PROCEEDINGS VOLUME 6150
2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES | 2-5 NOVEMBER 2005
2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment
IN THIS VOLUME

0 Sessions, 190 Papers, 0 Presentations
Session 3-1  (9)
Session 3-2  (4)
Session 3-3  (10)
Session 3-4  (5)
Session 3-5  (9)
Session 3-6  (5)
Session 3-7  (9)
Session 3-8  (4)
Poster Session  (135)
2ND INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING AND TESTING TECHNOLOGIES
2-5 November 2005
Xian, China
Session 3-1
Proc. SPIE 6150, Birefringent laterally sheared beam splitter-Savart polariscope, 615001 (19 May 2006); doi: 10.1117/12.677951
Proc. SPIE 6150, Corrective technique of null lens's unsymmetrical error, 615002 (19 May 2006); doi: 10.1117/12.676908
Proc. SPIE 6150, Coma aberration measurement by lateral image displacements at different defocus positions, 615003 (19 May 2006); doi: 10.1117/12.676894
Proc. SPIE 6150, Optical parameters analysis of a semi-conductive film based on genetic algorithm, 615004 (19 May 2006); doi: 10.1117/12.677959
Proc. SPIE 6150, Development of an instrument for measuring curvature of a lens, 615005 (19 May 2006); doi: 10.1117/12.677962
Proc. SPIE 6150, Effect of surface roughness on the measurement of high power laser with a cone-shaped cavity, 615006 (19 May 2006); doi: 10.1117/12.676426
Proc. SPIE 6150, Measurement of low loss and mirrors’ reflectivity using cavity ring down spectroscopy with high accuracy, 615007 (19 May 2006); doi: 10.1117/12.677964
Proc. SPIE 6150, Method for measuring the granite surface topography of wafer stage with laser interferometer, 615008 (19 May 2006); doi: 10.1117/12.676906
Proc. SPIE 6150, A new approach for infrared image contrast enhancement, 615009 (19 May 2006); doi: 10.1117/12.676901
Session 3-2
Proc. SPIE 6150, Study on unaberrational points test for conic surface, 61500A (19 May 2006); doi: 10.1117/12.676408
Proc. SPIE 6150, Resolution improvement of one-dimensional comb-type PSD by subdivision, 61500B (19 May 2006); doi: 10.1117/12.677971
Proc. SPIE 6150, Measurement and analysis for optical radiation of glow discharge plasma at atmospheric pressure, 61500C (19 May 2006); doi: 10.1117/12.677975
Proc. SPIE 6150, Single-molecule spectroscopy inside an optical cavity, 61500D (19 May 2006); doi: 10.1117/12.676899
Session 3-3
Proc. SPIE 6150, 500-mm aperture wavelength-tuning phase-shifting interferometer, 61500E (19 May 2006); doi: 10.1117/12.677976
Proc. SPIE 6150, Digital realization of precision surface defect evaluation system, 61500F (19 May 2006); doi: 10.1117/12.677979
Proc. SPIE 6150, Wavefront fitting of interferogram with Zernike polynomials based on SVD, 61500G (19 May 2006); doi: 10.1117/12.677984
Proc. SPIE 6150, Development of the laser alignment system with PSD used for shaft calibration, 61500H (19 May 2006); doi: 10.1117/12.676890
Proc. SPIE 6150, Novel beam orienting mechanism using beam nutating and coherent detecting technologies, 61500I (19 May 2006); doi: 10.1117/12.677987
Proc. SPIE 6150, Analysis on influence of illumination in MTF measurement within infrared spectral bands, 61500J (19 May 2006); doi: 10.1117/12.677989
Proc. SPIE 6150, High resolution digital holography with two confocal lenses, 61500K (19 May 2006); doi: 10.1117/12.677993
Proc. SPIE 6150, An optical fiber interferometric system for non-contact measurement of atmospheric optical turbulence, 61500L (19 May 2006); doi: 10.1117/12.678081
Proc. SPIE 6150, Research on technology of digital knife-edge test, 61500M (19 May 2006); doi: 10.1117/12.678088
Proc. SPIE 6150, Ultra-sensitive near-field Raman detection technique, 61500N (19 May 2006); doi: 10.1117/12.678090
Session 3-4
Proc. SPIE 6150, Study on precise measurement of high reflectivity by cavity ring-down spectroscopy, 61500O (19 May 2006); doi: 10.1117/12.678091
Proc. SPIE 6150, Thermal temperature measurement and dynamic analysis based on USB 2.0, 61500P (19 May 2006); doi: 10.1117/12.678092
Proc. SPIE 6150, Measurement of convex aspheric lens' optical performance using computer-generated holograms, 61500Q (19 May 2006); doi: 10.1117/12.676896
Proc. SPIE 6150, Long distance precision measurement with double modulation laser, 61500R (19 May 2006); doi: 10.1117/12.678095
