PROCEEDINGS VOLUME 5647
BOULDER DAMAGE SYMPOSIUM XXXVI | 20-22 SEPTEMBER 2004
Laser-Induced Damage in Optical Materials: 2004
IN THIS VOLUME

0 Sessions, 66 Papers, 0 Presentations
Thin Films  (8)
BOULDER DAMAGE SYMPOSIUM XXXVI
20-22 September 2004
Boulder, Colorado, United States
Thin Films
Proc. SPIE 5647, New challenges for VUV-XUV radiation resistant coatings, 0000 (21 February 2005); doi: 10.1117/12.583583
Proc. SPIE 5647, Determination of scattering losses in ArF* excimer laser all-dielectric mirrors for 193 nm microlithography application, 0000 (21 February 2005); doi: 10.1117/12.584743
Proc. SPIE 5647, Analysis of coating defects in cavity mirrors for the IR Upgrade FEL, 0000 (21 February 2005); doi: 10.1117/12.585399
Proc. SPIE 5647, Damage thresholds of HfO2/SiO2 and ZrO2/SiO2 high reflectors at 1.064 microns deposited by reactive DC magnetron sputtering, 0000 (21 February 2005); doi: 10.1117/12.583022
Proc. SPIE 5647, Precision damage tests of multilayer dielectric gratings for high-energy petawatt lasers, 0000 (21 February 2005); doi: 10.1117/12.585068
Surfaces and Mirrors
Proc. SPIE 5647, Light scattering from optical substrates and multilayers, 0000 (21 February 2005); doi: 10.1117/12.583582
Proc. SPIE 5647, High-spatial-resolution studies of UV-laser-damage morphology in SiO<sub>2</sub> thin films with artificial defects, 0000 (21 February 2005); doi: 10.1117/12.584899
Proc. SPIE 5647, Observation of laser-induced damage on fused silica initiated by scratches, 0000 (21 February 2005); doi: 10.1117/12.585290
Proc. SPIE 5647, Insitu surface debris inspection and removal system for upward-facing transport mirrors of the National Ignition Facility, 0000 (21 February 2005); doi: 10.1117/12.585077
Thin Films
Proc. SPIE 5647, Single-pulse and burst-mode ablation of gold films measured by quartz crystal microbalance, 0000 (21 February 2005); doi: 10.1117/12.585335
Proc. SPIE 5647, Effect of deposition method and substrate surface quality on laser-induced damage threshold for repetitive 13-ns and 130-fs pulses, 0000 (21 February 2005); doi: 10.1117/12.585300
Surfaces and Mirrors
Proc. SPIE 5647, Evaluation of outgassing contamination effects on optical surfaces of the LIL, 0000 (21 February 2005); doi: 10.1117/12.585229
Proc. SPIE 5647, Cleaning process versus laser-damage threshold of coated optical components, 0000 (21 February 2005); doi: 10.1117/12.584720
Proc. SPIE 5647, Highly localized CO2 laser cleaning and damage repair of silica optical surfaces, 0000 (21 February 2005); doi: 10.1117/12.585293
Proc. SPIE 5647, Identification and measurement of changes in the properties of molecular-contamination-related laser induced damage to fused silica, 0000 (21 February 2005); doi: 10.1117/12.585087
Proc. SPIE 5647, Measurement of absorption levels in mid-infrared coated optics, 0000 (21 February 2005); doi: 10.1117/12.585364
Proc. SPIE 5647, Integrated facility of UV and IR laser process to enhance laser damage resistance of large scale 3w optics, 0000 (21 February 2005); doi: 10.1117/12.585001
Proc. SPIE 5647, Enhancement of surface damage resistance by selective chemical removal of CeO<sub>2</sub>, 0000 (21 February 2005); doi: 10.1117/12.585219
Proc. SPIE 5647, Fluorescence of mitigated laser damage in fused silica, 0000 (21 February 2005); doi: 10.1117/12.585045
Proc. SPIE 5647, Laser damaged optics induced by chromium particle contamination, 0000 (21 February 2005); doi: 10.1117/12.585248
Proc. SPIE 5647, Growth of laser initiated damage in fused silica at 1053 nm, 0000 (21 February 2005); doi: 10.1117/12.585930
Materials and Measurements
Proc. SPIE 5647, Progress toward an athermal HEL optical window, 0000 (21 February 2005); doi: 10.1117/12.584284
Proc. SPIE 5647, 3D photothermal microscope for the detection of nano-sized absorbing defects responsible for laser-induced damage initiation, 0000 (21 February 2005); doi: 10.1117/12.585288
Proc. SPIE 5647, Photochemical adhesion of fused silica glass for UV transmittance, 0000 (21 February 2005); doi: 10.1117/12.588385
Proc. SPIE 5647, Short path thermal desorption GC/MS for screening of molecular contamination in laser systems, 0000 (21 February 2005); doi: 10.1117/12.585086
Proc. SPIE 5647, Computer-controlled measurements of laser-induced damage statistics on large optics, 0000 (21 February 2005); doi: 10.1117/12.585272
Proc. SPIE 5647, Correlation of laser-induced damage to phase objects in bulk fused silica, 0000 (21 February 2005); doi: 10.1117/12.585524
