PROCEEDINGS VOLUME 5774
FIFTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS | MAY 31 - JUN 2 2004
Fifth International Conference on Thin Film Physics and Applications
IN THIS VOLUME

0 Sessions, 151 Papers, 0 Presentations
General  (3)
FIFTH INTERNATIONAL CONFERENCE ON THIN FILM PHYSICS AND APPLICATIONS
May 31 - Jun 2 2004
Shanghai, China
General
Proc. SPIE 5774, Electromigration in VLSI of thin film interconnects, 0000 (8 December 2004); doi: 10.1117/12.607263
Proc. SPIE 5774, Thin films in silicon carbide semiconductor devices, 0000 (8 December 2004); doi: 10.1117/12.607264
Proc. SPIE 5774, Making ferromagnetic semiconductors out of III-V nitride semiconductors, 0000 (8 December 2004); doi: 10.1117/12.607265
Thin Film Physics
Proc. SPIE 5774, Fabrication of magnetic nanostructures and devices by AFM nanolithography technique, 0000 (8 December 2004); doi: 10.1117/12.607266
Proc. SPIE 5774, The second law of thermodynamics for advanced thin films, 0000 (8 December 2004); doi: 10.1117/12.607267
Proc. SPIE 5774, MBE growth and properties of InN and InN-based diluted magnetic semiconductors, 0000 (8 December 2004); doi: 10.1117/12.607268
Proc. SPIE 5774, Formation and characteristics of quantum dots of wide-bandgap II-VI semiconductor, 0000 (8 December 2004); doi: 10.1117/12.607269
Proc. SPIE 5774, The characteristic criterion of the growth of metallic films from discontinuous to continuous, 0000 (8 December 2004); doi: 10.1117/12.607271
Proc. SPIE 5774, Ballistic emission spectroscopy and imaging of a buried metal-organic interface, 0000 (8 December 2004); doi: 10.1117/12.607273
Proc. SPIE 5774, Comparative study on Al-doped ZnO films sputtered with ceramics and metal targets, 0000 (8 December 2004); doi: 10.1117/12.607274
Proc. SPIE 5774, Monte Carlo study of Kerr effect in NixSi02(1-x) granular films, 0000 (8 December 2004); doi: 10.1117/12.607363
Proc. SPIE 5774, Size and step effects of hysteresis in mixed magnetic films, 0000 (8 December 2004); doi: 10.1117/12.607365
Proc. SPIE 5774, Effects of the next-nearest-neighbor interaction on the phase transition of magnetic multilayers, 0000 (8 December 2004); doi: 10.1117/12.607366
Proc. SPIE 5774, Mesostructure of Fe-based ribbon influenced by inner stress, 0000 (8 December 2004); doi: 10.1117/12.607369
Proc. SPIE 5774, Ab initio study of electronic properties of CoSi2 and NiSi2 in the fluorite structure, 0000 (8 December 2004); doi: 10.1117/12.607375
Proc. SPIE 5774, Formation of GaAs hollow above InAs quantum dots, 0000 (8 December 2004); doi: 10.1117/12.607378
Proc. SPIE 5774, Improve the charge stability of SiO2 films by plasma treatment and ion implantation, 0000 (8 December 2004); doi: 10.1117/12.607379
Proc. SPIE 5774, Photovoltaic feature of boron-doped nanocrystalline carbon films on silicon, 0000 (8 December 2004); doi: 10.1117/12.607381
Proc. SPIE 5774, A novel application of the solid electrolyte thin film for preparing copper nanowires, 0000 (8 December 2004); doi: 10.1117/12.607384
Proc. SPIE 5774, Energy resolution in x-ray detecting microstrip gas chamber fabricated on CVD diamond films, 0000 (8 December 2004); doi: 10.1117/12.607388
Proc. SPIE 5774, Deposition and characterizations of GeCN thin films, 0000 (8 December 2004); doi: 10.1117/12.607463
Proc. SPIE 5774, Theoretical analysis of atom focusing for nanostructure fabrication, 0000 (8 December 2004); doi: 10.1117/12.607464
Proc. SPIE 5774, MBE growth and magnetoresistance properties of PrSrMnO3 films on NdGaO3(100) substrate, 0000 (8 December 2004); doi: 10.1117/12.607465
Proc. SPIE 5774, Thickness effects on microwave properties and ferromagnetic resonance of Fe-Co-B magnetic thin films, 0000 (8 December 2004); doi: 10.1117/12.607466
Proc. SPIE 5774, Calculation of temperature field of CO2 laser conditioning of fused silica, 0000 (8 December 2004); doi: 10.1117/12.607468
Proc. SPIE 5774, Efficient field emission from porous silicon, 0000 (8 December 2004); doi: 10.1117/12.607469
Proc. SPIE 5774, Effect of high-energy ball milling on morphology and field emission properties of multi-walled carbon nanotubes, 0000 (8 December 2004); doi: 10.1117/12.607470
Thin Film Materials
Proc. SPIE 5774, Piezoelectric PZT thin films derived by sol-gel techniques, 0000 (8 December 2004); doi: 10.1117/12.607471
Proc. SPIE 5774, Correlation between the optical and electrical parameters of ZnSe thin films, 0000 (8 December 2004); doi: 10.1117/12.607472
Proc. SPIE 5774, Fabrication of SiGe-on-insulator and applications for strained Si, 0000 (8 December 2004); doi: 10.1117/12.607473
