PROCEEDINGS VOLUME 5633
PHOTONICS ASIA | 8-11 NOVEMBER 2004
Advanced Materials and Devices for Sensing and Imaging II
PHOTONICS ASIA
8-11 November 2004
Beijing, China
Laser Interferometry and Optical Profilometry
Proc. SPIE 5633, Phase-shifting interferometry using an SHG blue laser diode, 0000 (20 January 2005); doi: 10.1117/12.577051
Proc. SPIE 5633, Super oblique incidence interferometer by using antireflection prism with subwavelength structure, 0000 (20 January 2005); doi: 10.1117/12.577047
Proc. SPIE 5633, Measurement of sectional profile of a thread gauge using a sinusoidally vibrating light with sinusoidal intensity, 0000 (20 January 2005); doi: 10.1117/12.576666
Proc. SPIE 5633, Profile measurement of objects with discontinuous surfaces by modified temporal phase unwrapping, 0000 (20 January 2005); doi: 10.1117/12.576596
Proc. SPIE 5633, One-dimensional surface profile measurement with a fast scanning method by detecting angular deflection of a laser beam, 0000 (20 January 2005); doi: 10.1117/12.577647
Optical Metrology, Sensing, and Imaging
Proc. SPIE 5633, Quasi-phase-matched second harmonic generation in crystal quartz, 0000 (20 January 2005); doi: 10.1117/12.575565
Proc. SPIE 5633, Fiber optic moiré interferometric profilometry, 0000 (20 January 2005); doi: 10.1117/12.570131
Proc. SPIE 5633, Study on the special vision sensor for detecting position error in robot precise TIG welding of some key part of rocket engine, 0000 (20 January 2005); doi: 10.1117/12.574730
Measurement Systems for Sensing Devices
Proc. SPIE 5633, 64×1 UV focal plane array of GaN p-i-n photodiodes, 0000 (20 January 2005); doi: 10.1117/12.571139
Proc. SPIE 5633, Auto-focusing and auto-alignment system for three-panel LCD projection display, 0000 (20 January 2005); doi: 10.1117/12.570380
Proc. SPIE 5633, Research on tangent plane algorithm for spatial position of vehicle wheel, 0000 (20 January 2005); doi: 10.1117/12.573254
Proc. SPIE 5633, Coaxial monitoring with a CMOS camera for CO2 laser welding, 0000 (20 January 2005); doi: 10.1117/12.576183
Optical Metrology and Range Measurement
Proc. SPIE 5633, Forward cascaded stimulated Brillouin scattering (SBS) in an S-band distributed G652 fiber Raman amplifier, 0000 (20 January 2005); doi: 10.1117/12.577208
Proc. SPIE 5633, Interferometric displacement sensors using sinusoidal phase-modulation and optical fibers, 0000 (20 January 2005); doi: 10.1117/12.579814
Proc. SPIE 5633, Model of backscattering light and signal light for atmospheric range-gated imaging systems, 0000 (20 January 2005); doi: 10.1117/12.569852
Proc. SPIE 5633, Multilaser digital speckle pattern interferometry system, 0000 (20 January 2005); doi: 10.1117/12.574770
Proc. SPIE 5633, A novel displacement sensor based on diode-end-pumped solid-state laser technology, 0000 (20 January 2005); doi: 10.1117/12.575314
Proc. SPIE 5633, Study of the relationship between scattering-light energy characteristic of dust particles and the dust emission using a two-dimensional image sensor, 0000 (20 January 2005); doi: 10.1117/12.576097
Materials and Devices for Fiber Sensors
Proc. SPIE 5633, Sensing with photonic crystal fibers, 0000 (20 January 2005); doi: 10.1117/12.577297
Proc. SPIE 5633, Research on optical fiber strain sensor based on the spiral bending, 0000 (20 January 2005); doi: 10.1117/12.572771
Proc. SPIE 5633, Growth and fluorescence characteristics of Cr3+ : YAG crystal fiber for temperature sensor from –10 degrees C to 500 degrees C, 0000 (20 January 2005); doi: 10.1117/12.573932
Poster Session
Proc. SPIE 5633, Detection of pointing errors with CMOS-based camera in intersatellite optical communications, 0000 (20 January 2005); doi: 10.1117/12.574271
Materials and Devices for Fiber Sensors
Proc. SPIE 5633, Design and analysis of fluorescence fiber gratings, 0000 (20 January 2005); doi: 10.1117/12.577964
Proc. SPIE 5633, Analysis of the reflection of a microdrop fiber sensor, 0000 (20 January 2005); doi: 10.1117/12.577967
CCD and Sensor Technologies
Proc. SPIE 5633, Polarization modulation in metallic nanostructures and effects of surface plasmon excitation, 0000 (20 January 2005); doi: 10.1117/12.576607
Proc. SPIE 5633, CCD-based system for two-dimensional measurement of color uniformity of LCD projector, 0000 (20 January 2005); doi: 10.1117/12.575206
Advanced Materials and Applications
