PROCEEDINGS VOLUME 5879
OPTICS AND PHOTONICS 2005 | 31 JULY - 4 AUGUST 2005
Recent Developments in Traceable Dimensional Measurements III
OPTICS AND PHOTONICS 2005
31 July - 4 August 2005
San Diego, California, United States
Absolute Length, Temperature, and Thermal Expansion I
Proc. SPIE 5879, Accurate extraction of thermal expansion coefficients and their uncertainties from high precision interferometric length measurements, 587901 (24 August 2005); doi: 10.1117/12.616923
Proc. SPIE 5879, Nanometrology and high-precision temperature measurements under varying in time temperature conditions, 587902 (18 August 2005); doi: 10.1117/12.616630
Proc. SPIE 5879, Uncertainty evaluation of a fiber-based interferometer for the measurement of absolute dimensions, 587903 (18 August 2005); doi: 10.1117/12.617022
Proc. SPIE 5879, Precise certification of the temperature measuring system of the original Koesters interferometer and ways of its improvement, 587904 (18 August 2005); doi: 10.1117/12.616662
Proc. SPIE 5879, Automatic measurement of gauge blocks by Fourier transforming the scanned interferograms, 587905 (18 August 2005); doi: 10.1117/12.616858
Absolute Length, Temperature, and Thermal Expansion II
Proc. SPIE 5879, The effect of phase change on reflection on optical measurements, 587906 (18 August 2005); doi: 10.1117/12.614515
Proc. SPIE 5879, On the influence of gauge block roughness characteristic and surface treatment on length calibration by optical interferometry, 587907 (18 August 2005); doi: 10.1117/12.614402
Proc. SPIE 5879, Characterising the performance of the PTB line scale interferometer by measuring photoelectric incremental encoders, 587908 (18 August 2005); doi: 10.1117/12.616332
Proc. SPIE 5879, Systematic bias compensation for a moire fringe projection system, 587909 (18 August 2005); doi: 10.1117/12.614564
Radius of Curvature and Angle
Proc. SPIE 5879, Gaussian beam modeling of the radius of curvature, 58790A (18 August 2005); doi: 10.1117/12.617539
Proc. SPIE 5879, Radius case study: optical bench measurement and uncertainty including stage error motions, 58790B (18 August 2005); doi: 10.1117/12.614988
Proc. SPIE 5879, Low-cost precision rotary index calibration, 58790C (18 August 2005); doi: 10.1117/12.614783
Proc. SPIE 5879, Bootstrap calibration of an autocollimator, index table and sine bar ensemble for angle metrology, 58790D (18 August 2005); doi: 10.1117/12.618611
Surface Texture and Form
Proc. SPIE 5879, A primary roundness measuring machine, 58790E (18 August 2005); doi: 10.1117/12.618219
Proc. SPIE 5879, Dynamic range enhancing technique for form, waviness and roughness measurements using fringe projection, 58790F (18 August 2005); doi: 10.1117/12.614547
Proc. SPIE 5879, Size effects on stylus tip reconstruction for micro and nano roughness measurement, 58790H (18 August 2005); doi: 10.1117/12.616831
Proc. SPIE 5879, Accurate roughness measurements by laser interferometer calibration, VFM-uncertainty calculations and noise reduction, 58790I (18 August 2005); doi: 10.1117/12.614858
Proc. SPIE 5879, Use of monochromatic phase data for improved profile measurement in spectrally resolved white light interferometry, 58790J (25 August 2005); doi: 10.1117/12.614271
Distance Interferometry
Proc. SPIE 5879, Multi-purpose extrinsic Fabry-Perot sensor with miniature dual fiber configuration, 58790K (18 August 2005); doi: 10.1117/12.617991
Proc. SPIE 5879, Absolute distance metrology with frequency sweeping interferometry, 58790L (18 August 2005); doi: 10.1117/12.613648
Proc. SPIE 5879, The detection of cyclic nonlinearities in a ZMI2000 heterodyne interferometer, 58790M (18 August 2005); doi: 10.1117/12.625469
Proc. SPIE 5879, Absolute distance metrology for space interferometers, 58790N (18 August 2005); doi: 10.1117/12.618731
Proc. SPIE 5879, Linear Canonical Transforms, and Speckle Based Metrology, 58790O (18 August 2005); doi: 10.1117/12.617465
Proc. SPIE 5879, Network compensation of optical metrology for satellite formation flying, 58790P (18 August 2005); doi: 10.1117/12.613652
Coordinate Metrology (CMM)
Proc. SPIE 5879, Performance assessment of involute gear measurement by CMM using a double-ball artifact, 58790Q (19 August 2005); doi: 10.1117/12.614851
Proc. SPIE 5879, A fiber probe for CMM measurements of small features, 58790R (18 August 2005); doi: 10.1117/12.614655
Proc. SPIE 5879, Ultra precision micro-CMM using a low force 3D touch probe, 58790S (24 August 2005); doi: 10.1117/12.618692
Proc. SPIE 5879, Design and calibration of an elastically guided CMM axis with nanometer repeatability, 58790T (18 August 2005); doi: 10.1117/12.614321
Proc. SPIE 5879, First domestic comparison of ball plate calibration in Japan, 58790U (18 August 2005); doi: 10.1117/12.613856
Analysis of International Comparison Results
Proc. SPIE 5879, Methods for evaluating the reference value in laboratory intercomparisons of dimensional measurements, 58790V (18 August 2005); doi: 10.1117/12.617952
Proc. SPIE 5879, A new approach to determining the key comparison reference value, 58790W (18 August 2005); doi: 10.1117/12.616251
Posters-Monday
Proc. SPIE 5879, Phase-shifting laser diode interferometry with equal phase steps using a Fabry-Perot cavity, 58790Y (18 August 2005); doi: 10.1117/12.613881
Proc. SPIE 5879, Calibration of two-dimensional nanometer gratings using optical diffractometer and metrological atomic force microscope, 58790Z (18 August 2005); doi: 10.1117/12.614786
Proc. SPIE 5879, A comparison study on the measurement of nanoparticles, 587910 (19 August 2005); doi: 10.1117/12.616440
Proc. SPIE 5879, A novel Michelson interferometer combined with an autocollimator for the simultaneous measurement of linear and angular displacement, 587911 (18 August 2005); doi: 10.1117/12.616497
Proc. SPIE 5879, Development of a two-dimensional nano-displacement measuring system utilizing a combined optical and x-ray interferometer, 587912 (18 August 2005); doi: 10.1117/12.619174
Proc. SPIE 5879, A new approach of surface roughness measurement using optical method and image processing, 587914 (18 August 2005); doi: 10.1117/12.620277
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