Proc. SPIE 5774, Investigation of laser-induced damage of dielectric optical coatings, 0000 (8 December 2004); doi: 10.1117/12.607547
Proc. SPIE 5774, Vanadium oxide thin films prepared by RF magnetron sputtering method, 0000 (8 December 2004); doi: 10.1117/12.607548
Proc. SPIE 5774, The nanostructures and optical properties of ZnO films by RF magnetron sputtering, 0000 (8 December 2004); doi: 10.1117/12.607551
Proc. SPIE 5774, The study on the interface adhesion comparison of MgF2, Al2O3, SiO2, and Ag thin films, 0000 (8 December 2004); doi: 10.1117/12.607552
Proc. SPIE 5774, Study on the structure and ferroelectric properties of sol-gel-derived Pb(Mg1/3Nb2/3)O3-PbTiO3 thin films, 0000 (8 December 2004); doi: 10.1117/12.607553
Proc. SPIE 5774, Heat-treating effect on the properties of Pb1-xLax(Zr0.4Ti0.6)O3 ferroelectric thin film prepared by a modified sol-gel process, 0000 (8 December 2004); doi: 10.1117/12.607555
Proc. SPIE 5774, Optical properties of BaTiO3 and Mn:BaTiO3 thin films deposited on fused quartz and silicon substrates using a sol-gel method, 0000 (8 December 2004); doi: 10.1117/12.607556
Proc. SPIE 5774, Doped (AlxGa1-x)0.5In0.5P alloys grown by MOCVD, 0000 (8 December 2004); doi: 10.1117/12.607557
Proc. SPIE 5774, Ion implantation into Si covered by HfO2 or SiO2 film, 0000 (8 December 2004); doi: 10.1117/12.607558
Proc. SPIE 5774, Influence of different bottom electrodes to microstructure and electrical properties of Pb(Zr0.52Ti0.48)O3 ferroelectric films, 0000 (8 December 2004); doi: 10.1117/12.607559
Proc. SPIE 5774, The preparation of the single-phase perovskite conductive LaNiO3 films on different substrates, 0000 (8 December 2004); doi: 10.1117/12.607561
Proc. SPIE 5774, Photoelectric properties of unsymmetrical metal-free phthalocyanine and C60 complex thin films, 0000 (8 December 2004); doi: 10.1117/12.607617
Proc. SPIE 5774, Gallium phosphide protective infrared films on zinc sulphide deposited by RF-planar magnetron sputtering, 0000 (8 December 2004); doi: 10.1117/12.607618
Proc. SPIE 5774, The phase transformation and mechanical behavior of NiTi thin films, 0000 (8 December 2004); doi: 10.1117/12.607619
Proc. SPIE 5774, Microstructure and properties of sol-gel-derived (La,Sr)CoO3 thin film with compositional fluctuation La/Sr ratio, 0000 (8 December 2004); doi: 10.1117/12.607621
Proc. SPIE 5774, Thickness-dependent electrical properties of lead zirconate titanate thin films on titanium substrates, 0000 (8 December 2004); doi: 10.1117/12.607622
Proc. SPIE 5774, Influence of buffer layer on dielectric properties of (Ba1-xSrx)TiO3 thin films, 0000 (8 December 2004); doi: 10.1117/12.607623
Proc. SPIE 5774, Study on the stress of silicon nitride thin films prepared by PECVD, 0000 (8 December 2004); doi: 10.1117/12.607626
Proc. SPIE 5774, Photoconductivity of azo-polymer-copper-phthalocyanine-diamond-like carbon films, 0000 (8 December 2004); doi: 10.1117/12.607627
Proc. SPIE 5774, The preparation of diamond films on new composite ceramic substrates of diamond and alumina, 0000 (8 December 2004); doi: 10.1117/12.607629
Proc. SPIE 5774, Ferroelectricity of BiFeO3 prepared by the chemical solution deposition method, 0000 (8 December 2004); doi: 10.1117/12.607631
Proc. SPIE 5774, The studies of RT electrical resistivities of LaNiO3-δ thin films by RF magnetron sputtering with different percentage of oxygen partial pressure at various substrate temperatures, 0000 (8 December 2004); doi: 10.1117/12.607751
Proc. SPIE 5774, Formation mechanism of the VO2 polycrystalline film prepared by modified-ion-beam enhanced deposition, 0000 (8 December 2004); doi: 10.1117/12.607752
Proc. SPIE 5774, The transmission of organic group in solid electrolyte film, 0000 (8 December 2004); doi: 10.1117/12.607753
Proc. SPIE 5774, Thickness effect of LaNiO3 buffer layer on microstructure and electrical properties of PZT thin films, 0000 (8 December 2004); doi: 10.1117/12.607754
Proc. SPIE 5774, Structural and electrical properties of Pb(Zr,Ti)O3 thin films on NiCr substrate modified by LaNiO3 and PbTiO3 buffer layers, 0000 (8 December 2004); doi: 10.1117/12.607755
Proc. SPIE 5774, Tunable properties of PbxSr1-xTiO3 thin films, 0000 (8 December 2004); doi: 10.1117/12.607283
Proc. SPIE 5774, Preparation and characterization of chemically deposited SnS thin films, 0000 (8 December 2004); doi: 10.1117/12.607284
Proc. SPIE 5774, Preparation and characterization of Nd-doped Bi4Ti3O12 thin films by pulsed laser deposition method, 0000 (8 December 2004); doi: 10.1117/12.607285