PROCEEDINGS VOLUME 5856
OPTICAL METROLOGY | 13-17 JUNE 2005
Optical Measurement Systems for Industrial Inspection IV
IN THIS VOLUME

0 Sessions, 119 Papers, 0 Presentations
Applications  (23)
Proceedings Volume 5856 is from: Logo
OPTICAL METROLOGY
13-17 June 2005
Munich, Germany
New Approaches: Algorithms and Sensors
Proc. SPIE 5856, Modern approaches in phase measuring metrology, 0000 (13 June 2005); doi: 10.1117/12.621581
Proc. SPIE 5856, Full-field low-frequency heterodyne interferometry using CMOS and CCD cameras with online phase processing, 0000 (13 June 2005); doi: 10.1117/12.612721
Proc. SPIE 5856, Fast three-dimensional phase-unwrapping algorithm based on sorting by reliability following a non-continuous path, 0000 (13 June 2005); doi: 10.1117/12.611415
Proc. SPIE 5856, Gated heterodyne coherent anti-Stokes Raman scattering for high-contrast vibrational imaging, 0000 (13 June 2005); doi: 10.1117/12.612555
Proc. SPIE 5856, Study of polarizing intercorrelative function of coherent images of phase-inhomogeneous layer anisotropy, 0000 (13 June 2005); doi: 10.1117/12.612424
Proc. SPIE 5856, Reconstruction of in-line hologram by using iterative algorithm, 0000 (13 June 2005); doi: 10.1117/12.612411
Proc. SPIE 5856, Image focusing properties in reconstructing digital holograms, 0000 (13 June 2005); doi: 10.1117/12.612935
Proc. SPIE 5856, High-resolution lensless Fourier-transform digital holography, 0000 (13 June 2005); doi: 10.1117/12.612834
Proc. SPIE 5856, Determination and applications of contoured windows for ESPI fringe pattern processing, 0000 (13 June 2005); doi: 10.1117/12.612488
Proc. SPIE 5856, Reflectivity function based illumination and sensor planning for industrial inspection, 0000 (13 June 2005); doi: 10.1117/12.612547
Proc. SPIE 5856, Illumination-based segmentation of structured surfaces in automated visual inspection, 0000 (13 June 2005); doi: 10.1117/12.612108
Proc. SPIE 5856, New method of structure light measurement system calibration based on adaptive and effective evaluation of 3D-phase distribution, 0000 (13 June 2005); doi: 10.1117/12.613017
Proc. SPIE 5856, Optical 3D sensor for large objects in industrial application, 0000 (13 June 2005); doi: 10.1117/12.612896
Proc. SPIE 5856, Confocal micro-optical distance sensor: principle and design, 0000 (13 June 2005); doi: 10.1117/12.612008
Proc. SPIE 5856, Confocal micro-optical distance sensor: realization and results, 0000 (13 June 2005); doi: 10.1117/12.612418
Proc. SPIE 5856, Influence of component imperfection on null ellipsometry with phase modulation, 0000 (13 June 2005); doi: 10.1117/12.612489
Proc. SPIE 5856, A compact electronic speckle pattern interferometry system using a photopolymer reflection holographic optical element, 0000 (13 June 2005); doi: 10.1117/12.613252
Proc. SPIE 5856, Fiber optic spark plug sensor for UV-LIF measurements close to the ignition spark, 0000 (13 June 2005); doi: 10.1117/12.612644
Shape Measurement
Proc. SPIE 5856, Optical high-speed 3D metrology in harsh environments: recording structural data of railway lines, 0000 (13 June 2005); doi: 10.1117/12.621583
Proc. SPIE 5856, Absolute distance metrology for space interferometers, 0000 (13 June 2005); doi: 10.1117/12.612568
Proc. SPIE 5856, An online laser caliper measurement for the paper industry, 0000 (13 June 2005); doi: 10.1117/12.611890
Proc. SPIE 5856, Robust high-precision 2D optical range sensor, 0000 (13 June 2005); doi: 10.1117/12.612616
Proc. SPIE 5856, Optical distance measurements for closely spaced targets using a FMCW approach, 0000 (13 June 2005); doi: 10.1117/12.612537
Proc. SPIE 5856, Profiling of gas turbine blade using phase shifting Talbot interferometric technique, 0000 (13 June 2005); doi: 10.1117/12.612471
Proc. SPIE 5856, Measurements from a novel interferometer for EUVL mirror substrates, 0000 (13 June 2005); doi: 10.1117/12.612433
Proc. SPIE 5856, Improved optical linewidth measurement by means of alternating dark field illumination and model-based evaluation, 0000 (13 June 2005); doi: 10.1117/12.612460
Proc. SPIE 5856, Mirror shape detection by reflection grating moiré method with optical design validation, 0000 (13 June 2005); doi: 10.1117/12.612114
Proc. SPIE 5856, High-accuracy profile form measurement by a scanning system consisting of an angle sensor and coupled distance sensors, 0000 (13 June 2005); doi: 10.1117/12.612492
