PROCEEDINGS VOLUME 5638
PHOTONICS ASIA | 8-11 NOVEMBER 2004
Optical Design and Testing II
PHOTONICS ASIA
8-11 November 2004
Beijing, China
Optical Design and Education in Optics
Proc. SPIE 5638, Optical instruments and imaging: the use of optics by 15th-century master painters, 0000 (10 February 2005); doi: 10.1117/12.580846
Proc. SPIE 5638, Distance-learning postgraduate education in optics and optical design, 0000 (10 February 2005); doi: 10.1117/12.580320
Proc. SPIE 5638, The kurtosis parametric characteristics of light beams passing through aberrated fractional Fourier transforming systems, 0000 (10 February 2005); doi: 10.1117/12.574869
Proc. SPIE 5638, Intensity distribution topography on pupil’s image in EPR, 0000 (10 February 2005); doi: 10.1117/12.575580
Poster Session
Proc. SPIE 5638, Numerical methods to compute optical errors due to thermo-elastic effects, 0000 (10 February 2005); doi: 10.1117/12.574225
Fabrication and Tolerancing
Proc. SPIE 5638, Study on tolerance sensitivity reduction in lens optimization, 0000 (10 February 2005); doi: 10.1117/12.579822
Proc. SPIE 5638, Optical specifications for optical design, testing, and production, 0000 (10 February 2005); doi: 10.1117/12.577200
Proc. SPIE 5638, Novel simulation technique for efficient fabrication of 2-m class hexagonal segments for extremely large telescope primary mirrors, 0000 (10 February 2005); doi: 10.1117/12.576702
Proc. SPIE 5638, Deformation analysis of a lightweight metal mirror, 0000 (10 February 2005); doi: 10.1117/12.574693
Illumination System Design
Proc. SPIE 5638, Noise tolerant illumination optimization applied to display devices, 0000 (10 February 2005); doi: 10.1117/12.580179
Proc. SPIE 5638, Optical design of free-face reflective headlamps, 0000 (10 February 2005); doi: 10.1117/12.575710
Proc. SPIE 5638, Computer-aided design and optimization of free-form reflectors, 0000 (10 February 2005); doi: 10.1117/12.583684
Proc. SPIE 5638, Reflector optimal design for segmented reflector lamp, 0000 (10 February 2005); doi: 10.1117/12.574679
Proc. SPIE 5638, A novel LED illumination system used in hand-held projector, 0000 (10 February 2005); doi: 10.1117/12.574315
Proc. SPIE 5638, Rigorous electromagnetic analysis of Talbot effect with the finite-difference time-domain method, 0000 (10 February 2005); doi: 10.1117/12.576199
Other Design Issues
Proc. SPIE 5638, Studies on dynamic behavior of rotating mirrors, 0000 (10 February 2005); doi: 10.1117/12.573260
Testing Based on Imaging
Proc. SPIE 5638, Eye gazing direction inspection based on image processing technique, 0000 (10 February 2005); doi: 10.1117/12.570341
Proc. SPIE 5638, Research on modern testing technique of optical system magnifying ratio based on CCD imaging theory, 0000 (10 February 2005); doi: 10.1117/12.574486
Proc. SPIE 5638, Research on testing technique of image inclining and graduation inclining of optical system based on CCD imaging theory, 0000 (10 February 2005); doi: 10.1117/12.574968
Proc. SPIE 5638, Design of a synchronized scanning system for size measurement of human body, 0000 (10 February 2005); doi: 10.1117/12.574981
Optical Testing I
Proc. SPIE 5638, Implementation of Hartmann test for measuring 0.9-m aspheric mirror, 0000 (10 February 2005); doi: 10.1117/12.575568
Proc. SPIE 5638, An automatic system for measurement of retardation of wave plates based on phase-shifted method, 0000 (10 February 2005); doi: 10.1117/12.568719
Proc. SPIE 5638, Method to enhance the accuracy of the retardance measurement of quarter-wave plates, 0000 (10 February 2005); doi: 10.1117/12.573732
Proc. SPIE 5638, Research and development of heterodyne dispersion meter, 0000 (10 February 2005); doi: 10.1117/12.572661
Proc. SPIE 5638, Measurement of the linear birefringence inside bulk glass current sensing elements with a retarder, 0000 (10 February 2005); doi: 10.1117/12.573728
Interferometry I
Proc. SPIE 5638, Improved straightness interferometer for nanometrology, 0000 (10 February 2005); doi: 10.1117/12.570183
Proc. SPIE 5638, A radial-shearing interference system of testing laser-pulse wavefront distortion and the original wavefront reconstructing, 0000 (10 February 2005); doi: 10.1117/12.570656
Proc. SPIE 5638, A multifunctional phase-shifted interferometer with small dimension, 0000 (10 February 2005); doi: 10.1117/12.568727
