PROCEEDINGS VOLUME 5852
THIRD INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS AND THIRD CONFERENCE OF THE ASIAN COMMITTEE ON EXPERIMENTAL MECHANICS | NOV 29 - DEC 1 2004
Third International Conference on Experimental Mechanics and Third Conference of the Asian Committee on Experimental Mechanics
THIRD INTERNATIONAL CONFERENCE ON EXPERIMENTAL MECHANICS AND THIRD CONFERENCE OF THE ASIAN COMMITTEE ON EXPERIMENTAL MECHANICS
Nov 29 - Dec 1 2004
-, Singapore
Keynote Presentations
Proc. SPIE 5852, Biologically inspired robotic inspectors: the engineering reality and future outlook, 0000 (12 April 2005); doi: 10.1117/12.621176
Bio-Sensors I
Proc. SPIE 5852, Optics-based sensor for DNA screening applications, 0000 (12 April 2005); doi: 10.1117/12.621180
Proc. SPIE 5852, Using a new liquid-crystal polarization modulator for a polarimetric glucose sensor, 0000 (12 April 2005); doi: 10.1117/12.621220
Smart Structures
Proc. SPIE 5852, Converting signals to knowledge in structural health monitoring systems, 0000 (12 April 2005); doi: 10.1117/12.621225
Proc. SPIE 5852, Comparative study of all optical fibers in different smart structures and non-destructive evaluation, 0000 (12 April 2005); doi: 10.1117/12.621298
Proc. SPIE 5852, Structural health monitoring of smart civil structures using fibre optic sensors, 0000 (12 April 2005); doi: 10.1117/12.621300
Proc. SPIE 5852, Vision-based automatic measurement of endface geometry of single-fiber optical connectors, 0000 (12 April 2005); doi: 10.1117/12.621301
Proc. SPIE 5852, The dynamic properties behavior of high strength concrete under different strain rate, 0000 (12 April 2005); doi: 10.1117/12.621303
Advanced Photonic Sensors I
Proc. SPIE 5852, Optical large mirror design, 0000 (12 April 2005); doi: 10.1117/12.621307
Proc. SPIE 5852, Quantitative image quality evaluations of enhanced images in turbid water medium, 0000 (12 April 2005); doi: 10.1117/12.621413
Proc. SPIE 5852, Optical image sensing through turbid water, 0000 (12 April 2005); doi: 10.1117/12.621415
Fibre Sensor I
Proc. SPIE 5852, Designing, manufacturing, and testing of embedded EFPI strain sensor for damage detection of smart composite beams, 0000 (12 April 2005); doi: 10.1117/12.621417
Proc. SPIE 5852, Plastic optical fibre sensor for structural health monitoring, 0000 (12 April 2005); doi: 10.1117/12.621418
Proc. SPIE 5852, Drop-test study of parachute textile with embedded fiber optic sensors, 0000 (12 April 2005); doi: 10.1117/12.621419
Proc. SPIE 5852, Tool breakage detection in millin operations using a fiber optic sensor, 0000 (12 April 2005); doi: 10.1117/12.621420
Aerospace Materials, Composites and Buildings
Proc. SPIE 5852, Air-coupled ultrasonic measurements in composites, 0000 (12 April 2005); doi: 10.1117/12.621422
Proc. SPIE 5852, Modified single lap joint (MSLJ) test configuration for the determination of adhesive fracture energy, 0000 (12 April 2005); doi: 10.1117/12.621427
Proc. SPIE 5852, Composite materials based on carbon nanotubes for aerospace applications, 0000 (12 April 2005); doi: 10.1117/12.621441
Proc. SPIE 5852, Influence of high pressure water-jet-assisted machining on surface residual stresses on the work-piece of Ti-6AL-4V alloy, 0000 (12 April 2005); doi: 10.1117/12.621449
Proc. SPIE 5852, In situ inspection of inclusions in toughened glass panels of high-rise buildings, 0000 (12 April 2005); doi: 10.1117/12.621451
Proc. SPIE 5852, Effect of distribution types of variables on reliability estimation of buried pipelines, 0000 (12 April 2005); doi: 10.1117/12.621455
Profile Measurement I
Proc. SPIE 5852, Shape measurement by unwrapping method using aliasing of Fourier spectrum, 0000 (12 April 2005); doi: 10.1117/12.621457
Proc. SPIE 5852, A novel phase measurement profilometry based on linear CCD array, 0000 (12 April 2005); doi: 10.1117/12.621463
Proc. SPIE 5852, Surface contour measurement by grating projection method based on Talbot effect, 0000 (12 April 2005); doi: 10.1117/12.621465
Proc. SPIE 5852, Numerical simulation effect of DMD spatio-temporal characteristic on phase measuring profilometry, 0000 (12 April 2005); doi: 10.1117/12.621466
Proc. SPIE 5852, Profilometry using optical edge projection, 0000 (12 April 2005); doi: 10.1117/12.621482
Image Processing I
Proc. SPIE 5852, Determination of phase-shift from two fringe patterns using windowed Fourier ridges, 0000 (12 April 2005); doi: 10.1117/12.621484
