PROCEEDINGS VOLUME 5965
OPTICAL SYSTEMS DESIGN 2005 | 12-16 SEPTEMBER 2005
Optical Fabrication, Testing, and Metrology II
Proceedings Volume 5965 is from: Logo
OPTICAL SYSTEMS DESIGN 2005
12-16 September 2005
Jena, Germany
Micro-optics
Proc. SPIE 5965, Micro-optics: manufacturing and characterization, 596501 (14 October 2005); doi: 10.1117/12.624133
Proc. SPIE 5965, Replication and surface enhancement of microstructured optical components, 596502 (20 October 2005); doi: 10.1117/12.625172
Proc. SPIE 5965, Design and fabrication of refractive and diffractive micro optical elements used in holographic recording setups, 596503 (20 October 2005); doi: 10.1117/12.625195
Proc. SPIE 5965, Novel fabrication technique of continuous profiles for microoptics and integrated optics, 596504 (20 October 2005); doi: 10.1117/12.625111
Proc. SPIE 5965, Near-field holography with a two-dimensional phase mask for fabrication of two-dimensional structures in a single exposure step, 596505 (20 October 2005); doi: 10.1117/12.625105
Nano and Micrometrology I
Proc. SPIE 5965, Characterization of resonance domain diffractive optical elements, 596506 (20 October 2005); doi: 10.1117/12.625994
Proc. SPIE 5965, A multi sensor metrology tool for nanometer to meter measurements, 596507 (20 October 2005); doi: 10.1117/12.625531
Proc. SPIE 5965, Critical dimension metrology using optical diffraction microscopy, 596508 (20 October 2005); doi: 10.1117/12.624769
Proc. SPIE 5965, Nanopositioning and nanomeasuring machine for high accuracy measuring procedures of small features in large areas, 596509 (20 October 2005); doi: 10.1117/12.624791
Proc. SPIE 5965, Scanning force microscopy for optical surface metrology, 59650A (20 October 2005); doi: 10.1117/12.624341
Nano and Micrometrology II
Proc. SPIE 5965, Subaperture metrology technologies extend capabilities in optics manufacturing, 59650B (25 October 2005); doi: 10.1117/12.625808
Proc. SPIE 5965, Standardization in dimensional nanometrology: development of a calibration guideline for Scanning Probe Microscopy, 59650C (20 October 2005); doi: 10.1117/12.626018
Proc. SPIE 5965, Modern topics in standardized laser-induced damage threshold measurements, 59650D (20 October 2005); doi: 10.1117/12.629055
Proc. SPIE 5965, Digital signal processing in AFM topography and recognition imaging, 59650E (20 October 2005); doi: 10.1117/12.626808
Proc. SPIE 5965, Transmission measurements for the optical characterization of 2D-photonic crystals, 59650F (20 October 2005); doi: 10.1117/12.625661
Proc. SPIE 5965, Classification of optical surface properties and material recognition using mutlispectral BRDF data measured with a semihemispherical spectro-radiometer in VIS and NIR, 59650G (20 October 2005); doi: 10.1117/12.624838
Manufacturing and Testing
Proc. SPIE 5965, Manufacturing and testing of precision optical components - from substrate to coating and assembling, 59650H (20 October 2005); doi: 10.1117/12.625539
Proc. SPIE 5965, ASPHERO5 - rapid fabrication of precise aspheres, 59650I (20 October 2005); doi: 10.1117/12.623327
Proc. SPIE 5965, Optical design, manufacturing, and tests of the MUSE image slicer, 59650J (20 October 2005); doi: 10.1117/12.624836
Proc. SPIE 5965, Design considerations for computer generated holograms as supplement to Fizeau interferometers, 59650K (20 October 2005); doi: 10.1117/12.625056
Proc. SPIE 5965, Recent advances in subaperture finishing, 59650L (25 October 2005); doi: 10.1117/12.625807
Proc. SPIE 5965, Synthesis of diamond diffractive optical elements for IR laser beam focusing, 59650M (20 October 2005); doi: 10.1117/12.623753
Large and Complex Surfaces I
Proc. SPIE 5965, Megajoule laser project and polishing processes for high laser induced damage threshold at 351 nm, 59650N (20 October 2005); doi: 10.1117/12.633499
Proc. SPIE 5965, From VLT to GTC and the ELTs, 59650P (22 October 2005); doi: 10.1117/12.627677
Proc. SPIE 5965, Big OptiX ultra precision grinding/measuring system, 59650Q (20 October 2005); doi: 10.1117/12.624166
Large and Complex Surfaces II
Proc. SPIE 5965, Recent advances in the control of form and texture on free-form surfaces, 59650S (20 October 2005); doi: 10.1117/12.625796
Proc. SPIE 5965, Machining and Measuring of an Off-axis Paraboloid, 59650T (20 October 2005); doi: 10.1117/12.625114
Proc. SPIE 5965, Stitching oil-on interferometry of large fused silica blanks, 59650V (20 October 2005); doi: 10.1117/12.626115
