PROCEEDINGS VOLUME 5527
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Advances in Thin Film Coatings for Optical Applications
IN THIS VOLUME

0 Sessions, 16 Papers, 0 Presentations
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
Thin Film Design and Modeling
Proc. SPIE 5527, Computer-assisted manual coating design approach, 0000 (29 September 2004); doi: 10.1117/12.559999
Proc. SPIE 5527, Exact synthesis of dielectric thin film filters, 0000 (29 September 2004); doi: 10.1117/12.559791
Proc. SPIE 5527, Anomalous phase in one-dimensional multilayer periodical structures with birefringent materials, 0000 (29 September 2004); doi: 10.1117/12.559809
Proc. SPIE 5527, Optical coatings for gravitational wave detection, 0000 (29 September 2004); doi: 10.1117/12.555780
Proc. SPIE 5527, Thermal fields in multimode laser-metallic thin film interaction, 0000 (29 September 2004); doi: 10.1117/12.555309
Ion and Plasma Processing
Proc. SPIE 5527, Ion-assist applications of broad-beam ion sources, 0000 (29 September 2004); doi: 10.1117/12.559785
Proc. SPIE 5527, Developments in energetic processes for optical coating applications, 0000 (29 September 2004); doi: 10.1117/12.555418
Advanced Film Characterization
Proc. SPIE 5527, High-performance antireflection coatings for telecommunications, 0000 (29 September 2004); doi: 10.1117/12.549230
Proc. SPIE 5527, Investigation of damage threshold of ion beam deposited oxide thin film optics for high-peak-power short-pulse lasers, 0000 (29 September 2004); doi: 10.1117/12.559903
Proc. SPIE 5527, High-temperature film thickness sensors for CVD process control, 0000 (29 September 2004); doi: 10.1117/12.560442
Polymer Films
Proc. SPIE 5527, Study on adhesion of thin film coatings of polypyrrole on glass substrate for mechanical durability of sensor devices, 0000 (29 September 2004); doi: 10.1117/12.557531
Proc. SPIE 5527, Characterization of C70 doped poly(styrene) –b- poly(hexyl methacrylate) (PS-PHMA) thin film on c–Si substrate with a Jobin Yvon UVISEL phase- modulated spectroscopic ellipsometer (PMSE)., 0000 (29 September 2004); doi: 10.1117/12.559705
Proc. SPIE 5527, Chalcogenide-based system and its thin films for phase change optical data storage, 0000 (29 September 2004); doi: 10.1117/12.559594
Poster Session
Proc. SPIE 5527, Study of the oxidization of ns-SiNx:H thin films using FTIR phase modulated ellipsometry, 0000 (29 September 2004); doi: 10.1117/12.557424
Proc. SPIE 5527, Mechanical stresses studied by optical methods in diamond-like carbon films containing Si and O, 0000 (29 September 2004); doi: 10.1117/12.562136
Proc. SPIE 5527, Design of reflection-retarders using non-negative film-substrate systems, 0000 (29 September 2004); doi: 10.1117/12.562952
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