PROCEEDINGS VOLUME 6375
OPTICS EAST 2006 | 1-4 OCTOBER 2006
Optomechatronic Sensors, Instrumentation, and Computer-Vision Systems
Proceedings Volume 6375 is from: Logo
OPTICS EAST 2006
1-4 October 2006
Boston, Massachusetts, United States
Mechanical Properties and Imaging
Proc. SPIE 6375, Hardness measurements of metals with the complex refractive index, 637501 (12 October 2006); doi: 10.1117/12.686719
Proc. SPIE 6375, An active imaging system using a deformable mirror and its application to super resolution, 637503 (12 October 2006); doi: 10.1117/12.686624
Design of Phase Control Devices
Proc. SPIE 6375, Design of liquid crystal Fresnel lens by uneven electric field, 637504 (12 October 2006); doi: 10.1117/12.688140
Proc. SPIE 6375, Phase retardation symmetric design of a refractive and diffractive element for linearizing sinusoidal scanning, 637505 (13 October 2006); doi: 10.1117/12.686302
Geometry Measurement and Inspection
Proc. SPIE 6375, Simultaneous measurement of film surface topography and thickness variation using white-light interferometry, 637507 (12 October 2006); doi: 10.1117/12.688109
Proc. SPIE 6375, Development of super-resolution optical inspection system for semiconductor defects using standing wave illumination shift, 637508 (12 October 2006); doi: 10.1117/12.690582
Proc. SPIE 6375, Evaluation of laser trapping probe properties for coordinate measurement, 637509 (13 October 2006); doi: 10.1117/12.689750
Proc. SPIE 6375, Measuring shapes of three-dimensional objects by rotary focused-plane sectioning, 63750A (18 October 2006); doi: 10.1117/12.686611
Proc. SPIE 6375, Expansion of measuring range of stereovision system based on Mono-MoCap, 63750B (12 October 2006); doi: 10.1117/12.689437
Fringe-Projection 3D Surface Measurement: Joint Session with Conference 6375A
Proc. SPIE 6375, Triangular phase-shifting algorithms for surface measurement, 63750C (20 October 2006); doi: 10.1117/12.690734
Proc. SPIE 6375, Repeated phase-offset measurement for error compensation in two-step triangular phase-shifting profilometry, 63750D (18 October 2006); doi: 10.1117/12.690735
Proc. SPIE 6375, An active vision sensor system employing adaptive digital fringe pattern generated by SLM pattern projector, 63750E (19 October 2006); doi: 10.1117/12.686669
Pattern Recognition, Segmentation, and Object Modeling
Proc. SPIE 6375, Virtual assemblage of fragmented artefacts, 63750F (19 October 2006); doi: 10.1117/12.686641
Proc. SPIE 6375, Template generation by component maximization for real time face detection, 63750G (20 October 2006); doi: 10.1117/12.689146
Proc. SPIE 6375, Local retouching of degraded images by histogram-based similarity evaluation, 63750H (19 October 2006); doi: 10.1117/12.684844
Proc. SPIE 6375, Using orientation code matching for robustly sensing real velocity of agrimotors, 63750I (19 October 2006); doi: 10.1117/12.685841
Novel Optomechatronic Applications
Proc. SPIE 6375, Spherical imaging array based on bioelectronic photoreceptors, 63750K (19 October 2006); doi: 10.1117/12.686146
Proc. SPIE 6375, Noncontact vibration analysis using innovative laser-based methodology, 63750L (19 October 2006); doi: 10.1117/12.686273
Vision-Based Tracking
Proc. SPIE 6375, Camera pan-tilt ego-motion tracking from point-based environment models, 63750M (19 October 2006); doi: 10.1117/12.688346
Proc. SPIE 6375, Object tracking by block division based on radial reach filter, 63750N (19 October 2006); doi: 10.1117/12.685734
Proc. SPIE 6375, A boundary tracking approach for tape substrate pattern inspection based on skeleton information, 63750P (19 October 2006); doi: 10.1117/12.686444
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