PROCEEDINGS VOLUME 6286
SPIE OPTICS + PHOTONICS | 13-17 AUGUST 2006
Advances in Thin-Film Coatings for Optical Applications III
IN THIS VOLUME

0 Sessions, 19 Papers, 0 Presentations
Proceedings Volume 6286 is from: Logo
SPIE OPTICS + PHOTONICS
13-17 August 2006
San Diego, California, United States
Ion and Plasma Processing
Proc. SPIE 6286, Deposition of multilayer optical coatings using closed field magnetron sputtering, 628601 (28 August 2006); doi: 10.1117/12.679052
Proc. SPIE 6286, Characterisation of optical thin films obtained by plasma ion assisted deposition, 628602 (28 August 2006); doi: 10.1117/12.681027
Proc. SPIE 6286, Analysis of (TiO2)X(Ta2O5)1-X composite films prepared by radio frequency ion beam sputtering deposition, 628603 (28 August 2006); doi: 10.1117/12.676233
Proc. SPIE 6286, Wavefront control of UV narrow bandpass filters prepared by plasma ion-assisted deposition, 628604 (28 August 2006); doi: 10.1117/12.677539
Proc. SPIE 6286, High-power DPL thin films prepared by ion beam sputtering, 628605 (28 August 2006); doi: 10.1117/12.675254
Novel Thin Film Applications
Proc. SPIE 6286, Advanced optical coating technology used in the development of concentrator arrays for solar space power applications, 628606 (28 August 2006); doi: 10.1117/12.678195
Proc. SPIE 6286, Optimized multilayer dielectric mirror coatings for gravitational wave interferometers, 628608 (28 August 2006); doi: 10.1117/12.678977
Proc. SPIE 6286, A new design of thin-film grating optical low-pass filter and its fabrication, 628609 (28 August 2006); doi: 10.1117/12.678717
Novel Material Synthesis
Proc. SPIE 6286, Thin coatable birefringent film, 62860A (28 August 2006); doi: 10.1117/12.680058
Proc. SPIE 6286, Investigation of cadmium alternatives in thin-film coatings, 62860C (28 August 2006); doi: 10.1117/12.680349
Proc. SPIE 6286, Growth of zinc oxide thin films for optoelectronic application by pulsed laser deposition, 62860D (28 August 2006); doi: 10.1117/12.680477
Advanced Deposition Techniques and Modeling
Proc. SPIE 6286, Fabrication of dense wavelength division multiplexing filters with large useful area, 62860E (28 August 2006); doi: 10.1117/12.678915
Proc. SPIE 6286, Tunable thin film filters for intelligent WDM networks, 62860F (28 August 2006); doi: 10.1117/12.678329
Proc. SPIE 6286, Transmission ellipsometry of transparent-film transparent-substrate systems: polynomial inversion for the substrate optical constant, 62860G (28 August 2006); doi: 10.1117/12.681006
Proc. SPIE 6286, In-situ reflectivity measurement for antireflection coating on laser diode facet, 62860H (28 August 2006); doi: 10.1117/12.679816
Poster Session
Proc. SPIE 6286, Optical response and light scattering measurements from a planar guided wave, 62860J (28 August 2006); doi: 10.1117/12.678669
Proc. SPIE 6286, Optical properties of Er3+ + Yb3+ doped gallium nitride layers, 62860K (28 August 2006); doi: 10.1117/12.679420
Proc. SPIE 6286, Theoretical description and experiment to prove the bistability of the semiconductor laser diode, 62860L (28 August 2006); doi: 10.1117/12.680764
Proc. SPIE 6286, X-measuring ellipsometer (XME): a novel ellipsometric technique to fully characterize film-substrate systems, 62860M (28 August 2006); doi: 10.1117/12.680972
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