PROCEEDINGS VOLUME 5679
ELECTRONIC IMAGING 2005 | 16-20 JANUARY 2005
Machine Vision Applications in Industrial Inspection XIII
ELECTRONIC IMAGING 2005
16-20 January 2005
San Jose, California, United States
Industrial Applications I
Proc. SPIE 5679, Automated image analysis of microstructure changes in metal alloys, 0000 (24 February 2005); doi: 10.1117/12.592504
Proc. SPIE 5679, Fast detection of line features in large images, 0000 (24 February 2005); doi: 10.1117/12.591649
Proc. SPIE 5679, Precision of computer vision systems for real-time inspection of contact wire wear in railways, 0000 (24 February 2005); doi: 10.1117/12.587596
Semiconductor and PCB Inspection
Proc. SPIE 5679, Reference-free detection of semiconductor assembly defect, 0000 (24 February 2005); doi: 10.1117/12.584883
Proc. SPIE 5679, Classifier combination for wafer segmentation, 0000 (24 February 2005); doi: 10.1117/12.592109
Proc. SPIE 5679, Three-dimensional reconstruction of wafer solder bumps using binary pattern projection, 0000 (24 February 2005); doi: 10.1117/12.586628
Proc. SPIE 5679, Optical PCB inspection system based on Hausdorff distance, 0000 (24 February 2005); doi: 10.1117/12.587553
Industrial Applications II
Proc. SPIE 5679, A simple optical system for real-time size measurements of TRISO fuel pellets, 0000 (24 February 2005); doi: 10.1117/12.584296
Proc. SPIE 5679, Positional and orientational referencing of multiple light sectioning systems for precision profile measurement, 0000 (24 February 2005); doi: 10.1117/12.586501
Proc. SPIE 5679, Fabric smoothness evaluation using the wavelet domain independent mixture model and a landform classification technique, 0000 (24 February 2005); doi: 10.1117/12.587356
Proc. SPIE 5679, Video-based cargo fire verification system with fuzzy inference engine for commercial aircraft, 0000 (24 February 2005); doi: 10.1117/12.583252
Thermography, High Temperature, and Infrared
Proc. SPIE 5679, Deflectometric inspection of diffuse surfaces in the far-infrared spectrum, 0000 (24 February 2005); doi: 10.1117/12.586612
Proc. SPIE 5679, Square pulse thermography system design considerations for detection of voids inside of the material with different properties and finite differences, 0000 (24 February 2005); doi: 10.1117/12.585744
Proc. SPIE 5679, High-temperature video-extensometry for material testing of refractories, 0000 (24 February 2005); doi: 10.1117/12.586737
Proc. SPIE 5679, Camber measurement at hot strip mill at Voestalpine by using image processing method, 0000 (24 February 2005); doi: 10.1117/12.595073
Proc. SPIE 5679, Broken roll detection, application, algorithm and its basic principles of sensing, 0000 (24 February 2005); doi: 10.1117/12.585847
Range, Stereo, and 3D Applications
Proc. SPIE 5679, Shape reconstruction from noisy surface slope information using a multiresolution Bayesian method, 0000 (24 February 2005); doi: 10.1117/12.589471
Proc. SPIE 5679, Stereovision-based close-up dimensional inspection, 0000 (24 February 2005); doi: 10.1117/12.585918
Proc. SPIE 5679, Polarization imaging applied to 3D reconstruction of specular metallic surfaces, 0000 (24 February 2005); doi: 10.1117/12.586815
Proc. SPIE 5679, Evaluation and calibration methods for the application of a video-extensometer to tensile testing of polymer materials, 0000 (24 February 2005); doi: 10.1117/12.586734
Proc. SPIE 5679, An optical tracked hand-held range sensor, 0000 (24 February 2005); doi: 10.1117/12.585933
Proc. SPIE 5679, Using multispectral information for 3D reconstruction, 0000 (24 February 2005); doi: 10.1117/12.592345
Poster Session
Proc. SPIE 5679, Real-time system for flatness inspection of steel strips, 0000 (24 February 2005); doi: 10.1117/12.585902
Proc. SPIE 5679, Range image registration for industrial inspection, 0000 (24 February 2005); doi: 10.1117/12.585244
Proc. SPIE 5679, Fault diagnosis of vision module on intelligent agent, 0000 (24 February 2005); doi: 10.1117/12.586066
Proc. SPIE 5679, Inspection and measurement of a DWDM core with two stacked glass objects, 0000 (24 February 2005); doi: 10.1117/12.586105
Proc. SPIE 5679, LOG-filter-based inspection of cluster Mura and vertical-band Mura on liquid crystal displays, 0000 (24 February 2005); doi: 10.1117/12.586688
Proc. SPIE 5679, Attributed vector quantization: a new paradigm for image segmentation and pattern acquisition, 0000 (24 February 2005); doi: 10.1117/12.587065
Proc. SPIE 5679, Cotton trash assessment in radiographic x-ray images with scale-space filtering and stereo analysis, 0000 (24 February 2005); doi: 10.1117/12.587334
Proc. SPIE 5679, Low-cost system for ancient stamps range image acquisition, 0000 (24 February 2005); doi: 10.1117/12.588901
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