PROCEEDINGS VOLUME 5921
OPTICS AND PHOTONICS 2005 | 31 JULY - 4 AUGUST 2005
Advances in Metrology for X-Ray and EUV Optics
OPTICS AND PHOTONICS 2005
31 July - 4 August 2005
San Diego, California, United States
LTP: New Developments and Applications
Proc. SPIE 5921, Advanced metrology: an essential support for the surface finishing of high performance x-ray optics, 592101 (17 September 2005); doi: 10.1117/12.622747
LTP: New Developments and Applications II
Proc. SPIE 5921, Latest metrology results with the SOLEIL synchrotron LTP, 592102 (15 September 2005); doi: 10.1117/12.621073
Proc. SPIE 5921, Multiple functions long trace profiler (LTP-MF) for National Synchrotron Radiation Laboratory of China, 592104 (15 September 2005); doi: 10.1117/12.618800
Proc. SPIE 5921, Cylinder lens alignment in the LTP, 592105 (15 September 2005); doi: 10.1117/12.621202
Metrology for Low-Spatial Frequencies
Proc. SPIE 5921, Scanning form measurement for curved surfaces, 592106 (15 September 2005); doi: 10.1117/12.614790
Proc. SPIE 5921, A new designed ultra-high precision profiler, 592107 (15 September 2005); doi: 10.1117/12.617986
Proc. SPIE 5921, Metrology for the development of high-energy x-ray optics, 592108 (15 September 2005); doi: 10.1117/12.621170
Proc. SPIE 5921, X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing, 592109 (17 September 2005); doi: 10.1117/12.622799
Interferometry and Mid- and High-Spatial Frequencies
Proc. SPIE 5921, High performance Fizeau and scanning white-light interferometers for mid-spatial frequency optical testing of free-form optics, 59210A (1 September 2005); doi: 10.1117/12.616874
Measurement Comparisons and PSD Considerations
Proc. SPIE 5921, Comparisons between EUV at-wavelength metrological methods, 59210D (17 September 2005); doi: 10.1117/12.616676
Proc. SPIE 5921, On the choice of a metrological instrument for synchrotron radiation optics, 59210E (17 September 2005); doi: 10.1117/12.618270
Proc. SPIE 5921, New optical setup for the generation of variable spot size on third generation synchrotron beamlines, 59210F (17 September 2005); doi: 10.1117/12.622942
Proc. SPIE 5921, Cross-check of different techniques for two-dimensional power spectral density measurements of x-ray optics, 59210G (17 September 2005); doi: 10.1117/12.619892
Metrology Round Robin
Proc. SPIE 5921, First report on a European round robin for slope measuring profilers, 59210I (17 September 2005); doi: 10.1117/12.621087
Proc. SPIE 5921, Results of x-ray mirror round-robin metrology measurements at the APS, ESRF, and SPring-8 optical metrology laboratories, 59210J (17 September 2005); doi: 10.1117/12.623209
Posters - Wednesday
Proc. SPIE 5921, Real-time stability and profile comparison measurements between two different LTPs, 59210K (17 September 2005); doi: 10.1117/12.618791
Proc. SPIE 5921, A second optic head for the ELETTRA long trace profiler, 59210L (17 September 2005); doi: 10.1117/12.618322
Proc. SPIE 5921, Surface figuring and measurement methods with spatial resolution close to 0.1 mm for x-ray mirror fabrication, 59210M (17 September 2005); doi: 10.1117/12.623103
Proc. SPIE 5921, Mirror metrology and bender characterization at ESRF, 59210N (17 September 2005); doi: 10.1117/12.621379
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