PROCEEDINGS VOLUME 6000
OPTICS EAST 2005 | 23-26 OCTOBER 2005
Two- and Three-Dimensional Methods for Inspection and Metrology III
IN THIS VOLUME

0 Sessions, 28 Papers, 0 Presentations
OPTICS EAST 2005
23-26 October 2005
Boston, MA, United States
3D Methods Workshop
Proc. SPIE 6000, Latest optical methods for industrial dimensional metrology, 600001 (2 November 2005); doi: 10.1117/12.631764
Proc. SPIE 6000, 3-D optical measurement using phase shifting based methods, 600002 (8 November 2005); doi: 10.1117/12.631766
2D Inspection Methods
Proc. SPIE 6000, Vision systems on the internet, 600003 (7 November 2005); doi: 10.1117/12.631704
Proc. SPIE 6000, Fast grey-level co-occurrence matrix calculations for texture analysis, 600004 (7 November 2005); doi: 10.1117/12.634764
Proc. SPIE 6000, Fast software implementations of common 3x3 operators, 600005 (7 November 2005); doi: 10.1117/12.634979
Proc. SPIE 6000, Online inspection of thermo-chemical heat treatment processes with CCD camera system, 600006 (7 November 2005); doi: 10.1117/12.630449
Proc. SPIE 6000, Online temperature measurement and flow analysis of hot dross in a steel plant, 600007 (7 November 2005); doi: 10.1117/12.630619
Proc. SPIE 6000, Hausdorff distance based PCB inspection system with defect classification, 600008 (7 November 2005); doi: 10.1117/12.639586
3D Methods and Techniques I
Proc. SPIE 6000, Performance evaluation of different depth from defocus (DFD) techniques, 600009 (7 November 2005); doi: 10.1117/12.629611
Proc. SPIE 6000, Camera calibration and performance evaluation of depth from defocus (DFD), 60000A (7 November 2005); doi: 10.1117/12.631194
Proc. SPIE 6000, 3D method via time and spatially multiplexed confocal microscope, 60000B (7 November 2005); doi: 10.1117/12.629954
Proc. SPIE 6000, 3D measurements using a programmable projector and a grating, 60000C (7 November 2005); doi: 10.1117/12.630083
Proc. SPIE 6000, Shiny parts measurement using color separation, 60000D (7 November 2005); doi: 10.1117/12.629942
Proc. SPIE 6000, Phase error compensation for a 3D shape measurement system based on the phase-shifting method, 60000E (7 November 2005); doi: 10.1117/12.631256
3D Methods and Techniques II
Proc. SPIE 6000, A fast three-step phase shifting algorithm, 60000F (7 November 2005); doi: 10.1117/12.631259
Proc. SPIE 6000, A contrast between DLP and LCD digital projection technology for triangulation-based phase measuring optical profilometers, 60000G (7 November 2005); doi: 10.1117/12.632582
Proc. SPIE 6000, Liquid crystal grating for profilmetry using structured light, 60000H (7 November 2005); doi: 10.1117/12.631482
Proc. SPIE 6000, Surface profile measurement by grating projection method with dual-projection optics, 60000I (7 November 2005); doi: 10.1117/12.630206
Proc. SPIE 6000, Three-dimensional shape measurement using focus method by liquid crystal grating and liquid varifocus lens, 60000J (7 November 2005); doi: 10.1117/12.633147
Metrology and NDT Applications
Proc. SPIE 6000, Sub-pixel accuracy thickness calculation of poultry fillets from scattered laser profiles, 60000K (7 November 2005); doi: 10.1117/12.631028
Proc. SPIE 6000, A handheld profile measurement system for high accurate wear measurement of railway wheels, 60000L (7 November 2005); doi: 10.1117/12.630652
Proc. SPIE 6000, Identifying unknown nanocrystals by fringe fingerprinting in two dimensions and free-access crystallographic databases, 60000M (7 November 2005); doi: 10.1117/12.629818
Poster Session
Proc. SPIE 6000, MEMS measurement by optical holography method, 60000O (7 November 2005); doi: 10.1117/12.629730
Proc. SPIE 6000, Full field displacement measurement and data processing of 3D components of mechatronic systems, 60000P (7 November 2005); doi: 10.1117/12.629746
Proc. SPIE 6000, Nanometrology device standards for scanning probe microscopes and processes for their fabrication and usage, 60000Q (7 November 2005); doi: 10.1117/12.629785
Proc. SPIE 6000, 3D surface reconstruction of apples from 2D NIR images, 60000R (7 November 2005); doi: 10.1117/12.630030
Proc. SPIE 6000, Stereovision-based 3D field recognition for automatic guidance system of off-road vehicle, 60000S (7 November 2005); doi: 10.1117/12.630650
Proc. SPIE 6000, Characterization and integrity testing of flexible film materials utilizing a unique corona beam technology, 60000T (9 November 2005); doi: 10.1117/12.635004
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