PROCEEDINGS VOLUME 5540
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING | 2-6 AUGUST 2004
Hard X-Ray and Gamma-Ray Detector Physics VI
IN THIS VOLUME

0 Sessions, 27 Papers, 0 Presentations
Imagers  (4)
OPTICAL SCIENCE AND TECHNOLOGY, THE SPIE 49TH ANNUAL MEETING
2-6 August 2004
Denver, Colorado, United States
CZT Detectors
Proc. SPIE 5540, Thick CZT detectors for spaceborne x-ray astronomy, 0000 (21 October 2004); doi: 10.1117/12.558912
Proc. SPIE 5540, Coplanar grid CdZnTe detectors for space science applications, 0000 (21 October 2004); doi: 10.1117/12.564260
Proc. SPIE 5540, Multipixel characterization of imaging CZT detectors for hard x-ray imaging and spectroscopy, 0000 (21 October 2004); doi: 10.1117/12.559748
CZT Detectors and Characterization
Proc. SPIE 5540, New results from performance studies of Frisch-grid CdZnTe detectors, 0000 (21 October 2004); doi: 10.1117/12.563393
Proc. SPIE 5540, Study of growth defects in CZT and their influence on detector uniformity, 0000 (21 October 2004); doi: 10.1117/12.562813
Proc. SPIE 5540, Characterization of coplanar grid CZT detectors with highly collimated x-ray beam, 0000 (21 October 2004); doi: 10.1117/12.565012
Proc. SPIE 5540, Laboratory coded-aperture imaging experiments: radial hole coded masks and depth-sensitive CZT detectors, 0000 (21 October 2004); doi: 10.1117/12.559650
Scintillators and Hgl2
Proc. SPIE 5540, Cerium-activated rare-earth orthophosphate and double-phosphate scintillators for x- and gamma-ray detection, 0000 (21 October 2004); doi: 10.1117/12.562220
Proc. SPIE 5540, Scintillator and photodetector array optimization for gamma-ray imaging, 0000 (21 October 2004); doi: 10.1117/12.559738
Proc. SPIE 5540, A physics model of lutetium oxyorthosilicate detectors: theory and experimental validation, 0000 (21 October 2004); doi: 10.1117/12.563361
Proc. SPIE 5540, Characterization of strain and crystallographic defects in HgI2 single crystals, 0000 (21 October 2004); doi: 10.1117/12.565027
Imagers
Proc. SPIE 5540, A high-resolution gamma camera based on array of R8520-00-C12 PSPMTs, 0000 (21 October 2004); doi: 10.1117/12.559624
Proc. SPIE 5540, A Compton imaging device for radioactive material detection, 0000 (21 October 2004); doi: 10.1117/12.562558
Proc. SPIE 5540, 3D position-sensitive CdZnTe gamma-ray spectrometers: improved performance with new ASICs, 0000 (21 October 2004); doi: 10.1117/12.563903
Proc. SPIE 5540, 4-pi Compton imaging with single 3D position-sensitive CdZnTe detector, 0000 (21 October 2004); doi: 10.1117/12.563905
Novel Devices
Proc. SPIE 5540, Design of a multichannel ultra-high-resolution superconducting gamma-ray spectrometer, 0000 (21 October 2004); doi: 10.1117/12.563624
Proc. SPIE 5540, Crystal growth, characterization, and fabrication of AgGaSe2 crystals as novel material for room-temperature radiation detectors, 0000 (21 October 2004); doi: 10.1117/12.563890
CdTe and CdZnTe I
Proc. SPIE 5540, Large-size CdZnTe (Zn=10%) radiation detector materials and device performance, 0000 (21 October 2004); doi: 10.1117/12.566740
Proc. SPIE 5540, Crystal growth, characterization, and testing of Cd0.9Zn0.1Te single crystals for radiation detectors, 0000 (21 October 2004); doi: 10.1117/12.566936
Proc. SPIE 5540, Development of energy-discriminate CdTe imaging detector for hard x-ray, 0000 (21 October 2004); doi: 10.1117/12.559479
Proc. SPIE 5540, High-pressure xenon electroluminescence detectors, 0000 (21 October 2004); doi: 10.1117/12.564633
Proc. SPIE 5540, Virtual Frisch-grid ionization chambers filled with high-pressure Xe, 0000 (21 October 2004); doi: 10.1117/12.564432
Posters - Monday
Proc. SPIE 5540, Studies of interaction between components in system ZnSe-ZnTe-Se-H2-C, 0000 (21 October 2004); doi: 10.1117/12.555761
Proc. SPIE 5540, Spectrometric universality and reduction of nonstatistical noises in detectors with regular light collection, 0000 (21 October 2004); doi: 10.1117/12.557633
Proc. SPIE 5540, Gamma detectors based on high-pressure xenon: their development and application, 0000 (21 October 2004); doi: 10.1117/12.558914
Novel Devices
Proc. SPIE 5540, Innovations in low-temperature calorimeters: surface sensitive bolometers for background rejection and capacitive bolometers for higher energy resolution, 0000 (21 October 2004); doi: 10.1117/12.579846
CdTe and CdZnTe I
Proc. SPIE 5540, Scintillation imaging: a technique to reduce coding noise in scanned coded aperture imagers, 0000 (21 October 2004); doi: 10.1117/12.580609
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