PROCEEDINGS VOLUME 6291
SPIE OPTICS + PHOTONICS | 13-17 AUGUST 2006
Optical Systems Degradation, Contamination, and Stray Light: Effects, Measurements, and Control II
Proceedings Volume 6291 is from: Logo
SPIE OPTICS + PHOTONICS
13-17 August 2006
San Diego, California, United States
Contamination Control Techniques and Methods
Proc. SPIE 6291, The instrumentation and the contamination control activity of thermal and near-infrared sensor for carbon observation (TANSO) on GOSAT, 629101 (7 September 2006); doi: 10.1117/12.677114
Proc. SPIE 6291, Use of design of experiments techniques to investigate resistance change of chip resistors in MESSENGER, 629102 (7 September 2006); doi: 10.1117/12.678542
Proc. SPIE 6291, Monte Carlo based contamination modeling using GEANT, 629103 (7 September 2006); doi: 10.1117/12.684206
Proc. SPIE 6291, Contamination control of space-based laser instruments, 629104 (7 September 2006); doi: 10.1117/12.681175
Proc. SPIE 6291, Use of solid phase microextraction to verify nitrogen purge gas purity, 629105 (7 September 2006); doi: 10.1117/12.681017
Cleaning, Monitoring, and Verification
Proc. SPIE 6291, Quartz crystal microbalance operation and in situ calibration, 629106 (7 September 2006); doi: 10.1117/12.677657
Proc. SPIE 6291, Comparative mirror cleaning study: a study on removing particulate contamination, 629107 (7 September 2006); doi: 10.1117/12.683231
Proc. SPIE 6291, Comparison of particulate verification techniques study, 629108 (7 September 2006); doi: 10.1117/12.681122
Proc. SPIE 6291, New Horizons Pluto lessons learned during ground processing, 629109 (7 September 2006); doi: 10.1117/12.683449
Molecular Contamination Effects
Proc. SPIE 6291, GOES-12 molecular contamination, 62910E (7 September 2006); doi: 10.1117/12.682006
Proc. SPIE 6291, Control of molecular contamination and outgassing of the SOFIE instrument, 62910F (7 September 2006); doi: 10.1117/12.684109
Proc. SPIE 6291, Formation of contaminant droplets on surfaces, 62910G (7 September 2006); doi: 10.1117/12.678563
Proc. SPIE 6291, Interaction of vacuum ultraviolet radiation with molecular deposits, 62910H (7 September 2006); doi: 10.1117/12.677654
Particulate Contamination Effects
Proc. SPIE 6291, Measuring reality, solving the slope dilemma, and redefining the particle size distribution model, 62910I (7 September 2006); doi: 10.1117/12.695250
Proc. SPIE 6291, Digital imaging of particulate contamination, 62910J (7 September 2006); doi: 10.1117/12.678560
Proc. SPIE 6291, Comparing surface particle coverage predictions with image analysis measurements, 62910K (7 September 2006); doi: 10.1117/12.677326
Proc. SPIE 6291, A numerical evaluation of the correlation of surface cleanliness level and percent area coverage, 62910L (7 September 2006); doi: 10.1117/12.679621
Proc. SPIE 6291, Particle deposition in confined vessels, 62910M (7 September 2006); doi: 10.1117/12.674657
Proc. SPIE 6291, Potential biofouling of spacecraft propellant systems due to contaminated deionized water, 62910N (7 September 2006); doi: 10.1117/12.678838
Optical Component Scatter Theory and Measurement I
Proc. SPIE 6291, The art of specifying optics for scatter, 62910O (7 September 2006); doi: 10.1117/12.693206
Proc. SPIE 6291, No such thing as sigma: flowdown and measurement of surface roughness requirements, 62910P (7 September 2006); doi: 10.1117/12.678314
Proc. SPIE 6291, Improved Mie theory scatter model for particulate contamination that conserves energy and obeys reciprocity, 62910Q (7 September 2006); doi: 10.1117/12.681173
Optical Component Scatter Theory and Measurement II
Proc. SPIE 6291, K-correlation power spectral density and surface scatter model, 62910R (7 September 2006); doi: 10.1117/12.678320
Proc. SPIE 6291, Recent developments in the analysis of surface scatter phenomena, 62910S (7 September 2006); doi: 10.1117/12.683671
Proc. SPIE 6291, Modeling particle distributions for stray light analysis, 62910T (7 September 2006); doi: 10.1117/12.678321
Subsystem and System Level Scatter Predictions and Results
Proc. SPIE 6291, Stray light in packaged detectors, 62910U (7 September 2006); doi: 10.1117/12.678094
Proc. SPIE 6291, Stray light reduction in testing of NIRSpec subsystems: the focal plane array and micro-shutter assembly, 62910V (7 September 2006); doi: 10.1117/12.678513
Proc. SPIE 6291, General algorithm for stray light measurements of remote sensing imagery, 62910Y (7 September 2006); doi: 10.1117/12.692870
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