PROCEEDINGS VOLUME 6070
ELECTRONIC IMAGING 2006 | 15-19 JANUARY 2006
Machine Vision Applications in Industrial Inspection XIV
Proceedings Volume 6070 is from: Logo
ELECTRONIC IMAGING 2006
15-19 January 2006
San Jose, California, United States
Industrial Applications I
Proc. SPIE 6070, Optical servoing for industrial surface machining, 607001 (9 February 2006); doi: 10.1117/12.642718
Proc. SPIE 6070, Statistical learning with imbalanced training set in a machine vision application: improve the false alarm rate and sensitivity simultaneously, 607002 (9 February 2006); doi: 10.1117/12.643444
Proc. SPIE 6070, Boundary detection of projected fringes on surface with inhomogeneous reflectance function, 607003 (9 February 2006); doi: 10.1117/12.648604
Proc. SPIE 6070, Height inspection of wafer bumps without explicit 3D reconstruction, 607004 (9 February 2006); doi: 10.1117/12.649228
Multispectral Imaging
Proc. SPIE 6070, Fast recognition method for metallic topographies by the three-color selective stereo gradient method, 607005 (9 February 2006); doi: 10.1117/12.639854
Proc. SPIE 6070, Robustness of texture parameters for color texture analysis, 607006 (9 February 2006); doi: 10.1117/12.643021
Proc. SPIE 6070, Real-time multispectral imaging application for poultry safety inspection, 607007 (9 February 2006); doi: 10.1117/12.643113
Proc. SPIE 6070, Flushing analysis by machine vision and fuzzy logic at molten steel for the automation process, 607008 (9 February 2006); doi: 10.1117/12.648737
Proc. SPIE 6070, Color influence on accuracy of 3D scanners based on structured light, 607009 (9 February 2006); doi: 10.1117/12.643448
3D Applications I
Proc. SPIE 6070, Novel view synthesis for projective texture mapping on real 3D objects, 60700A (9 February 2006); doi: 10.1117/12.642618
Proc. SPIE 6070, 3D translucent object reconstruction from artificial vision, 60700B (9 February 2006); doi: 10.1117/12.641658
Proc. SPIE 6070, Real-time 3D wood panel surface measurement using laser triangulation and low-cost hardware, 60700C (9 February 2006); doi: 10.1117/12.644147
Industrial Applications II
Proc. SPIE 6070, Aerial platform attitude measurement by artificial vision, 60700D (2 February 2006); doi: 10.1117/12.642090
Proc. SPIE 6070, A new algorithm for real-time multi-stage image thresholding, 60700E (9 February 2006); doi: 10.1117/12.653860
Proc. SPIE 6070, Simultaneous photometric correction and defect detection in semiconductor manufacturing, 60700F (9 February 2006); doi: 10.1117/12.640138
Proc. SPIE 6070, Automatic mura detection system for liquid crystal display panels, 60700G (9 February 2006); doi: 10.1117/12.650686
Proc. SPIE 6070, New developments in image-based characterization of coated particle nuclear fuel, 60700H (9 February 2006); doi: 10.1117/12.647834
Proc. SPIE 6070, Automatic monitoring and measuring vehicles by using image analysis, 60700I (9 February 2006); doi: 10.1117/12.642830
Multiresolution and Mathematical Fitting
Proc. SPIE 6070, Real-time detection of elliptic shapes for automated object recognition and object tracking, 60700J (9 February 2006); doi: 10.1117/12.642167
Proc. SPIE 6070, Discrete circles measurement for industrial inspection, 60700K (9 February 2006); doi: 10.1117/12.642326
Proc. SPIE 6070, Twin and scratch detection and removal in micrograph images of Inconel 718, 60700L (9 February 2006); doi: 10.1117/12.642635
Proc. SPIE 6070, Tracking fluorescent spots in wide-field microscopy images, 60700M (9 February 2006); doi: 10.1117/12.643128
Proc. SPIE 6070, Development of methods based on double Hough transform or Gabor filtering to discriminate between crop and weed in agronomic images, 60700N (9 February 2006); doi: 10.1117/12.642908
Proc. SPIE 6070, An active contour algorithm for detecting the circular features in a PCB x-ray image, 60700O (9 February 2006); doi: 10.1117/12.643029
Proc. SPIE 6070, Human vision based detection of non-uniform brightness on LCD panels, 60700P (9 February 2006); doi: 10.1117/12.650500
Proc. SPIE 6070, Optimized texture classification by using hierarchical complex network measurements, 60700Q (9 February 2006); doi: 10.1117/12.655592
3D Applications II
Proc. SPIE 6070, A refined range image registration technique for multi-stripe laser scanner, 60700R (9 February 2006); doi: 10.1117/12.642594
Proc. SPIE 6070, Surface orientation recovery of specular micro-surface via binary pattern projection, 60700S (9 February 2006); doi: 10.1117/12.650026
Proc. SPIE 6070, Constructing a simple parametric model of shoulder from medical images, 60700T (9 February 2006); doi: 10.1117/12.643800
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