PROCEEDINGS VOLUME 5844
SPIE THIRD INTERNATIONAL SYMPOSIUM ON FLUCTUATIONS AND NOISE | 24-26 MAY 2005
Noise in Devices and Circuits III
Proceedings Volume 5844 is from: Logo
SPIE THIRD INTERNATIONAL SYMPOSIUM ON FLUCTUATIONS AND NOISE
24-26 May 2005
Austin, Texas, United States
Noise in MOSFETs I
Proc. SPIE 5844, A physical understanding of the noise performance of MOS transistors for wireless and lightwave applications in the giga-bit regime, 0000 (23 May 2005); doi: 10.1117/12.609965
Proc. SPIE 5844, Low frequency noise in SOI transistors, 0000 (23 May 2005); doi: 10.1117/12.609628
Proc. SPIE 5844, Flicker noise in nitrided high-k dielectric NMOS transistors, 0000 (23 May 2005); doi: 10.1117/12.609632
Proc. SPIE 5844, Trap competition inducing R.T.S noise in saturation range in N-MOSFETs, 0000 (23 May 2005); doi: 10.1117/12.609375
Proc. SPIE 5844, Hot carrier effects on jitter and phase noise in CMOS voltage-controlled oscillators, 0000 (23 May 2005); doi: 10.1117/12.609196
Low-Frequency Noise
Proc. SPIE 5844, 1/f noise in SOI buried oxides and alternative dielectrics to SiO2, 0000 (23 May 2005); doi: 10.1117/12.609720
Proc. SPIE 5844, Low frequency noise of light emitting diodes, 0000 (23 May 2005); doi: 10.1117/12.608559
Proc. SPIE 5844, Low-frequency noise measurements used for semiconductors light active devices, 0000 (23 May 2005); doi: 10.1117/12.609228
Proc. SPIE 5844, Studying the dependence of low-frequency noise on geometrical shape of Al-based thin film interconnects, 0000 (23 May 2005); doi: 10.1117/12.609338
Noise in Bipolar Devices
Proc. SPIE 5844, Noise in SiGe HBTs: opportunities and challenges, 0000 (23 May 2005); doi: 10.1117/12.608773
Proc. SPIE 5844, Comparison of 1/f noise in complementary NPN and PNP polysilicon emitter bipolar transistors, 0000 (23 May 2005); doi: 10.1117/12.609513
Proc. SPIE 5844, Investigating the differences in low-frequency noise behavior of npn and pnp SiGe HBTs fabricated in a complementary SiGe HBT BiCMOS on SOI technology, 0000 (23 May 2005); doi: 10.1117/12.609342
Proc. SPIE 5844, Anomalous low-frequency noise behavior in 210 GHz SiGe HBTs, 0000 (23 May 2005); doi: 10.1117/12.609300
Proc. SPIE 5844, Noise behavior of a PNP- and NPN-type SiGe HBT: a simulation study, 0000 (23 May 2005); doi: 10.1117/12.609452
New Directions in Noise Research
Proc. SPIE 5844, Nano device for monitoring electrical fluctuations on bacterial scale, 0000 (23 May 2005); doi: 10.1117/12.611244
Proc. SPIE 5844, Nanoscale MOS devices: device parameter fluctuations and low-frequency noise, 0000 (23 May 2005); doi: 10.1117/12.610124
Noise in MOSFETs II
Proc. SPIE 5844, Different noise mechanisms in high-k dielectric gate stacks, 0000 (23 May 2005); doi: 10.1117/12.611250
Proc. SPIE 5844, High frequency noise of SOI MOSFETs: performances and limitations, 0000 (23 May 2005); doi: 10.1117/12.609669
Proc. SPIE 5844, Low-frequency noise parameter extraction in poly-Si thin-film transistors, 0000 (23 May 2005); doi: 10.1117/12.609592
Proc. SPIE 5844, Flicker noise characteristics of MOSFETs with HfO2, HfAlOx, and Al2O3/HfO2 gate dielectrics, 0000 (23 May 2005); doi: 10.1117/12.609500
Proc. SPIE 5844, MOSFET 1/f noise under switched bias conditions, 0000 (23 May 2005); doi: 10.1117/12.608763
Noise in Devices and Circuits
Proc. SPIE 5844, Why did Intel fail with 60 nanometers? Reiteration of the noise, information, speed, and heat aspects of the breakdown of Moore's Law, 0000 (23 May 2005); doi: 10.1117/12.609553
Proc. SPIE 5844, A combined noise analysis and power supply current based testing of CMOS analog integrated circuits, 0000 (23 May 2005); doi: 10.1117/12.609258
Proc. SPIE 5844, Analysis and simulation of noise in correlated double sampling imager circuits, 0000 (23 May 2005); doi: 10.1117/12.608761
Noise in GaN Devices
Proc. SPIE 5844, Physics of GaN devices, 0000 (23 May 2005); doi: 10.1117/12.611449
Proc. SPIE 5844, Characterization of 1/f noise in GaN-based HEMTs under high dc voltage stress, 0000 (23 May 2005); doi: 10.1117/12.609283
Proc. SPIE 5844, Investigation of the trap states and their effect on the low-frequency noise in GaN/AlGaN HFETs, 0000 (23 May 2005); doi: 10.1117/12.609571
Noise in Circuits and Systems
Proc. SPIE 5844, A simple noise modeling based testing of CMOS analog integrated circuits, 0000 (23 May 2005); doi: 10.1117/12.609253
Proc. SPIE 5844, A sampling wattmeter for noise power measurements, 0000 (23 May 2005); doi: 10.1117/12.608787
Proc. SPIE 5844, Exploiting metastability and thermal noise to build a reconfigurable hardware random number generator, 0000 (23 May 2005); doi: 10.1117/12.620306
Plenary Presentation
Proc. SPIE 5844, Energy barriers, demons, and minimum energy operation of electronic devices, 0000 (23 May 2005); doi: 10.1117/12.613118
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