PROCEEDINGS VOLUME 6278
SEVENTH SEMINAR ON PROBLEMS OF THEORETICAL AND APPLIED ELECTRON AND ION OPTICS | 25-27 MAY 2005
Seventh Seminar on Problems of Theoretical and Applied Electron and Ion Optics
SEVENTH SEMINAR ON PROBLEMS OF THEORETICAL AND APPLIED ELECTRON AND ION OPTICS
25-27 May 2005
Moscow, Russian Federation
Theoretical and Computer Electron Optics
Proc. SPIE 6278, Structure of singularity in hydrodynamic theory of dense electron and bipolar beams, 627801 (31 May 2006); doi: 10.1117/12.693183
Proc. SPIE 6278, Adequacy of spherical diode theory, 627802 (31 May 2006); doi: 10.1117/12.693184
Proc. SPIE 6278, Bipolar beam forming electrodes, 627803 (31 May 2006); doi: 10.1117/12.693185
Proc. SPIE 6278, Perturbation techniques in the problems of computational charged particle optics, 627804 (31 May 2006); doi: 10.1117/12.693186
Proc. SPIE 6278, Finite-element simulation of thermoemission electron guns, 627805 (31 May 2006); doi: 10.1117/12.693187
Proc. SPIE 6278, High-power magnetron-injection gun with the interception of the electrons reflected from the magnetic mirror, 627806 (31 May 2006); doi: 10.1117/12.693188
Proc. SPIE 6278, About the choice possibility of the optimal motion trajectory of the particle on the basis of the least action principle, 627807 (31 May 2006); doi: 10.1117/12.693189
Proc. SPIE 6278, Possibility and example of the axial aberrations correction in the combined axially symmetric electromagnetic mirror, 627808 (31 May 2006); doi: 10.1117/12.693194
Analytical and Technological Electron-Optical Devices and Equipment
Proc. SPIE 6278, Simulation of geometry of high voltage glow discharge electrodes' systems, formed profile electron beams, 627809 (31 May 2006); doi: 10.1117/12.693202
Proc. SPIE 6278, Vacuum technological equipment for microphotoelectronic production, 62780A (31 May 2006); doi: 10.1117/12.693205
Proc. SPIE 6278, Design of cold-cathode ion sources for precise electron-beam processing of the semiconductor structures, 62780B (31 May 2006); doi: 10.1117/12.693191
Proc. SPIE 6278, Automated control of technological parameters of vacuum equipment to guarantee unbreakable quality check, 62780C (31 May 2006); doi: 10.1117/12.693193
Proc. SPIE 6278, Extracting system of ion source for deflection of beam at entrance of monopole mass-analyzer, 62780D (31 May 2006); doi: 10.1117/12.693195
Intensive Electron Beam Simulation and Design
Proc. SPIE 6278, Confined flow multiple beam shaping at the powerful klystron for the Superconducting Linear Electron-Positron Colliders, 62780E (31 May 2006); doi: 10.1117/12.693197
Proc. SPIE 6278, High-perveance electron guns for powerful broadband low-voltage grid-controlled TWT, 62780F (31 May 2006); doi: 10.1117/12.693198
Proc. SPIE 6278, Simulation of characteristics of plasma-filled TWT, 62780G (31 May 2006); doi: 10.1117/12.693200
Proc. SPIE 6278, Dynamics of charge particles in the stellatron type focusing system, 62780H (31 May 2006); doi: 10.1117/12.693203
Electron and Ion-Beam Interactions with Matter
Proc. SPIE 6278, Simulation of electron scattering in thin films using Monte-Carlo method in discrete looses approximation, 62780I (31 May 2006); doi: 10.1117/12.693208
Proc. SPIE 6278, One particularity of energy-angular secondary electrons spectrum, 62780J (31 May 2006); doi: 10.1117/12.693210
Proc. SPIE 6278, Computation of charge and energy deposited during electron beam irradiation depth distributions in discrete looses approximation, 62780K (31 May 2006); doi: 10.1117/12.693211
Proc. SPIE 6278, Determination of subsurface structure parameters of a sample using secondary electrons energy spectrums, 62780L (31 May 2006); doi: 10.1117/12.693212
Proc. SPIE 6278, Software engineering for mathematical modeling of spectrums roentgenofluorescent analysis of solids, 62780M (31 May 2006); doi: 10.1117/12.693207
Proc. SPIE 6278, About the possibility of interval identification of functional dependences at research of semiconductor materials in a cathodoluminescent microscopy, 62780N (31 May 2006); doi: 10.1117/12.693209
Proc. SPIE 6278, Mathematical modeling dependences of intensity monochromatic cathodeluminescence from electron beam energy for two-layer semiconductor structure, 62780O (31 May 2006); doi: 10.1117/12.693220
Proc. SPIE 6278, A simple technique for defining the structure and the dimensional parameters of layered specimens, 62780P (31 May 2006); doi: 10.1117/12.693190
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