Proc. SPIE 5647, A new damage testing system for detailed evaluation of damage behavior of bulk KDP and DKDP, 0000 (21 February 2005); doi: 10.1117/12.585217
Proc. SPIE 5647, Physical imaging of void using ultrafast light in optical precision, 0000 (21 February 2005); doi: 10.1117/12.583393
Proc. SPIE 5647, Measurement and prediction of rear surface damage in fused silica windows caused by UV nanosecond pulses, 0000 (21 February 2005); doi: 10.1117/12.585243
Proc. SPIE 5647, Pulse length dependence of laser conditioning and bulk damage in KD2PO4, 0000 (21 February 2005); doi: 10.1117/12.585904
Proc. SPIE 5647, Stoichiometric changes to KH2PO4 during laser-induced breakdown, 0000 (21 February 2005); doi: 10.1117/12.584943
Proc. SPIE 5647, All ceramic composite with layer by layer structure by advanced ceramic technology, 0000 (21 February 2005); doi: 10.1117/12.585025
Proc. SPIE 5647, Analysis of laser durability of CaF2 for optical lithography, 0000 (21 February 2005); doi: 10.1117/12.585247
Proc. SPIE 5647, Optical properties of Nd-doped ceramic yttrium aluminum garnet, 0000 (21 February 2005); doi: 10.1117/12.584641
Proc. SPIE 5647, Highlighting of local inhomogeneity in excimer conditioning of KDP, 0000 (21 February 2005); doi: 10.1117/12.585302
Proc. SPIE 5647, Evaluation of high-quality CaF2 single crystals for ultraviolet laser applications, 0000 (21 February 2005); doi: 10.1117/12.584849
Proc. SPIE 5647, Excimer laser conditionning of KDP: influence of the laser parameters and crystal orientation on the laser damage threshold, 0000 (21 February 2005); doi: 10.1117/12.584707
Proc. SPIE 5647, Characterization of the KDP crystals used in large aperture doublers and triplers, 0000 (21 February 2005); doi: 10.1117/12.585350
Proc. SPIE 5647, Transmission and laser damage studies of fused silica and PMMA debris shields with picosecond light pulses, 0000 (21 February 2005); doi: 10.1117/12.584476
Proc. SPIE 5647, Performance of thin borosilicate glass sheets at 351 nm, 0000 (21 February 2005); doi: 10.1117/12.585946
Proc. SPIE 5647, Threshold distribution determination of laser-induced damage precursors in optical coatings and substrates, 0000 (21 February 2005); doi: 10.1117/12.585260
Proc. SPIE 5647, Laser induced fluorocarbon coating onto fused silica optics, 0000 (21 February 2005); doi: 10.1117/12.588387
Proc. SPIE 5647, Highly sensitive method for measuring the onset of damage using a micro channel plate, 0000 (21 February 2005); doi: 10.1117/12.585377
Proc. SPIE 5647, A cherent spectrophotometer based on a periodically poled lithium niobate optical parametric oscillator for optical characterization, 0000 (21 February 2005); doi: 10.1117/12.584909
Proc. SPIE 5647, Subpicosecond Z-scan measurements of the nonlinear refractive index of dense materials, 0000 (21 February 2005); doi: 10.1117/12.585435
Proc. SPIE 5647, Design of an illumination technique to improve the identification of surface flaws on optics, 0000 (21 February 2005); doi: 10.1117/12.585551
Fundamental Mechanisms
Proc. SPIE 5647, Computer modelling of a phenomenon of laser pulse interaction with solid body, 0000 (21 February 2005); doi: 10.1117/12.584991
Proc. SPIE 5647, Laser-induced damage of transparent solids by femtosecond laser pulses, 0000 (21 February 2005); doi: 10.1117/12.585170
Proc. SPIE 5647, Influence of temporal and energetic laser-pulse characteristics on the parameters of shock waves generated in materials, 0000 (21 February 2005); doi: 10.1117/12.585174
Proc. SPIE 5647, Excimer laser conditioning of KDP: correlation of nondestructive optical diagnostics at 351nm with laser damage threshold, 0000 (21 February 2005); doi: 10.1117/12.584706
Proc. SPIE 5647, Pulsed-laser induced shock wave in fused silica for thin film interfacial testing, 0000 (21 February 2005); doi: 10.1117/12.583584
Proc. SPIE 5647, Bulk modification and damage in fused silica induced by femtosecond pulses, 0000 (21 February 2005); doi: 10.1117/12.584878
Proc. SPIE 5647, Laser-induced ionization of solids: back to Keldysh, 0000 (21 February 2005); doi: 10.1117/12.578469
Proc. SPIE 5647, The nature of emission from optical breakdown induced by pulses of fs and ns duration, 0000 (21 February 2005); doi: 10.1117/12.585925
Proc. SPIE 5647, Through a glass, darkly: point defect production by ultrafast laser irradiation of alkali-containing silica glasses and alkali halide single crystals, 0000 (21 February 2005); doi: 10.1117/12.583585
Proc. SPIE 5647, Effect on scattering of complex morphology of DKDP bulk damage sites, 0000 (21 February 2005); doi: 10.1117/12.585927