Proc. SPIE 5633, An APS-based autonomous star tracker, 0000 (20 January 2005); doi: 10.1117/12.569933
Proc. SPIE 5633, Parallel demodulation method for EFPI and FBG sensors, 0000 (20 January 2005); doi: 10.1117/12.570737
Proc. SPIE 5633, The effect of sensitization time on the decay of photoelectron in AgBrI T-grain emulsion, 0000 (20 January 2005); doi: 10.1117/12.574293
Proc. SPIE 5633, Effect of dopants on the photorefractive effect in 0.91Pb(Zn1/3Nb2/3)O3-0.09PbTiO3, 0000 (20 January 2005); doi: 10.1117/12.576477
Materials and Devices for Optical Metrology
Proc. SPIE 5633, A one-dimensional discrete Hilbert transform for interferometric phases, 0000 (20 January 2005); doi: 10.1117/12.577834
Proc. SPIE 5633, Position measurement method based on linear-array CCD with inverting prism, 0000 (20 January 2005); doi: 10.1117/12.570375
Proc. SPIE 5633, Nanostructured YSZ membranes derived from inorganic salts, 0000 (20 January 2005); doi: 10.1117/12.580945
Poster Session
Proc. SPIE 5633, A smart temperature sensor based on the high-birefringence fiber loop mirror employing an optical-power-detection scheme, 0000 (20 January 2005); doi: 10.1117/12.565096
Proc. SPIE 5633, A novel FBG pressure sensor with high sensitivity, 0000 (20 January 2005); doi: 10.1117/12.565187
Proc. SPIE 5633, SnS films prepared by sulfuration of Sn precursor layers, 0000 (20 January 2005); doi: 10.1117/12.568466
Proc. SPIE 5633, Influence of deposition voltage on the quality of electrodeposited SnS film, 0000 (20 January 2005); doi: 10.1117/12.568732
Proc. SPIE 5633, Precision analysis of scanning element in laser scanning and imaging system, 0000 (20 January 2005); doi: 10.1117/12.569755
Proc. SPIE 5633, The numerical simulation of photoelectric characteristics of three-channel bulk charge-coupled device in the region of 1.0~1.26µm, 0000 (20 January 2005); doi: 10.1117/12.569928
Proc. SPIE 5633, Position error correction of position sensitive detector by least squares support vector machine, 0000 (20 January 2005); doi: 10.1117/12.570262
Proc. SPIE 5633, Application of binocular vision probe on measurement of highly reflective metallic surface, 0000 (20 January 2005); doi: 10.1117/12.570778
Proc. SPIE 5633, The study on the spectral response of transmission-type GaAs photocathode in the seal process, 0000 (20 January 2005); doi: 10.1117/12.570902
Proc. SPIE 5633, High-accuracy measurement of low-water-content in liquid using NIR spectral absorption method, 0000 (20 January 2005); doi: 10.1117/12.570907
Proc. SPIE 5633, Method for searching the mapping relationship between space points and their image points in CCD camera, 0000 (20 January 2005); doi: 10.1117/12.571024
Proc. SPIE 5633, Research on photoacoustic sensing of transformer fault gases, 0000 (20 January 2005); doi: 10.1117/12.571044
Proc. SPIE 5633, Self-mixing laser Doppler velocimeter based on dual frequency lasers, 0000 (20 January 2005); doi: 10.1117/12.571180
Proc. SPIE 5633, Accurate camera intrinsic parameters calibration using virtual stereo board, 0000 (20 January 2005); doi: 10.1117/12.571934
Proc. SPIE 5633, A novel phase unwrapping method based on cosine function, 0000 (20 January 2005); doi: 10.1117/12.572154
Proc. SPIE 5633, Image drop sensor and edge analysis of the drop profile, 0000 (20 January 2005); doi: 10.1117/12.572638
Proc. SPIE 5633, Influence of a new surface treatment method on ohmic contact resistivity of p-type GaN, 0000 (20 January 2005); doi: 10.1117/12.572681
Proc. SPIE 5633, Online measuring method of the wheel set wear based on CCD and image processing, 0000 (20 January 2005); doi: 10.1117/12.573042
Proc. SPIE 5633, Auto-focus apparatus with digital signal processor, 0000 (20 January 2005); doi: 10.1117/12.573389
Proc. SPIE 5633, Ultrashort pulse measurement using interferometric autocorrelator based on two-photon-absorption detector at 1.55-µm wavelength region, 0000 (20 January 2005); doi: 10.1117/12.573681
Proc. SPIE 5633, Investigation of sulfur-doped n-type diamond thin films, 0000 (20 January 2005); doi: 10.1117/12.573766
Proc. SPIE 5633, Characteristic of vapor dynamic process for sulfur-doped n-type diamond films, 0000 (20 January 2005); doi: 10.1117/12.573787
Proc. SPIE 5633, High-sensitivity photon-counting imaging detector, 0000 (20 January 2005); doi: 10.1117/12.573843
Proc. SPIE 5633, Electron transmittance characteristics of MCP ion barrier film, 0000 (20 January 2005); doi: 10.1117/12.573854