Proc. SPIE 5638, Research of Doppler velocity interferometer system for laser-driven shock wave, 0000 (10 February 2005); doi: 10.1117/12.573525
Proc. SPIE 5638, Real-time measurement of concentration and temperature of solution by two different wavelengths Mach-Zehnder interferometry during crystal growth, 0000 (10 February 2005); doi: 10.1117/12.574561
Spectrometry
Proc. SPIE 5638, Low polarization sensitivity resolution of the new moderate-resolution imaging spectrometer, 0000 (10 February 2005); doi: 10.1117/12.577381
Proc. SPIE 5638, Spectrophotometer for measuring spectral transmittance and reflectance of large-aperture optical element, 0000 (10 February 2005); doi: 10.1117/12.571857
Proc. SPIE 5638, Improved subpixel analysis algorithm for geometrical superresolution in miniature spectrometer, 0000 (10 February 2005); doi: 10.1117/12.572246
Proc. SPIE 5638, Self-focusing x-ray spectrometer using mica as the dispersive element, 0000 (10 February 2005); doi: 10.1117/12.567896
Space Optics
Proc. SPIE 5638, The optomechanical design of Amon-Ra instrument, 0000 (10 February 2005); doi: 10.1117/12.573624
Proc. SPIE 5638, An inflatable circular membrane mirror for space telescopes, 0000 (10 February 2005); doi: 10.1117/12.571628
Proc. SPIE 5638, A new kind of three anastigmatic mirrors system, 0000 (10 February 2005); doi: 10.1117/12.570904
Proc. SPIE 5638, Polarization aberration in resource satellite system, 0000 (10 February 2005); doi: 10.1117/12.572519
Aspheric Optics
Proc. SPIE 5638, Subaperture approaches for asphere polishing and metrology, 0000 (10 February 2005); doi: 10.1117/12.577539
Proc. SPIE 5638, The intelligent controlling of active lap based on CMAC neural network, 0000 (10 February 2005); doi: 10.1117/12.574706
Proc. SPIE 5638, Algorithm for stylus instruments to measure aspheric surfaces, 0000 (10 February 2005); doi: 10.1117/12.574290
Proc. SPIE 5638, Computer-aided alignment for off-axis asphere null test, 0000 (10 February 2005); doi: 10.1117/12.578026
Proc. SPIE 5638, A novel aspheric surface testing method using part-compensating lens, 0000 (10 February 2005); doi: 10.1117/12.578624
Infrared Optics
Proc. SPIE 5638, Influence of thermal radiations in infrared optical systems, 0000 (10 February 2005); doi: 10.1117/12.572763
Proc. SPIE 5638, Pupil aberrations control in fish-eye lens with diffractive surfaces, 0000 (10 February 2005); doi: 10.1117/12.572750
Proc. SPIE 5638, The optical system for infrared dynamic scene simulation, 0000 (10 February 2005); doi: 10.1117/12.572701
Proc. SPIE 5638, Design of aspherical metal mirrors used in infrared thermal imaging systems, 0000 (10 February 2005); doi: 10.1117/12.573365
Proc. SPIE 5638, A novel high-speed optical scanning platform, 0000 (10 February 2005); doi: 10.1117/12.575488
Display Systems
Proc. SPIE 5638, The past, present, and future of head-mounted display designs, 0000 (10 February 2005); doi: 10.1117/12.575697
Proc. SPIE 5638, Polarization analysis of projection display system, 0000 (10 February 2005); doi: 10.1117/12.576379
Optical Testing II
Proc. SPIE 5638, Ultrahighly accurate 3D profilometer, 0000 (10 February 2005); doi: 10.1117/12.573774
Proc. SPIE 5638, Real-time measurement of surface roughness based on dynamic speckles, 0000 (10 February 2005); doi: 10.1117/12.573754
Proc. SPIE 5638, A new high-precision measurement system used in the image calibration of a large-sized photographic instrument, 0000 (10 February 2005); doi: 10.1117/12.577464
Proc. SPIE 5638, Experimental research on thickness-monitoring techniques of non-quarter films, 0000 (10 February 2005); doi: 10.1117/12.576190
Interferometry II
Proc. SPIE 5638, Adaptive phase-shifting interferometer with optical heterodyne vibration measuring and compensating system, 0000 (10 February 2005); doi: 10.1117/12.572136
Proc. SPIE 5638, Real-time measurement of refractive index of solution during crystal growth by Michaelson interferometry, 0000 (10 February 2005); doi: 10.1117/12.574562
Proc. SPIE 5638, Gauge block parameter measurement through static interferogram using virtual grating moiré technique, 0000 (10 February 2005); doi: 10.1117/12.575464
Proc. SPIE 5638, Calculating Strehl ratio through radial shearing method, 0000 (10 February 2005); doi: 10.1117/12.572570