PROCEEDINGS VOLUME 6024
ICO20:OPTICAL DEVICES AND INSTRUMENTS | 21-26 AUGUST 2005
ICO20: Optical Devices and Instruments
IN THIS VOLUME

0 Sessions, 95 Papers, 0 Presentations
ICO20:OPTICAL DEVICES AND INSTRUMENTS
21-26 August 2005
Changchun, China
Optical Devices and Instruments
Proc. SPIE 6024, Advances in interferometric surface measurement, 602401 (9 December 2005); doi: 10.1117/12.666802
Proc. SPIE 6024, Manufacturing and testing SiC aspherical mirrors in space telescopes, 602402 (9 December 2005); doi: 10.1117/12.666803
Proc. SPIE 6024, Design and calibration of large dynamic range optical metrology systems, 602403 (9 December 2005); doi: 10.1117/12.666804
Proc. SPIE 6024, Optical design of the multi-spectral camera (MSC) for high-resolution Earth observation, 602404 (9 December 2005); doi: 10.1117/12.666805
Proc. SPIE 6024, Optics in Latin America: an update until 2004, 602405 (9 December 2005); doi: 10.1117/12.666806
Proc. SPIE 6024, Proposal of a compact repetitive dichromatic X-ray generator with millisecond duty cycle for medical applications, 602406 (9 December 2005); doi: 10.1117/12.666807
Proc. SPIE 6024, Generation of aberration polynomials in a Fourier optical processor using a liquid crystal display, 602407 (9 December 2005); doi: 10.1117/12.666809
Proc. SPIE 6024, Laser monitoring of the air pollution by aerosols, 602408 (9 December 2005); doi: 10.1117/12.666810
Proc. SPIE 6024, Sinusoidal wavelength-scanning interferometer for measurement of thickness and surface profile of thin films, 602409 (9 December 2005); doi: 10.1117/12.666811
Proc. SPIE 6024, Sensitive measurement of water content in dry material based on low-frequency terahertz time-domain spectroscopy, 60240A (9 December 2005); doi: 10.1117/12.666812
Proc. SPIE 6024, Construction of a Fourier-transform phase-modulation fluorometer, 60240B (9 December 2005); doi: 10.1117/12.666813
Proc. SPIE 6024, Wavelength measurement by polarization method, 60240C (9 December 2005); doi: 10.1117/12.666816
Proc. SPIE 6024, A method of measurement of polarized light ellipticity only, 60240D (9 December 2005); doi: 10.1117/12.666817
Proc. SPIE 6024, Moiré deflectometer for measuring distortion in sheet glasses, 60240E (9 December 2005); doi: 10.1117/12.666818
Proc. SPIE 6024, Displacement measurement with a dual-colored sinusoidal phase-modulating interferometer, 60240F (9 December 2005); doi: 10.1117/12.666819
Proc. SPIE 6024, Double frequency of difference frequency signals for optical Doppler effect measuring velocity, 60240G (9 December 2005); doi: 10.1117/12.666820
Proc. SPIE 6024, Contactless laser viscometer for flowing liquid films, 60240H (9 December 2005); doi: 10.1117/12.666823
Proc. SPIE 6024, Beam correction optics for laser diodes, 60240I (9 December 2005); doi: 10.1117/12.666824
Proc. SPIE 6024, Fiber-optic vibration sensor based on wavefront-splitting interferometry, 60240J (9 December 2005); doi: 10.1117/12.666825
Proc. SPIE 6024, Application of HATR-FTIR spectroscopy to the analysis of nifedipine tablets, 60240K (9 December 2005); doi: 10.1117/12.666826
Proc. SPIE 6024, Design and validation of portable optical instrument for crop diagnose, 60240L (9 December 2005); doi: 10.1117/12.666827
Proc. SPIE 6024, Study of micro-displacement measuring system with double F-P interference cavities, 60240M (9 December 2005); doi: 10.1117/12.666828
Proc. SPIE 6024, Vibration insensitive interferometer using sinusoidal phase-modulation and feedback control, 60240N (9 December 2005); doi: 10.1117/12.666829
Proc. SPIE 6024, Measurement of optical thickness variation of a multiple-surface object by a wavelength tuning interferometer, 60240O (9 December 2005); doi: 10.1117/12.666830
Proc. SPIE 6024, Generalized theory of dynamical surfaces: experimental verification by speckle correlation, 60240P (9 December 2005); doi: 10.1117/12.666831
Proc. SPIE 6024, Measurement of diameter of metal cylinders using a sinusoidally vibrating interference pattern, 60240Q (9 December 2005); doi: 10.1117/12.666832
Proc. SPIE 6024, Development of television camera for detecting oil film floating on the ocean, 60240R (9 December 2005); doi: 10.1117/12.666833
Proc. SPIE 6024, A new type of Shack-Hartmann wavefront sensor using liquid crystal display, 60240S (9 December 2005); doi: 10.1117/12.666834