Proc. SPIE 5856, Industrial inspection of specular surfaces using a new calibration procedure, 0000 (13 June 2005); doi: 10.1117/12.621587
Proc. SPIE 5856, High-speed and line-feed Fourier domain optical coherence tomography, 0000 (13 June 2005); doi: 10.1117/12.621582
Proc. SPIE 5856, 2D parallel optical coherence tomography and multiple-layer information extraction, 0000 (13 June 2005); doi: 10.1117/12.611825
Proc. SPIE 5856, White-light spectral interferometric technique used to measure the dispersion of the group birefringence of a uniaxial crystal, 0000 (13 June 2005); doi: 10.1117/12.612249
Proc. SPIE 5856, Dispersive white-light interferometry for thin-film thickness profile measurement, 0000 (13 June 2005); doi: 10.1117/12.612076
Proc. SPIE 5856, Three-dimensional machine vision utilising optical coherence tomography with a direct read-out CMOS camera, 0000 (13 June 2005); doi: 10.1117/12.612087
Proc. SPIE 5856, Micro-optics metrology using advanced interferometry, 0000 (13 June 2005); doi: 10.1117/12.612584
Proc. SPIE 5856, Microlenses metrology with digital holographic microscopy, 0000 (13 June 2005); doi: 10.1117/12.612600
Proc. SPIE 5856, Development of measurement of microstructure using moiré topography in SEM, 0000 (13 June 2005); doi: 10.1117/12.612442
Proc. SPIE 5856, Edge enhancement of weak-phase object in laser scanning confocal microscope, 0000 (13 June 2005); doi: 10.1117/12.612481
Proc. SPIE 5856, Dimensional metrology for the fabrication of imaging optics using a high accuracy low coherence interferometer, 0000 (13 June 2005); doi: 10.1117/12.612563
Proc. SPIE 5856, A long standoff profilometer for surface inspection in adverse environments based on conoscopic holography, 0000 (13 June 2005); doi: 10.1117/12.612259
Proc. SPIE 5856, 3D surface reconstruction based on combined analysis of reflectance and polarisation properties, 0000 (13 June 2005); doi: 10.1117/12.612545
Proc. SPIE 5856, Computer generated holograms for the optical shop testing of aspheres, 0000 (13 June 2005); doi: 10.1117/12.612577
Proc. SPIE 5856, 3D measurement of human face by stereophotogrammetry, 0000 (13 June 2005); doi: 10.1117/12.612225
Proc. SPIE 5856, Precision inspection of diameters for circular reflecting cylinders, 0000 (13 June 2005); doi: 10.1117/12.621588
Proc. SPIE 5856, ESPI for contouring of surfaces with discontinuities, 0000 (13 June 2005); doi: 10.1117/12.612589
Displacement and Strain Measurement
Proc. SPIE 5856, Recent issues on development of reference materials and standardized tests of optical methods of strain measurement, 0000 (13 June 2005); doi: 10.1117/12.621586
Proc. SPIE 5856, Polarization plane rotator used as a phase stepping device in a 2-channel shearing speckle interferometer, 0000 (13 June 2005); doi: 10.1117/12.612562
Proc. SPIE 5856, TV-holographic mapping of airborne sound fields for the design of parametric arrays, 0000 (13 June 2005); doi: 10.1117/12.612573
Proc. SPIE 5856, Comparison of shearography and optical fibre Bragg grating strain sensors with resistance foil strain gauge measurements, 0000 (13 June 2005); doi: 10.1117/12.611887
Proc. SPIE 5856, Fast distance sensing by use of the speckle effect, 0000 (13 June 2005); doi: 10.1117/12.612576
Proc. SPIE 5856, The laser-scanning confocal vibrometer microscope, 0000 (13 June 2005); doi: 10.1117/12.611996
Proc. SPIE 5856, Accuracy analysis of major signal processing techniques in laser Doppler velocimetry, 0000 (13 June 2005); doi: 10.1117/12.612618
Proc. SPIE 5856, Interferogram intensity modulation calculations using temporal phase shifting: error analysis, 0000 (13 June 2005); doi: 10.1117/12.612097
Proc. SPIE 5856, Development and investigation of high resolution resonant pressure sensor with optical interrogation, 0000 (13 June 2005); doi: 10.1117/12.612605
Proc. SPIE 5856, Time synchronization of oscillating objects with laser pulse in pulse interferometry, 0000 (13 June 2005); doi: 10.1117/12.612581
Proc. SPIE 5856, Specification of vibrational modes and amplitudes in large-scale structure by time averaging moiré technique, 0000 (13 June 2005); doi: 10.1117/12.612414
Non-Destructive Testing
Proc. SPIE 5856, Performance evaluation of a residual stress measurement device using indentation and a radial in-plane ESPI interferometer, 0000 (13 June 2005); doi: 10.1117/12.612615
Proc. SPIE 5856, Superconductor ceramics behavior analyses during service by speckle metrology, 0000 (13 June 2005); doi: 10.1117/12.612601