X-ray Tomography and Small-Angle Scattering for Nondestructive Testing/Reliability I
Proc. SPIE 5766, X-ray refraction topography and computed tomography for NDE of lightweight materials, 0000 (9 May 2005); doi: 10.1117/12.599708
Proc. SPIE 5766, X-ray diffraction topography image materials by molecular probe, 0000 (9 May 2005); doi: 10.1117/12.601886
Proc. SPIE 5766, Micro-mechanical properties of fiber composites characterized by X-ray refraction, 0000 (9 May 2005); doi: 10.1117/12.600967
Proc. SPIE 5766, Direct iterative reconstruction of computed tomography trajectories (DIRECTT), 0000 (9 May 2005); doi: 10.1117/12.600888
X-ray Tomography and Small-Angle Scattering for Nondestructive Testing/Reliability II
Proc. SPIE 5766, Nondestructive characterization of nanoparticles in solids by Raman spectroscopy and small angle x-ray scattering, 0000 (9 May 2005); doi: 10.1117/12.602064
Proc. SPIE 5766, X-ray microscopy for NDE of micro- and nano-structrues, 0000 (9 May 2005); doi: 10.1117/12.601370
Electron/Ion/Photon Techniques for Characterization of Nanoscale and Microscale Materials and Structures
Proc. SPIE 5766, Self-regulating charge control for ultra high resolution scanning electron microscopy, 0000 (9 May 2005); doi: 10.1117/12.603070
Proc. SPIE 5766, FIB based measurements for material characterization on MEMS structures, 0000 (9 May 2005); doi: 10.1117/12.599891
Proc. SPIE 5766, Application of photo and particle acoustic methods, 0000 (9 May 2005); doi: 10.1117/12.602329
Acoustic and Nanomechanical Analyses of Nanoscale and Microscale Materials and Structures I
Proc. SPIE 5766, Elastic modulus of nanomaterials: resonant contact-AFM measurement and reduced-size effects, 0000 (9 May 2005); doi: 10.1117/12.604981
Proc. SPIE 5766, Photoacoustic characterization of the mechanical properties of thin film materials, 0000 (9 May 2005); doi: 10.1117/12.598028
Proc. SPIE 5766, Nondestructive mechanical imaging of carbon nanotubes, 0000 (9 May 2005); doi: 10.1117/12.600349
Proc. SPIE 5766, Numerical time-domain simulation of wave propagation and scattering in acoustic microscopy for subsurface defect characterization, 0000 (9 May 2005); doi: 10.1117/12.602070
Acoustic and Nanomechanical Analyses of Nanoscale and Microscale Materials and Structures II
Proc. SPIE 5766, Shearographic technique for NDE analysis of high frequency bending vibrations of microstructures, 0000 (9 May 2005); doi: 10.1117/12.599024
Near-field Optical Approaches for Nano-scale Analysis of Materials, Structures, and Devices
Proc. SPIE 5766, Antenna-based near-field scanning optical microscopy, 0000 (9 May 2005); doi: 10.1117/12.607421
Proc. SPIE 5766, Near-field nano-Raman imaging of Si device structures, 0000 (9 May 2005); doi: 10.1117/12.600343
Poster Session
Proc. SPIE 5766, Nondestructive characterization of micromachined ceramics, 0000 (9 May 2005); doi: 10.1117/12.599914
Proc. SPIE 5766, Statistical signal parameters of acoustic emission for process monitoring, 0000 (9 May 2005); doi: 10.1117/12.602068
Proc. SPIE 5766, Integrated cantilever fabrication and system development for ultrasonic and acoustic scanning probe microscopy, 0000 (9 May 2005); doi: 10.1117/12.607770
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