PROCEEDINGS VOLUME 6293
SPIE OPTICS + PHOTONICS | 13-17 AUGUST 2006
Interferometry XIII: Applications
Proceedings Volume 6293 is from: Logo
SPIE OPTICS + PHOTONICS
13-17 August 2006
San Diego, California, United States
Micro- and Nano-Metrology Applications
Proc. SPIE 6293, Applications of imaging interferometry, 629301 (14 August 2006); doi: 10.1117/12.683948
Proc. SPIE 6293, Wavefront sensing by an aperiodic diffractive microlens array, 629302 (14 August 2006); doi: 10.1117/12.677845
Proc. SPIE 6293, Optimization algorithm of LDA signal processing for nanoparticles, 629303 (14 August 2006); doi: 10.1117/12.680263
Proc. SPIE 6293, Compensation of chromatic aberration in multiwavelength digital holographic investigation of microstructures, 629304 (14 August 2006); doi: 10.1117/12.683858
Proc. SPIE 6293, Interferometric testing through transmissive media (TTM), 629305 (14 August 2006); doi: 10.1117/12.682089
Measurements in Presence of Motion and Vibration
Proc. SPIE 6293, Advances in dynamic metrology using in-line digital holographic interferometry, 629306 (14 August 2006); doi: 10.1117/12.679799
Proc. SPIE 6293, Dynamic optical coherence tomography for paper wetting measurements, 629307 (14 August 2006); doi: 10.1117/12.680201
Proc. SPIE 6293, Static and dynamic measurements of active MEMS by Twyman-Green interferometry: case of AlN-based microactuators, 629308 (14 August 2006); doi: 10.1117/12.680691
Proc. SPIE 6293, Dynamic characterization of AFM probes by laser Doppler vibrometry and stroboscopic holographic methodologies, 629309 (14 August 2006); doi: 10.1117/12.683181
Proc. SPIE 6293, Characterization of acoustic vibrations on micro- and nanostructures with picometer sensitivity, 62930A (14 August 2006); doi: 10.1117/12.679381
Proc. SPIE 6293, A point-diffraction interferometer with vibration-desensitizing capability, 62930B (14 August 2006); doi: 10.1117/12.678691
Precision Measurements for Industry
Proc. SPIE 6293, Non-destructive structural homogeneity of MOEMS arrays: applications of a through-transmissive-media interferometer on a digital mirror device-spatial light modulator, 62930C (14 August 2006); doi: 10.1117/12.684222
Proc. SPIE 6293, High-speed high-accuracy fiber optic low-coherence interferometry for in situ grinding and etching process monitoring, 62930D (14 August 2006); doi: 10.1117/12.675592
Proc. SPIE 6293, Investigation of inherent wafer defects using reflection grating technique, 62930E (14 August 2006); doi: 10.1117/12.679830
Proc. SPIE 6293, A white-light interferometer for inner cylindrical surfaces, 62930F (14 August 2006); doi: 10.1117/12.678050
Proc. SPIE 6293, Novel approach of integrity assessment of thin film of different coatings by shearography, 62930G (14 August 2006); doi: 10.1117/12.677116
Precision Optical Measurements
Proc. SPIE 6293, Determination of absolute change in optical power of a reference mirror at cryogenic temperature, 62930H (14 August 2006); doi: 10.1117/12.675341
Proc. SPIE 6293, Computer aided alignment using Zernike coefficients, 62930I (14 August 2006); doi: 10.1117/12.678647
Proc. SPIE 6293, Subaperture stitching interferometry for testing mild aspheres, 62930J (14 August 2006); doi: 10.1117/12.680473
Proc. SPIE 6293, Figure measurement of a large optical flat with a Fizeau interferometer and stitching technique, 62930K (14 August 2006); doi: 10.1117/12.681234
Interferometric Sensors
Proc. SPIE 6293, Interferometric sensors for application in the bladder and the lower urinary tract, 62930L (14 August 2006); doi: 10.1117/12.681566
Proc. SPIE 6293, Whole-field polarization analysis by digital holography with single reference beam, 62930M (14 August 2006); doi: 10.1117/12.681953
Proc. SPIE 6293, Determination of refractive index by digital holography, 62930N (14 August 2006); doi: 10.1117/12.680547
Proc. SPIE 6293, Error minimization in high-accuracy scanning deflectometry, 62930O (14 August 2006); doi: 10.1117/12.679339
Proc. SPIE 6293, Absolute distance measurements using point-diffracted spherical waves, 62930P (14 August 2006); doi: 10.1117/12.678690
Stress, Strain, and Deformation
Proc. SPIE 6293, Studies of photoelastic tomography process for 3D birefringence determination in phase microobjects, 62930Q (14 August 2006); doi: 10.1117/12.681783
Proc. SPIE 6293, Simultaneous measurement of deformation and thickness change in polymer films, 62930R (14 August 2006); doi: 10.1117/12.680546
Proc. SPIE 6293, Multipoint diffraction strain sensor: an add-on to moiré interferometer, 62930S (14 August 2006); doi: 10.1117/12.679893
Proc. SPIE 6293, Full-field optical microextensometer based on waveguide grating interferometry, 62930T (14 August 2006); doi: 10.1117/12.681815
Poster Session
Proc. SPIE 6293, Effect of strong refraction of probing beam accompanying shear holographic interferometry of a bow shock, 62930U (14 August 2006); doi: 10.1117/12.673814
Proc. SPIE 6293, Current-induced frequency modulation characteristics in semiconductor lasers using a novel and simple method, 62930V (14 August 2006); doi: 10.1117/12.678212
Proc. SPIE 6293, Down-hole seismic survey system with fiber-optic accelerometer sensor array for 3-dimensions vertical seismic profile (3D-VSP), 62930W (14 August 2006); doi: 10.1117/12.678230
Proc. SPIE 6293, Phase mapping of the poling process in the RuO2:LiNbO3 crystal by digital holographic interferometry, 62930X (14 August 2006); doi: 10.1117/12.678409
Proc. SPIE 6293, A high sensitivity heterodyne interferometer as optical readout for the LISA inertial sensor, 62930Z (14 August 2006); doi: 10.1117/12.681567
Proc. SPIE 6293, Development of the interferometrical scanning probe microscope, 629311 (14 August 2006); doi: 10.1117/12.680692
Proc. SPIE 6293, Fiber-optic hydrophone with increased sensitivity, 629312 (14 August 2006); doi: 10.1117/12.679772
Proc. SPIE 6293, Intellectual property in holographic interferometry, 629313 (14 August 2006); doi: 10.1117/12.690209
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