OPTICS AND PHOTONICS 2005
31 July - 4 August 2005
San Diego, California, United States
Projects
Proc. SPIE 5869, Progress toward a third Gemini M2 mirror, 586901 (26 August 2005); doi: 10.1117/12.621500
Proc. SPIE 5869, Status of ZERODUR mirror blank production at SCHOTT, 586902 (19 August 2005); doi: 10.1117/12.613880
Proc. SPIE 5869, Fabrication and metrology of freeform aluminum mirrors for the SCUBA-2 instrument, 586905 (19 August 2005); doi: 10.1117/12.612998
Proc. SPIE 5869, The prototype of ultralight mirror system, 586907 (20 August 2005); doi: 10.1117/12.619188
Optical Fabrication I: FJP
Proc. SPIE 5869, Prepolishing and finishing of optical surfaces using fluid jet polishing, 586908 (23 August 2005); doi: 10.1117/12.618628
Proc. SPIE 5869, Jet-induced high-precision finishing of challenging optics, 586909 (18 August 2005); doi: 10.1117/12.617306
Proc. SPIE 5869, Development and optimization of FJP tools and their practical verification, 58690A (23 August 2005); doi: 10.1117/12.618671
Proc. SPIE 5869, New results in hydrodynamic radial polishing using HyDRa, 58690C (23 August 2005); doi: 10.1117/12.637409
Optical Fabrication II: Polishing
Proc. SPIE 5869, Cycle time and cost reduction in large-size optics production, 58690D (19 August 2005); doi: 10.1117/12.617779
Proc. SPIE 5869, New results extending the Precessions process to smoothing ground aspheres and producing freeform parts, 58690E (24 August 2005); doi: 10.1117/12.617067
Proc. SPIE 5869, UltraForm finishing process for optical materials, 58690F (20 August 2005); doi: 10.1117/12.623833
Proc. SPIE 5869, A new approach to predict computer controlled polishing results, 58690H (19 August 2005); doi: 10.1117/12.616780
Proc. SPIE 5869, Improvement of thickness uniformity of quartz crystal wafer by numerically controlled plasma CVM, 58690I (19 August 2005); doi: 10.1117/12.615604
Optical Fabrication III: MRF et al.
Proc. SPIE 5869, Analysis of thermal sources in a magnetorheological finishing (MRF) process, 58690J (19 August 2005); doi: 10.1117/12.616751
Proc. SPIE 5869, Effects of nanodiamond abrasive friability in experimental MR fluids with phosphate laser glass LHG-8 and other optical glasses, 58690K (18 August 2005); doi: 10.1117/12.613959
Proc. SPIE 5869, New viscosity measurement for magnetorheological polishing fluid, 58690L (20 August 2005); doi: 10.1117/12.616690
Proc. SPIE 5869, Analysis of the ductile-brittle mode transition in loose abrasive grinding, 58690M (19 August 2005); doi: 10.1117/12.616952
Proc. SPIE 5869, Effect of humidity on optical fiber-adhesive bonding, 58690N (23 August 2005); doi: 10.1117/12.616470
Optical Testing I: Absolute Calibration and Algorithms
Proc. SPIE 5869, Construction and testing of wavefront reference sources for interferometry of ultra-precise imaging systems, 58690P (18 August 2005); doi: 10.1117/12.623185
Proc. SPIE 5869, Absolute accuracy evaluation of aspherical null testing for EUVL mirrors, 58690Q (18 August 2005); doi: 10.1117/12.616362
Proc. SPIE 5869, Calibration of symmetric and non-symmetric errors for interferometry of ultra-precise imaging systems, 58690R (18 August 2005); doi: 10.1117/12.623187
Proc. SPIE 5869, A simple ball averager for reference sphere calibrations, 58690S (20 August 2005); doi: 10.1117/12.614992
Proc. SPIE 5869, New methods for calibrating systematic errors in interferometric measurements, 58690T (31 August 2005); doi: 10.1117/12.617699
Proc. SPIE 5869, An overview of power spectral density (PSD) calculations, 58690U (18 August 2005); doi: 10.1117/12.618478
Optical Testing II: Error Analysis and Instrumentation
Proc. SPIE 5869, Retrace error evaluation on a figure-measuring interferometer, 58690V (19 August 2005); doi: 10.1117/12.617549
Proc. SPIE 5869, Precision metrology of dihedral angle error in prisms and corner cubes for the Space Interferometry Mission, 58690W (19 August 2005); doi: 10.1117/12.613591
Proc. SPIE 5869, Effects of birefringence on Fizeau interferometry that uses polarization technique, 58690X (18 August 2005); doi: 10.1117/12.615521
Proc. SPIE 5869, Sub-pixel spatial resolution interferometry with interlaced stitching, 58690Z (19 August 2005); doi: 10.1117/12.613446
Optical Testing III: Test Setups and Shack-Hartmann
Proc. SPIE 5869, Sub-aperture interferometric testing of a large-scale elliptical mirror under thermal-vacuum conditions, 586910 (19 August 2005); doi: 10.1117/12.614934
Proc. SPIE 5869, Testing an off-axis parabola with a CGH and a spherical mirror as null lens, 586911 (19 August 2005); doi: 10.1117/12.615465
Proc. SPIE 5869, Alignment and testing of piston and aberrations of a segmented mirror, 586912 (20 August 2005); doi: 10.1117/12.613657
Proc. SPIE 5869, Development of Cassegrain type 0.9-m collimator, 586913 (19 August 2005); doi: 10.1117/12.616174
Proc. SPIE 5869, Reverse optimization of a Shack-Hartmann wavefront sensor, 586915 (19 August 2005); doi: 10.1117/12.618190
Proc. SPIE 5869, Real-time measurement of the small aspheric surface, 586916 (19 August 2005); doi: 10.1117/12.616460
Proc. SPIE 5869, Differential wavefront curvature sensor, 586917 (18 August 2005); doi: 10.1117/12.630913
Optical Testing IV: Profilers and Coarse Metrology
Proc. SPIE 5869, Design of a machine for the universal non-contact measurement of large free-form optics with 30 nm uncertainty, 586919 (20 August 2005); doi: 10.1117/12.613919
Proc. SPIE 5869, Measurement of a 2-meter flat using a pentaprism scanning system, 58691A (23 August 2005); doi: 10.1117/12.618468
Proc. SPIE 5869, Dynamic phase-shifting electronic speckle pattern interferometer, 58691B (19 August 2005); doi: 10.1117/12.620619
Proc. SPIE 5869, Surface shape measurements using digital holography with a fringe projection system and partially coherent illumination, 58691C (20 August 2005); doi: 10.1117/12.616552
Proc. SPIE 5869, Reflection grating photogrammetry: a technique for absolute shape measurement of specular free-form surfaces, 58691D (19 August 2005); doi: 10.1117/12.617325
Proc. SPIE 5869, Testing big roughness surfaces by using shadow moiré, 58691E (20 August 2005); doi: 10.1117/12.618067
Fiber and Nano-Fabrication Posters
Proc. SPIE 5869, A new hot-jointing technique for the preform fabrication of tellurite based single mode optical fibers, 58691F (18 August 2005); doi: 10.1117/12.612730
Proc. SPIE 5869, Development of laser scissors for carbon and silicon carbide fiber cutting, 58691G (22 August 2005); doi: 10.1117/12.618118
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