PROCEEDINGS VOLUME 5538
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Optical Constants of Materials for UV to X-Ray Wavelengths
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
Techniques for Optical Constants I
Proc. SPIE 5538, Measuring optical constants from the UV to x-ray wavelengths: how it was (and is) done, 0000 (14 October 2004); doi: 10.1117/12.558709
Proc. SPIE 5538, An assessment of yttrium optical constants EUV using Mo/Y multilayers designed as in the linear polarizers, 0000 (14 October 2004); doi: 10.1117/12.560465
Proc. SPIE 5538, Calculation of x-ray refraction from near-edge absorption data only, 0000 (14 October 2004); doi: 10.1117/12.560160
Proc. SPIE 5538, Rocket Extreme ultraviolet Grating Spectrometer (EGS): calibrations and results of the solar irradiance on February 8, 2002, 0000 (14 October 2004); doi: 10.1117/12.559874
Scandium and Related Elements
Multilayer Related Optical Constants I
Multilayer Related Optical Constants II
Techniques for Optical Constants II
Proc. SPIE 5538, First-principles ultraviolet and x-ray spectra over broad ranges, 0000 (14 October 2004); doi: 10.1117/12.564301
Proc. SPIE 5538, Angle-dependent total electron yield spectra in multilayer films for standing wave measurements, 0000 (14 October 2004); doi: 10.1117/12.561199
Proc. SPIE 5538, Spectral signatures and optic coefficients of surface and reservoir shales and limestones at COIL, CO2, and Nd:YAG laser wavelengths, 0000 (14 October 2004); doi: 10.1117/12.560065
Posters - Thursday
Proc. SPIE 5538, High-accuracy VUV reflectometry at selectable sample temperatures, 0000 (14 October 2004); doi: 10.1117/12.556301
Proc. SPIE 5538, Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry, 0000 (14 October 2004); doi: 10.1117/12.559427
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