PROCEEDINGS VOLUME 5526
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
Keynote Paper
Proc. SPIE 5526, Overview of International Space Station orbital environments exposure flight experiments, 0000 (15 October 2004); doi: 10.1117/12.560613
Dr. John Scialdone Memorial Session: Contamination in Space
Proc. SPIE 5526, Electrostatic return in orbit of GOES-8, 0000 (15 October 2004); doi: 10.1117/12.555899
Proc. SPIE 5526, The 8-year report on MSX thermal blanket outgassing: an inexhaustible reservoir, 0000 (15 October 2004); doi: 10.1117/12.559968
Molecularly Induced Contamination
Proc. SPIE 5526, Effect of a silicone contaminant film on the transmittance properties of AR-coated fused silica, 0000 (15 October 2004); doi: 10.1117/12.560859
Proc. SPIE 5526, Molecular contamination of an EUV instrument in geosynchronous orbit, 0000 (15 October 2004); doi: 10.1117/12.555901
Cleaning Methods and Monitoring
Proc. SPIE 5526, Cleaning optical surfaces from the inside out, 0000 (15 October 2004); doi: 10.1117/12.555417
Proc. SPIE 5526, Optical properties of contaminant droplets, 0000 (15 October 2004); doi: 10.1117/12.558223
Particle and Hydrocarbon Contamination
Proc. SPIE 5526, Optical scatter from nonuniform molecular films, 0000 (15 October 2004); doi: 10.1117/12.556121
Proc. SPIE 5526, Thermally conductive electrically insulating aromatic silicone film adhesive for the New Horizons mission, 0000 (15 October 2004); doi: 10.1117/12.560430
Proc. SPIE 5526, NASA's SEE program review and satellite contamination and materials outgassing knowledgebase update, 0000 (15 October 2004); doi: 10.1117/12.562673
Proc. SPIE 5526, The measurement system for evaluating the relation between adsorption quantity of gaseous contaminants and optical transmissivity degradation, 0000 (15 October 2004); doi: 10.1117/12.559252
Modeling and Standards
Proc. SPIE 5526, Examination of material outgassing in the air and purging flow environments, 0000 (15 October 2004); doi: 10.1117/12.556216
Proc. SPIE 5526, Standards for contamination control, 0000 (15 October 2004); doi: 10.1117/12.562179
Proc. SPIE 5526, Numerical modeling of ISS thruster plume induced contamination environment, 0000 (15 October 2004); doi: 10.1117/12.559059
Proc. SPIE 5526, Modeling of material outgassing and deposition phenomena, 0000 (15 October 2004); doi: 10.1117/12.561314
Contamination Measurements and Methods
Proc. SPIE 5526, Characterization of outgassed contaminants from polymeric spacecraft materials, 0000 (15 October 2004); doi: 10.1117/12.558596
Proc. SPIE 5526, Development of an automated optical inspection system for determining percent area coverage for spacecraft contamination control, 0000 (15 October 2004); doi: 10.1117/12.559813
Stray Light in Optical Systems
Proc. SPIE 5526, Comparisons of the optical, surface, and constituent properties of morphologically variant black materials, 0000 (15 October 2004); doi: 10.1117/12.559793
Proc. SPIE 5526, Polarization scatter measurements with a Mueller matrix imaging polarimeter, 0000 (15 October 2004); doi: 10.1117/12.560202
Proc. SPIE 5526, Reproduction of the Morpho butterfly's blue: arbitration of contradicting factors, 0000 (15 October 2004); doi: 10.1117/12.559086
Proc. SPIE 5526, Methods to suppress stray light in black materials, 0000 (15 October 2004); doi: 10.1117/12.559812
Proc. SPIE 5526, Theoretical study of the occulted solar coronagraph, 0000 (15 October 2004); doi: 10.1117/12.549275
Proc. SPIE 5526, Stray light characterization of the Limb Ozone Retrieval Experiment, 0000 (15 October 2004); doi: 10.1117/12.558368
Proc. SPIE 5526, Vector scattering analysis of TPF coronagraph pupil masks, 0000 (15 October 2004); doi: 10.1117/12.562265
Proc. SPIE 5526, Stray light lessons learned from the Mars Reconnaissance Orbiter's Optical Navigation Camera, 0000 (15 October 2004); doi: 10.1117/12.566080
Poster Session
Proc. SPIE 5526, Diffraction patterns in Fresnel approximation of periodic objects for a colorimeter of two apertures, 0000 (15 October 2004); doi: 10.1117/12.558774
Proc. SPIE 5526, Radiation pyrometric measurements with distance to the source effect and size-of-the-source effect corrections, 0000 (15 October 2004); doi: 10.1117/12.558959
Stray Light in Optical Systems
Proc. SPIE 5526, Stray light estimates for the TPF formation flying interferometer, 0000 (15 October 2004); doi: 10.1117/12.593647
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