PROCEEDINGS VOLUME 6049
OPTOMECHATRONIC TECHNOLOGIES 2005 | 5-7 DECEMBER 2005
Optomechatronic Sensors and Instrumentation
OPTOMECHATRONIC TECHNOLOGIES 2005
5-7 December 2005
Sapporo, Japan
Micro-Mechanical Sensing
Proc. SPIE 6049, A robust optical disc discrimination method which tolerates pick-up head and laser power source deviations, 604901 (6 December 2005); doi: 10.1117/12.644004
Proc. SPIE 6049, Joint torque and angle estimation by using ultrasonic muscle activity sensor, 604902 (6 December 2005); doi: 10.1117/12.649202
Proc. SPIE 6049, Profile measurement of resist surface using multi-ball-cantilever AFM, 604903 (6 December 2005); doi: 10.1117/12.647962
Proc. SPIE 6049, Unification of input and output ends in polarization-maintaining optical fiber stress sensor by synthesis of optical coherence function, 604904 (6 December 2005); doi: 10.1117/12.655527
Micro-Sensing and Imaging
Proc. SPIE 6049, Development of microscopic surface profile estimation algorithm through reflected laser beam analysis, 604905 (6 December 2005); doi: 10.1117/12.642018
Proc. SPIE 6049, Design of real-time confocal microscopy using spectral encoding technique and slit aperture, 604906 (6 December 2005); doi: 10.1117/12.647953
Micro-Sensing Method
Proc. SPIE 6049, Feasibility of guided-wave optical microphone based on elasto-optic effect, 604907 (6 December 2005); doi: 10.1117/12.649176
Proc. SPIE 6049, Multipath interference test method for distributed amplifiers, 604908 (6 December 2005); doi: 10.1117/12.649736
Nano-Bio Technologies: Nano-Bio Sensing
Proc. SPIE 6049, Particle detection for patterned wafers of 100nm design rule by evanescent light illumination: analysis of evanescent light scattering using finite-difference time-domain (FDTD) method, 604909 (6 December 2005); doi: 10.1117/12.647933
Proc. SPIE 6049, Variable phase-contrast spectrometry for reconstructing the 3-dimensional distribution of components in single living cells, 60490A (6 December 2005); doi: 10.1117/12.648324
Proc. SPIE 6049, Dual-LED imaging system for secure fingerprint identification, 60490B (6 December 2005); doi: 10.1117/12.648588
Proc. SPIE 6049, Super-resolution optical inspection for semiconductor defects using standing wave shift, 60490C (6 December 2005); doi: 10.1117/12.648356
Shape and Displacement Measurement I
Proc. SPIE 6049, Effect of weight in averaging of phases on accuracy in windowed digital holographic interferometry for pico-meter displacement measurement, 60490D (6 December 2005); doi: 10.1117/12.648696
Proc. SPIE 6049, Shape measurement of solder bumps by shape-from-focus using varifocal mirror, 60490E (6 December 2005); doi: 10.1117/12.648791
Proc. SPIE 6049, Omnidirectional shape measurement using reliability evaluation value in Fourier transform, 60490F (6 December 2005); doi: 10.1117/12.648709
3D Measurement: Shape and Displacement Measurement II
Proc. SPIE 6049, Two-step triangular phase-shifting method for 3-D object-shape measurement, 60490G (6 December 2005); doi: 10.1117/12.649009
Proc. SPIE 6049, Simultaneous 3D position sensing by means of large scale spherical aberration of lens and Hough transform technique, 60490H (6 December 2005); doi: 10.1117/12.648656
Proc. SPIE 6049, Development of DMD reflection-type CCD camera for phase analysis and shape measurement, 60490I (6 December 2005); doi: 10.1117/12.647938
New Applications in Optical Sensing
Proc. SPIE 6049, 3D terrain measurement sensor system for rough terrain mobile robot, 60490J (6 December 2005); doi: 10.1117/12.648841
Proc. SPIE 6049, A novel sensor system for mobile robot using moiré technique, 60490K (6 December 2005); doi: 10.1117/12.650227
Proc. SPIE 6049, Auto-calibration system of EMG sensor suit, 60490L (6 December 2005); doi: 10.1117/12.648798
Poster Session
Proc. SPIE 6049, Analysis of microbend fiber-sensor characteristics using optics information theory, 60490N (6 December 2005); doi: 10.1117/12.640746
Proc. SPIE 6049, Infrared phase-shifting interferometry using the nitroanisole as a two-dimensional detector, 60490O (6 December 2005); doi: 10.1117/12.642732
Proc. SPIE 6049, Design of lightweight primary mirror and metering structure for spaceborne telescope, 60490P (6 December 2005); doi: 10.1117/12.648009
Proc. SPIE 6049, An integrated measurement system of the extinction ratio and half-wave voltage of crystal and the phase-retardation of a wave plate, 60490Q (6 December 2005); doi: 10.1117/12.648319
Proc. SPIE 6049, Development of a laser range finder using a phase difference method, 60490R (6 December 2005); doi: 10.1117/12.648820
Proc. SPIE 6049, 3D shape measurement system using a gap control between the optical laser displacement sensor and object surface, 60490S (6 December 2005); doi: 10.1117/12.648808
Proc. SPIE 6049, Motion capture for human motion measuring by using single camera with triangle markers, 60490U (6 December 2005); doi: 10.1117/12.649782
Proc. SPIE 6049, Evaluation of elastic modulus of cantilever beam by TA-ESPI, 60490V (6 December 2005); doi: 10.1117/12.642040
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