Proc. SPIE 6024, Study on integrated vehicle navigation system of Beidou Double-star/DR, 60240T (9 December 2005); doi: 10.1117/12.666835
Proc. SPIE 6024, An optical measuring method of high temperature clinker layer's thickness, 60240U (9 December 2005); doi: 10.1117/12.666836
Proc. SPIE 6024, Liquid analysis based on fiber micro-drop sensors, 60240V (9 December 2005); doi: 10.1117/12.666837
Proc. SPIE 6024, Analysis of various correction factors for MTF measurement with a square object, 60240W (9 December 2005); doi: 10.1117/12.666838
Proc. SPIE 6024, A study of high voltage current based on fiber Bragg grating, 60240X (9 December 2005); doi: 10.1117/12.666839
Proc. SPIE 6024, The research of basing on simulative compensator and two-wavelength phase shifting interferometry for testing large departure aspheric surface, 60240Y (9 December 2005); doi: 10.1117/12.666840
Proc. SPIE 6024, The analysis of optical-electro collimated light tube measurement system, 60240Z (9 December 2005); doi: 10.1117/12.666841
Proc. SPIE 6024, A measurement study of refractive-index profile of an optical fiber, 602410 (9 December 2005); doi: 10.1117/12.666842
Proc. SPIE 6024, Study of the frequency spectrum characteristics of ultra-fast photoconductive semiconductor switches, 602411 (9 December 2005); doi: 10.1117/12.666843
Proc. SPIE 6024, On-line calibration of phase-shifter in phase-shifting interferometer, 602412 (9 December 2005); doi: 10.1117/12.666845
Proc. SPIE 6024, Measurement of the birefringence distribution in high resolution laser scanning lenses, 602413 (9 December 2005); doi: 10.1117/12.666846
Proc. SPIE 6024, Iris image acquirement and preprocessing in biometrics, 602414 (9 December 2005); doi: 10.1117/12.666847
Proc. SPIE 6024, A nondestructive technique of analyzing chalcogenide phase-change thin films by spectroscopic-ellipsometry, 602415 (9 December 2005); doi: 10.1117/12.666848
Proc. SPIE 6024, Determining thin film thickness characterization using adaptive simulated annealing algorithm, 602416 (9 December 2005); doi: 10.1117/12.666850
Proc. SPIE 6024, Development of an optical instrument to determine the pesticide residues in vegetables, 602417 (9 December 2005); doi: 10.1117/12.666851
Proc. SPIE 6024, Measurement of drill grinding parameters using laser sensor, 602418 (9 December 2005); doi: 10.1117/12.666852
Proc. SPIE 6024, Detection system for film, 602419 (9 December 2005); doi: 10.1117/12.666854
Proc. SPIE 6024, A new three dimension PLMR imaging system, 60241A (9 December 2005); doi: 10.1117/12.666855
Proc. SPIE 6024, A novel method for measuring the thickness of optical wave plate, 60241B (9 December 2005); doi: 10.1117/12.666856
Proc. SPIE 6024, The application of fiber-coupling zig-zag beam deflection method on the investigation of plasma shock waves, 60241C (9 December 2005); doi: 10.1117/12.666857
Proc. SPIE 6024, Optoelectronic non-contact measuring method for the taper of a bore, 60241D (9 December 2005); doi: 10.1117/12.666858
Proc. SPIE 6024, An efficient iterative algorithm for subaperture stitching interferometry for aspheric surface, 60241E (9 December 2005); doi: 10.1117/12.666859
Proc. SPIE 6024, A novel method of measuring convex aspheric lens using hologram optical elements, 60241F (9 December 2005); doi: 10.1117/12.666860
Proc. SPIE 6024, The replacement of dry heat in generic reliability assurance requirements for passive optical components, 60241G (9 December 2005); doi: 10.1117/12.666861
Proc. SPIE 6024, Two structure interleavers with flat-top spectral response, 60241H (9 December 2005); doi: 10.1117/12.666862
Proc. SPIE 6024, Development and application of a novel crop stress and quality instrument, 60241I (9 December 2005); doi: 10.1117/12.666863
Proc. SPIE 6024, Nanometer measurement of the planar motion of a magnetic levitation stage based on optical heterodyne interferometry, 60241J (9 December 2005); doi: 10.1117/12.666864
Proc. SPIE 6024, Theoretical analysis of sensing character of long period fiber grating coated with gas-sensitive film, 60241K (9 December 2005); doi: 10.1117/12.666865
Proc. SPIE 6024, Research on dynamic dimensional classifying apparatus with double light paths of laser, 60241L (9 December 2005); doi: 10.1117/12.666866
Proc. SPIE 6024, Developing of in-suit long trance profiler for testing slope error of aspherical optical elements, 60241M (9 December 2005); doi: 10.1117/12.666867