Proc. SPIE 5852, Electroholography unit for three-dimensional display using special-purpose chip and high minute LCD panel, 0000 (12 April 2005); doi: 10.1117/12.621493
Proc. SPIE 5852, Temporal phase processing with compression in interferometry, 0000 (12 April 2005); doi: 10.1117/12.621498
Proc. SPIE 5852, New initiatives in phase unwrapping in digital photoelasticity, 0000 (12 April 2005); doi: 10.1117/12.621501
Proc. SPIE 5852, Simplified Carre method for phase extraction, 0000 (12 April 2005); doi: 10.1117/12.621505
Proc. SPIE 5852, Spatially sampling effect on fringe phase-shifting detection, 0000 (12 April 2005); doi: 10.1117/12.621507
Optical NDT and Biological Techniques
Proc. SPIE 5852, Mobile shearography, 0000 (12 April 2005); doi: 10.1117/12.621483
Proc. SPIE 5852, Non-contact damage monitoring by laser AE technique, 0000 (12 April 2005); doi: 10.1117/12.621485
Proc. SPIE 5852, Vibration analysis of gyro sensors by using ESPI technique, 0000 (12 April 2005); doi: 10.1117/12.621488
Proc. SPIE 5852, A novel fiber optic sensor for the measurement of pH of blood based on colorimetry, 0000 (12 April 2005); doi: 10.1117/12.621490
Proc. SPIE 5852, Bar code identification of digital levels, 0000 (12 April 2005); doi: 10.1117/12.621504
Advanced Photonic Sensors II
Proc. SPIE 5852, Improvement of elliptically polarized white light technique for photoviscoelasticity, 0000 (12 April 2005); doi: 10.1117/12.621506
Proc. SPIE 5852, Measurements of the principal axis and phase retardation using a new circular polariscope and the Senarmont setup, 0000 (12 April 2005); doi: 10.1117/12.621517
Proc. SPIE 5852, 3-D stress analysis using the Jones matrix image Fourier polarimetry technique, 0000 (12 April 2005); doi: 10.1117/12.621520
Proc. SPIE 5852, Calculation of Fourier holographic storage density, 0000 (12 April 2005); doi: 10.1117/12.621522
Proc. SPIE 5852, 3D information acquired by the correlation of projected fringe patterns, 0000 (12 April 2005); doi: 10.1117/12.621525
Micro-Nano Systems I
Proc. SPIE 5852, A new positioning and loading system for the study of the mechanical behavior of small and micro components, 0000 (12 April 2005); doi: 10.1117/12.621529
Proc. SPIE 5852, Thermo-mechanical data bit formation of small-sized microcantilever probe tip array, 0000 (12 April 2005); doi: 10.1117/12.621530
Proc. SPIE 5852, New radiation sources from channeling in micro- and nano-structures, 0000 (12 April 2005); doi: 10.1117/12.621531
Proc. SPIE 5852, Fabrication and characterization of piezoelectric cantilever for micro transducers, 0000 (12 April 2005); doi: 10.1117/12.621532
Proc. SPIE 5852, Size effect on quasi-brittle fracture, 0000 (12 April 2005); doi: 10.1117/12.621534
Micro-Measurement I
Proc. SPIE 5852, Mechanical properties of lead-free solder alloys evaluated by miniature size specimen, 0000 (12 April 2005); doi: 10.1117/12.621538
Proc. SPIE 5852, Deformation field measurement on micro and nanotechnology components utilizing SFM and FIB equipment, 0000 (12 April 2005); doi: 10.1117/12.621539
Proc. SPIE 5852, Vibration measurements on smart electronic structures by means of laser techniques, 0000 (12 April 2005); doi: 10.1117/12.621542
Proc. SPIE 5852, Design methodology of microstructures for enhanced mechanical reliability, 0000 (12 April 2005); doi: 10.1117/12.621978
Proc. SPIE 5852, Optical full-field technique for measuring deformation on micromechanical components, 0000 (12 April 2005); doi: 10.1117/12.621982
Advanced Photonic Sensors III
Proc. SPIE 5852, Measurement of blood velocity using laser Doppler method for the designing module, 0000 (12 April 2005); doi: 10.1117/12.621497
Proc. SPIE 5852, Reactive magnetron sputtering of antinomy tin oxide films on glass substrate, 0000 (12 April 2005); doi: 10.1117/12.621512
Mems, Micro-Nano Systems II
Proc. SPIE 5852, Methodology to study the effect of moisture on refractive index of optical adhesive, 0000 (12 April 2005); doi: 10.1117/12.621989
Proc. SPIE 5852, Development of an optical interferometer for micro-components inspection, 0000 (12 April 2005); doi: 10.1117/12.621998
Proc. SPIE 5852, Optimized SU-8 UV-lithographical process for a Ka-band filter fabrication, 0000 (12 April 2005); doi: 10.1117/12.621665
Proc. SPIE 5852, Design of micro robots with microgrippers for manipulation of micro-parts, 0000 (12 April 2005); doi: 10.1117/12.621681