PROCEEDINGS VOLUME 5532
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Interferometry XII: Applications
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
Deformation and Motion Measurements I
Proc. SPIE 5532, Quantitative optical metrology with CMOS cameras, 0000 (2 August 2004); doi: 10.1117/12.562788
Proc. SPIE 5532, Setup calibration and optimization for comparative digital holography, 0000 (2 August 2004); doi: 10.1117/12.563323
Proc. SPIE 5532, LVDT calibration using a phase modulation optical interferometer calibrated by an x-ray interferometer, 0000 (2 August 2004); doi: 10.1117/12.563895
Deformation and Motion Measurements II
Proc. SPIE 5532, Active microinterferometer with liquid crystal on silicon (LCOS) for extended range static and dynamic micromembrane measurement, 0000 (2 August 2004); doi: 10.1117/12.560904
Proc. SPIE 5532, Thermally induced deformations measured by shearography, 0000 (2 August 2004); doi: 10.1117/12.555969
Proc. SPIE 5532, Planar Doppler velocimetry using optical fibers, 0000 (2 August 2004); doi: 10.1117/12.562140
Proc. SPIE 5532, Foci determination of an off-axis ellipsoid: from theory to practice, 0000 (2 August 2004); doi: 10.1117/12.560734
Proc. SPIE 5532, Micro optical probe sensor (MOPS) for dynamic in-plane displacement sensing, 0000 (2 August 2004); doi: 10.1117/12.557504
Precision Surface Characterization I
Proc. SPIE 5532, Tomographic microinterferometry as a measurement tool for 3D micro-optical phase elements, 0000 (2 August 2004); doi: 10.1117/12.560906
Proc. SPIE 5532, Surface profiling using a reference-scanning Mirau interference microscope, 0000 (2 August 2004); doi: 10.1117/12.559893
Proc. SPIE 5532, Wavefront aberration measurement technology for microlens using the Mach-Zehnder interferometer provided with a projected aperture, 0000 (2 August 2004); doi: 10.1117/12.559872
Proc. SPIE 5532, Three-dimensional range sensing and surface profilometry using lateral shearing interferometry, 0000 (2 August 2004); doi: 10.1117/12.560383
Proc. SPIE 5532, Equivalence between the software-determined and the hardware-determined effective numerical aperture in the interferometrical measuring of microlens, 0000 (2 August 2004); doi: 10.1117/12.559837
Precision Surface Characterization II
Proc. SPIE 5532, Active wavefront sensing and wavefront control with SLMs, 0000 (2 August 2004); doi: 10.1117/12.558689
Proc. SPIE 5532, Environmentally friendly interferometry, 0000 (2 August 2004); doi: 10.1117/12.559722
Proc. SPIE 5532, OLED microdisplays: a new key element for fringe projection setups, 0000 (2 August 2004); doi: 10.1117/12.560433
Proc. SPIE 5532, Surface roughness measurement by digital speckle correlation, 0000 (2 August 2004); doi: 10.1117/12.560817
Proc. SPIE 5532, Precision measurement on comprehensive topography of the deep hole surface, 0000 (2 August 2004); doi: 10.1117/12.561415
Distance, Displacement, and Angular Measurements
Proc. SPIE 5532, Active alignment for interferometric techniques onboard the International Space Station, 0000 (2 August 2004); doi: 10.1117/12.563322
Proc. SPIE 5532, Compact high-resolution homodyne interferometer for nanometer-scale multidimensional AFM metrology, 0000 (2 August 2004); doi: 10.1117/12.559173
Proc. SPIE 5532, Methods to recognize the sample position for most precise interferometric length measurements, 0000 (2 August 2004); doi: 10.1117/12.555835
Proc. SPIE 5532, Study of high temperature loading on optical fiber-adhesive bonding, 0000 (2 August 2004); doi: 10.1117/12.564236
Strain and Defect Characterization
Proc. SPIE 5532, Low-coherence speckle interferometry (LCSI) for detection of interfacial instabilities in adhesive-bonded joints, 0000 (2 August 2004); doi: 10.1117/12.561204
Proc. SPIE 5532, Development of standard measurement chain for full-field optical strain measurement methods, 0000 (2 August 2004); doi: 10.1117/12.560939
Proc. SPIE 5532, Optical diffraction strain sensor, 0000 (2 August 2004); doi: 10.1117/12.555654
Proc. SPIE 5532, Detection of inhomogeneities in semi solid materials using pulsed digital holography, 0000 (2 August 2004); doi: 10.1117/12.556090
Proc. SPIE 5532, Nondestructive evaluations of thermal deformations for laser microwelding process, 0000 (2 August 2004); doi: 10.1117/12.560273
Proc. SPIE 5532, Flaw detection using temporal speckle pattern interferometry and thermal waves, 0000 (2 August 2004); doi: 10.1117/12.555767
Industrial and In-situ Measurements
Proc. SPIE 5532, Optomechanical characterization of proton-exchange membrane fuel cells, 0000 (2 August 2004); doi: 10.1117/12.562893
Proc. SPIE 5532, Device for spectral emissivity measurements of ceramics using a FT-IR spectrometer, 0000 (2 August 2004); doi: 10.1117/12.560602
Proc. SPIE 5532, Evaluation of a portable FTIR for in-situ field measurements of surface reflectance, 0000 (2 August 2004); doi: 10.1117/12.560501
Strain and Defect Characterization
Proc. SPIE 5532, Strain solitary waves in lengthy waveguides, 0000 (2 August 2004); doi: 10.1117/12.556315
Industrial and In-situ Measurements
Proc. SPIE 5532, Method for continuous end standard measurement utilizing laser interferometer, 0000 (2 August 2004); doi: 10.1117/12.559455
Proc. SPIE 5532, Surface profiling of turbine blade using phase-shifting Talbot interferometric technique, 0000 (2 August 2004); doi: 10.1117/12.560385
Proc. SPIE 5532, All-optical magnetometer based on electromagnetically induced transparency, 0000 (2 August 2004); doi: 10.1117/12.560595
Proc. SPIE 5532, Compact vibration sensor for testing subresonance of slim optical pickup actuators, 0000 (2 August 2004); doi: 10.1117/12.557410
Deformation and Motion Measurements II
Proc. SPIE 5532, Study of shock wave curl structures using shearing interferometry, 0000 (2 August 2004); doi: 10.1117/12.557604
Proc. SPIE 5532, Application of digital speckle pattern interferometry in measurement of large deformation, 0000 (2 August 2004); doi: 10.1117/12.559560
Proc. SPIE 5532, Study of mode shapes and measurement of vibrations in square plates using DSPI and wavelet transform, 0000 (2 August 2004); doi: 10.1117/12.560375
Precision Surface Characterization II
Proc. SPIE 5532, Automatic phase-shifting Ronchi tester with a square Ronchi ruling, 0000 (2 August 2004); doi: 10.1117/12.558939
Proc. SPIE 5532, Phase scaling using characteristic polynomials, 0000 (2 August 2004); doi: 10.1117/12.561224
Industrial and In-situ Measurements
Proc. SPIE 5532, Evaluation of the mechanical properties of square membranes prestressed by PECVD silicon oxynitride thin films, 0000 (2 August 2004); doi: 10.1117/12.569806
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