PROCEEDINGS VOLUME 5640
PHOTONICS ASIA | 8-11 NOVEMBER 2004
Infrared Components and Their Applications
IN THIS VOLUME

0 Sessions, 94 Papers, 0 Presentations
IRFPAs I  (4)
IRFPAs II  (3)
PHOTONICS ASIA
8-11 November 2004
Beijing, China
IR Materials and Basic IR Devices
Proc. SPIE 5640, Experimental determination of diffusion length in SWIR HgCdTe photodiodes, 0000 (10 January 2005); doi: 10.1117/12.568163
Proc. SPIE 5640, Low-frequency noise studies in SWIR HgCdTe photodiodes, 0000 (10 January 2005); doi: 10.1117/12.572547
Proc. SPIE 5640, Research and development of cadmium zinc telluride substrates for mercury cadmium telluride epitaxial films, 0000 (10 January 2005); doi: 10.1117/12.570660
Proc. SPIE 5640, The dark current mechanism of HgCdTe photovoltaic detector passivated by different structure, 0000 (10 January 2005); doi: 10.1117/12.571918
Proc. SPIE 5640, Electrical shock effect on HgCdTe photoconductive detectors, 0000 (10 January 2005); doi: 10.1117/12.573139
Proc. SPIE 5640, Design and fabrication of bi-color multilayer filters for mid- and far-infrared application, 0000 (10 January 2005); doi: 10.1117/12.572842
Proc. SPIE 5640, Theoretical study of monolithic dielectric bolometer by thermal diffusion equation, 0000 (10 January 2005); doi: 10.1117/12.577592
IRFPAs I
Proc. SPIE 5640, Readout circuit with pixel-level analog-to-digital conversion, 0000 (10 January 2005); doi: 10.1117/12.572157
Proc. SPIE 5640, A preliminary study on MBE-grown HgCdTe two-color FPAs, 0000 (10 January 2005); doi: 10.1117/12.572167
Proc. SPIE 5640, Compact and lightweight cooled IR detectors for high-resolution applications, 0000 (10 January 2005); doi: 10.1117/12.578044
Proc. SPIE 5640, A feasible thermal-cycle screening system for cryogenic semiconductor components, 0000 (10 January 2005); doi: 10.1117/12.572718
IRFPAs II
Proc. SPIE 5640, High-performance and low-thermal time constant amorphous silicon-based 320 x 240 uncooled microbolometer IRFPA, 0000 (10 January 2005); doi: 10.1117/12.579876
Proc. SPIE 5640, Dynamic performance analysis of curved focal plane compensation imaging system, 0000 (10 January 2005); doi: 10.1117/12.576479
Proc. SPIE 5640, Advanced packaging development for very low cost uncooled IRFPA, 0000 (10 January 2005); doi: 10.1117/12.579958
Signal Processing I
Proc. SPIE 5640, The nonuniformity measurement and image processing algorithm evaluation for uncooled microbolometer infrared focal plane arrays, 0000 (10 January 2005); doi: 10.1117/12.574027
Poster Session
Proc. SPIE 5640, Realized multipoint method for real-time correction of nonuniformity of uncooled IRFPA, 0000 (10 January 2005); doi: 10.1117/12.571993
Signal Processing I
Proc. SPIE 5640, Real-time infrared image processing system based on DSP technology, 0000 (10 January 2005); doi: 10.1117/12.568288
Signal Processing II
Proc. SPIE 5640, Two-point nonuniformity correction based on LMS, 0000 (10 January 2005); doi: 10.1117/12.566145
Proc. SPIE 5640, Signal processing of microbolometer infrared focal-plane arrays, 0000 (10 January 2005); doi: 10.1117/12.575410
Proc. SPIE 5640, Edge-detection algorithm comparison for coherent imaging ladar, 0000 (10 January 2005); doi: 10.1117/12.573605
Proc. SPIE 5640, Novel algorithm for infrared image enhancement, 0000 (10 January 2005); doi: 10.1117/12.574150
Proc. SPIE 5640, Superresolution of blurred infrared images using the blur parameters identification on the neural network, 0000 (10 January 2005); doi: 10.1117/12.573445
EO Test and Simulation
Proc. SPIE 5640, The software development for IR-simulation test system, 0000 (10 January 2005); doi: 10.1117/12.568376
Proc. SPIE 5640, Closed-loop tracking system of simulated moving target, 0000 (10 January 2005); doi: 10.1117/12.568541
Proc. SPIE 5640, Dynamic IR scene projector using the digital micromirror device, 0000 (10 January 2005); doi: 10.1117/12.571876
Proc. SPIE 5640, Detectivity conversion at different target temperatures for infrared detectors, 0000 (10 January 2005); doi: 10.1117/12.580777
Proc. SPIE 5640, Test bench for infrared detectors, 0000 (10 January 2005); doi: 10.1117/12.580599
Applications I
Proc. SPIE 5640, Design of spectrum-dividing system for binary optic infrared imaging spectrometer, 0000 (10 January 2005); doi: 10.1117/12.567760