Proc. SPIE 6150, Research on digitally integrated test system for performance evaluation of image intensifier and intensified CCD, 61500S (19 May 2006); doi: 10.1117/12.678099
Session 3-5
Proc. SPIE 6150, A full-vectorial FDFD analysis of photonic crystal fibers, 61500T (19 May 2006); doi: 10.1117/12.676649
Proc. SPIE 6150, Study on near infrared technology for the measurement of moisture, 61500U (19 May 2006); doi: 10.1117/12.676831
Proc. SPIE 6150, Temperature sensor with microstructure fiber based ruby fluorescence lifetime, 61500V (19 May 2006); doi: 10.1117/12.676828
Proc. SPIE 6150, Micro-structured optic fiber system for pressure sensing, 61500W (19 May 2006); doi: 10.1117/12.676742
Proc. SPIE 6150, A novel targeting method based on non-diffracting interference technique, 61500X (19 May 2006); doi: 10.1117/12.676401
Proc. SPIE 6150, Design and DSP implementation of star image acquisition and star point fast acquiring and tracking, 61500Y (19 May 2006); doi: 10.1117/12.676415
Proc. SPIE 6150, Study on image matching of 3D measurement system on dynamic object in long distance, 61500Z (19 May 2006); doi: 10.1117/12.676403
Proc. SPIE 6150, Wavelet digital filter method for image processing of 3D measurement profilometry, 615010 (19 May 2006); doi: 10.1117/12.676399
Proc. SPIE 6150, Study on field weed recognition in real-time, 615011 (19 May 2006); doi: 10.1117/12.676493
Session 3-6
Proc. SPIE 6150, Microscopic scattering imaging system of defects on ultra-smooth surface suitable for digital image processing, 615012 (19 May 2006); doi: 10.1117/12.676496
Proc. SPIE 6150, A novel fusion scheme for infrared and visual images based on wavelet and color transfer algorithm, 615013 (19 May 2006); doi: 10.1117/12.676902
Proc. SPIE 6150, Rock fracture image acquisition with both visible and ultraviolet illuminations, 615014 (19 May 2006); doi: 10.1117/12.676716
Proc. SPIE 6150, Bar code gauge identification system based on DSP, 615015 (19 May 2006); doi: 10.1117/12.676728
Proc. SPIE 6150, Primary research on image of plasma in CO<sub>2</sub> laser welding with high-speed photography, 615016 (19 May 2006); doi: 10.1117/12.676730
Session 3-7
Proc. SPIE 6150, Compensation and test of reflective mirror, 615017 (19 May 2006); doi: 10.1117/12.676410
Proc. SPIE 6150, Parameters selections in confocal technology, 615018 (19 May 2006); doi: 10.1117/12.676754
Proc. SPIE 6150, Research on parameter of grating digital subdivision, 615019 (19 May 2006); doi: 10.1117/12.676407
Proc. SPIE 6150, Optimum design of uncooled staring infrared camera, 61501A (19 May 2006); doi: 10.1117/12.676505
Proc. SPIE 6150, Design of a coherent optical interferometric system, 61501B (19 May 2006); doi: 10.1117/12.676409
Proc. SPIE 6150, Research on technique of grating nanometer-subdivision, 61501C (19 May 2006); doi: 10.1117/12.676406
Proc. SPIE 6150, InGaAs trap detector used as a near-infrared transfer standard for detector calibrations, 61501D (19 May 2006); doi: 10.1117/12.676739
Proc. SPIE 6150, Evaluation of effective resolution of machine vision measurement systems based on variance and correlation analysis, 61501E (19 May 2006); doi: 10.1117/12.676526
Proc. SPIE 6150, Optical fiber interferometric spectrometer, 61501F (19 May 2006); doi: 10.1117/12.676405
Session 3-8
Proc. SPIE 6150, Digitalization measurement of structure parameters of optic low-pass filter, 61501G (19 May 2006); doi: 10.1117/12.676417
Proc. SPIE 6150, Resonant spectra of symmetric microcavity, 61501H (19 May 2006); doi: 10.1117/12.676494
Proc. SPIE 6150, Image-based optical detecting system used for the analysis of human activities, 61501I (19 May 2006); doi: 10.1117/12.676483
Proc. SPIE 6150, Universal tool microscope remanufacture based on CCD, 61501J (19 May 2006); doi: 10.1117/12.676411
Poster Session
Proc. SPIE 6150, Extending the application of subaperture finishing, 61501K (19 May 2006); doi: 10.1117/12.676838
Proc. SPIE 6150, Study on residual stress of AISI304 TIG welding line with laser shock processing by x-ray stress analyzer, 61501L (19 May 2006); doi: 10.1117/12.676412
Proc. SPIE 6150, Design of an embedded optical fiber micro-displacement measurement system, 61501M (19 May 2006); doi: 10.1117/12.678101