5523, The Orbiting Carbon Observatory instrument optical design, 0000 (14 October 2004); doi: 10.1117/12.562693
Proc. SPIE 5523, Optical design and analysis of a polarimeter for space applications, 0000 (14 October 2004); doi: 10.1117/12.560443
Proc. SPIE 5523, Design and realization of an innovative mount for calcium fluoride space optics, 0000 (14 October 2004); doi: 10.1117/12.560282
Proc. SPIE 5523, Novel faceted mirror for pushbroom IR sensor, 0000 (14 October 2004); doi: 10.1117/12.561454
Applications
Proc. SPIE 5523, Including detector effects in the design of wide-field imaging systems, 0000 (14 October 2004); doi: 10.1117/12.560641
Proc. SPIE 5523, Variable-focus liquid lens for portable applications, 0000 (14 October 2004); doi: 10.1117/12.555980
Proc. SPIE 5523, A fast optical scanning deflectometer for measuring the topography of large silicon wafers, 0000 (14 October 2004); doi: 10.1117/12.559702
Proc. SPIE 5523, Improving efficiency of beam splitter for DVD pickup, 0000 (14 October 2004); doi: 10.1117/12.559372
Proc. SPIE 5523, Image grid errors due to the application of a local heat source on the TIR surface of a prism, 0000 (14 October 2004); doi: 10.1117/12.560206
Proc. SPIE 5523, Near infrared (NIR) achromatic phase retarder, 0000 (14 October 2004); doi: 10.1117/12.557652
Proc. SPIE 5523, Fielding of an imaging VISAR diagnostic at the National Ignition Facility (NIF), 0000 (14 October 2004); doi: 10.1117/12.561773
Proc. SPIE 5523, Passive fiber chip coupling of polymer PLC devices using hot embossing technique, 0000 (14 October 2004); doi: 10.1117/12.556710
Proc. SPIE 5523, Diffraction efficiency evaluation of diffractive optical element (DOE) aberration corrector, 0000 (14 October 2004); doi: 10.1117/12.557561
Theory
Proc. SPIE 5523, Saddle points in the merit function landscape of systems of thin lenses in contact, 0000 (14 October 2004); doi: 10.1117/12.559638
Proc. SPIE 5523, Avoiding unstable regions in the design space of EUV mirror systems comprising high-order aspheric surfaces, 0000 (14 October 2004); doi: 10.1117/12.559677
Proc. SPIE 5523, Requirements and limitations for fast numerical calculation of the PSF of imaging systems, 0000 (14 October 2004); doi: 10.1117/12.560563
Proc. SPIE 5523, Procedures for speeding up the exact evaluation of diffraction integrals by semiperiodic-zone division of the integration domain, 0000 (14 October 2004); doi: 10.1117/12.559408
Metrology
Proc. SPIE 5523, Optical state estimation using wavefront data, 0000 (14 October 2004); doi: 10.1117/12.561142
Proc. SPIE 5523, Comparison of a new contact topographical measurement system for spherical and aspherical surfaces with interferometry, 0000 (14 October 2004); doi: 10.1117/12.558899
Proc. SPIE 5523, High-precision measurement of effective focal length with single-mode fiber array, 0000 (14 October 2004); doi: 10.1117/12.558796
Proc. SPIE 5523, Measurement of lens focal length using multicurvature analysis of Shack-Hartmann wavefront data, 0000 (14 October 2004); doi: 10.1117/12.561772
Proc. SPIE 5523, A simple focal-length measurement technique for adaptive microlenses using z-scan, 0000 (14 October 2004); doi: 10.1117/12.561300
Fabrication
Proc. SPIE 5523, International innovations in optical finishing, 0000 (14 October 2004); doi: 10.1117/12.557274
Proc. SPIE 5523, Temporal stability and performance of MR polishing fluid, 0000 (14 October 2004); doi: 10.1117/12.558897
Proc. SPIE 5523, Recent developments of Precessions polishing for larger components and free-form surfaces, 0000 (14 October 2004); doi: 10.1117/12.559531
Proc. SPIE 5523, CVC silicon carbide high-performance optical systems, 0000 (14 October 2004); doi: 10.1117/12.557002
Proc. SPIE 5523, Microfluidic microlenses for nanotechnology applications: production, modeling, and fabrication techniques, 0000 (14 October 2004); doi: 10.1117/12.560480
Proc. SPIE 5523, Mechanical fabrication of precision microlenses on optical fiber endfaces, 0000 (14 October 2004); doi: 10.1117/12.560264
Proc. SPIE 5523, Design and fabrication of microlens by microfluidic deposition method, 0000 (14 October 2004); doi: 10.1117/12.557514
Poster Session
Proc. SPIE 5523, UV cured lenses: applied electric fields, 0000 (14 October 2004); doi: 10.1117/12.560473
Proc. SPIE 5523, High-efficiency photoresist grating at 1.55 µm for DWDM application, 0000 (14 October 2004); doi: 10.1117/12.558231
Proc. SPIE 5523, Optical PCB using waveguide-embedded backplane, 0000 (14 October 2004); doi: 10.1117/12.558639
Proc. SPIE 5523, The design of microscopic system using zoom structure with a fixed magnification and independency on the variation of object distance, 0000 (14 October 2004); doi: 10.1117/12.558835
Proc. SPIE 5523, Development of fast camera objective for spectrograph of Mont Megantique telescope, 0000 (14 October 2004); doi: 10.1117/12.559902
Proc. SPIE 5523, Fiber optical system for visualization of inner pipe defects by microrobot, 0000 (14 October 2004); doi: 10.1117/12.559464
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