Proc. SPIE 5965, Dynamic holography for the space qualification of large reflectors, 59650W (20 October 2005); doi: 10.1117/12.624788
Interferometry and Wavefront Measurement I
Proc. SPIE 5965, Wavefront measurement of space infrared telescopes at cryogenic temperature, 59650X (20 October 2005); doi: 10.1117/12.624798
Proc. SPIE 5965, Measuring wavefront tilt using shearing interferometry, 59650Y (20 October 2005); doi: 10.1117/12.625247
Proc. SPIE 5965, Limitations of iterative least squares methods in phase shifting interferometry in presence of vibrations, 59650Z (20 October 2005); doi: 10.1117/12.627764
Proc. SPIE 5965, Contact-free on-axis metrology for the fabrication and testing of complex optical systems, 596510 (20 October 2005); doi: 10.1117/12.625200
Proc. SPIE 5965, Visible and infrared wave-front metrology by Quadri-Wave Lateral Shearing Interferometry, 596512 (21 October 2005); doi: 10.1117/12.626248
Interferometry and Wavefront Measurement II
Proc. SPIE 5965, Wavefront sensing with varying transmission filters: past, present, and future, 596513 (20 October 2005); doi: 10.1117/12.624780
Proc. SPIE 5965, Interferometric asphere testing in a spherical test setup, 596514 (20 October 2005); doi: 10.1117/12.623529
Proc. SPIE 5965, Characterization of complex optical systems based on wavefront retrieval from point spread function, 596515 (20 October 2005); doi: 10.1117/12.625295
Proc. SPIE 5965, Traceable measurements with wavefront sensors, 596516 (20 October 2005); doi: 10.1117/12.625214
Proc. SPIE 5965, Colorimetric method for phase evaluation in optical testing, 596517 (20 October 2005); doi: 10.1117/12.625189
Scatter and Surface Roughness
Proc. SPIE 5965, Dos and don'ts in characterizing and cleaning optical surfaces, 596518 (20 October 2005); doi: 10.1117/12.625044
Proc. SPIE 5965, Design of a full-hemispherical spectro-radiometer with high dynamic range for characterization of surface properties using multispectral BRDF data from VIS to NIR, 596519 (20 October 2005); doi: 10.1117/12.624832
Proc. SPIE 5965, Angle resolved scatter measurements on optical components, 59651A (20 October 2005); doi: 10.1117/12.625398
Proc. SPIE 5965, Sensitive and flexible light scatter techniques from the VUV to IR regions, 59651B (20 October 2005); doi: 10.1117/12.625780
Proc. SPIE 5965, Ellipsometry of scattering patterns from optical inhomogeneities, 59651C (20 October 2005); doi: 10.1117/12.625201
Material Properties
Proc. SPIE 5965, Implementing a prototyping network for injection moulded imaging lenses in Finland, 59651E (20 October 2005); doi: 10.1117/12.625118
Proc. SPIE 5965, Low CTE glass, SiC & Beryllium for lightweight mirror substrates, 59651F (20 October 2005); doi: 10.1117/12.627667
Proc. SPIE 5965, Angular dependent specular reflectance in UV/Vis/NIR, 59651G (20 October 2005); doi: 10.1117/12.626850
DUV Components
Proc. SPIE 5965, DUV-microscope objectives: technology driver that forces the production to switch from the micrometer scale to the nanometer scale, 59651H (20 October 2005); doi: 10.1117/12.625009
Proc. SPIE 5965, A novel instrument for measurement of low-level scattering from optical components in the UV region, 59651I (20 October 2005); doi: 10.1117/12.625139
Proc. SPIE 5965, Application of the laser-induced deflection (LID) technique for low absorption measurements in bulk materials and coatings, 59651J (20 October 2005); doi: 10.1117/12.625083
Proc. SPIE 5965, Nondestructive optical characterization of KH2PO4 crystals heterogeneities and adapted excimer laser conditioning process, 59651K (20 October 2005); doi: 10.1117/12.625084
Proc. SPIE 5965, VUV spectrophotometry for photomasks characterization at 193 nm, 59651L (20 October 2005); doi: 10.1117/12.625144
Poster Session
Proc. SPIE 5965, Self-organized antireflective nanostructures on PMMA by ion etching, 59651N (20 October 2005); doi: 10.1117/12.623547
Proc. SPIE 5965, Optical properties of stochastic subwavelength surface structures, 59651O (20 October 2005); doi: 10.1117/12.624363
Proc. SPIE 5965, Theoretical and experimental investigation of optical fiber coatings removal by laser irradiation, 59651Q (20 October 2005); doi: 10.1117/12.624750
Proc. SPIE 5965, Off axis microspectrophotometer for optical coating characterization on complex surfaces, 59651S (20 October 2005); doi: 10.1117/12.625126
Proc. SPIE 5965, Azimuthal ellipsometry of subsurface layer stresses of specular metallic ribbons, 59651T (20 October 2005); doi: 10.1117/12.625137