Proc. SPIE 5640, Monitoring water quality of a civil river with airborne hyperspectral imager, 0000 (10 January 2005); doi: 10.1117/12.570066
Proc. SPIE 5640, A large spectral range Fourier transform imaging spectral system using single beam splitter, 0000 (10 January 2005); doi: 10.1117/12.570953
Proc. SPIE 5640, FTIR analysis of transformer fault gases, 0000 (10 January 2005); doi: 10.1117/12.571701
Poster Session
Proc. SPIE 5640, Effects of temperature on near-infrared spectroscopic measurement of water, 0000 (10 January 2005); doi: 10.1117/12.572363
Applications I
Proc. SPIE 5640, The MRC method for watched directly imaging system, 0000 (10 January 2005); doi: 10.1117/12.572697
Proc. SPIE 5640, Spectral characteristics of dominant natural grasslands within growth period in the region around Qinghai Lake, 0000 (10 January 2005); doi: 10.1117/12.573834
Proc. SPIE 5640, Difference of multispectral infrared imagery to track dust events, 0000 (10 January 2005); doi: 10.1117/12.575257
Proc. SPIE 5640, The application study of the infrared imaging technology on the transformer fault diagnosis, 0000 (10 January 2005); doi: 10.1117/12.575416
Applications II
Proc. SPIE 5640, Novel temperature and displacement sensor with optical fiber, 0000 (10 January 2005); doi: 10.1117/12.575654
Proc. SPIE 5640, 3D thermography imaging standardization technique for inflammation diagnosis, 0000 (10 January 2005); doi: 10.1117/12.577055
Proc. SPIE 5640, Night vision in Thales Angenieux: custom solutions for hand-held devices, 0000 (10 January 2005); doi: 10.1117/12.580175
Proc. SPIE 5640, Adaptation of existing infrared technologies to unanticipated applications, 0000 (10 January 2005); doi: 10.1117/12.579709
Proc. SPIE 5640, Application of infrared image noise reduction by processing of wavelet transform threshold, 0000 (10 January 2005); doi: 10.1117/12.580778
Proc. SPIE 5640, New algorithm for high-resolution thermal imaging, 0000 (10 January 2005); doi: 10.1117/12.580941
Applications III
Proc. SPIE 5640, Multisensor system for tunnel inspection, 0000 (10 January 2005); doi: 10.1117/12.580600
Proc. SPIE 5640, The application of the UFPA in the detection of hot pipelines underground, 0000 (10 January 2005); doi: 10.1117/12.569445
Proc. SPIE 5640, Wide film detect system, 0000 (10 January 2005); doi: 10.1117/12.574798
Proc. SPIE 5640, Comparison of three chemometrics methods for near-infrared spectra of glucose in the whole blood, 0000 (10 January 2005); doi: 10.1117/12.572350
Proc. SPIE 5640, THz time-domain spectroscopy on plant oils and animal fats, 0000 (10 January 2005); doi: 10.1117/12.580922
Proc. SPIE 5640, Detection of a moving small target in IR cluttered background containing sea and sky areas, 0000 (10 January 2005); doi: 10.1117/12.575785
Proc. SPIE 5640, Detection of a small target in infrared images based on a multiband background model, 0000 (10 January 2005); doi: 10.1117/12.576931
Poster Session
Proc. SPIE 5640, Background clutter and detection algorithm-based staring IR seeker preformance evaluation, 0000 (10 January 2005); doi: 10.1117/12.576475
Applications III
Proc. SPIE 5640, The development of Chinese hyperspectral remote sensing technology, 0000 (10 January 2005); doi: 10.1117/12.578627
Poster Session
Proc. SPIE 5640, The geometric distortions correction of uncooled large-sized relative aperture infrared imaging system, 0000 (10 January 2005); doi: 10.1117/12.576238
Proc. SPIE 5640, The technique of acquiring weak signals in an NIR spectrometer, 0000 (10 January 2005); doi: 10.1117/12.576858
Proc. SPIE 5640, Technology of infrared image process based on difference between continuous frames, 0000 (10 January 2005); doi: 10.1117/12.568286
Proc. SPIE 5640, Fast infrared light source with a construction of silicon microbridge, 0000 (10 January 2005); doi: 10.1117/12.573272
Proc. SPIE 5640, The effect of fill factor of infrared FPA sensor on microscanning imagery quality, 0000 (10 January 2005); doi: 10.1117/12.573414
Proc. SPIE 5640, A nonuniformity correction algorithm for infrared focal-plane arrays, 0000 (10 January 2005); doi: 10.1117/12.573488
Proc. SPIE 5640, Object recognition of ladar with support vector machine, 0000 (10 January 2005); doi: 10.1117/12.573763