PROCEEDINGS VOLUME 6382
OPTICS EAST 2006 | 1-4 OCTOBER 2006
Two- and Three-Dimensional Methods for Inspection and Metrology IV
IN THIS VOLUME

0 Sessions, 23 Papers, 0 Presentations
Proceedings Volume 6382 is from: Logo
OPTICS EAST 2006
1-4 October 2006
Boston, Massachusetts, United States
Interferometry and Microscopy
Proc. SPIE 6382, Recent trends in white-light interferometry, 638201 (12 October 2006); doi: 10.1117/12.693634
Proc. SPIE 6382, Toward online non-contact roughness profile measurements with a sensor based on conoscopic holography: current developments, 638202 (12 October 2006); doi: 10.1117/12.686220
Proc. SPIE 6382, White light displacement sensor by spectro-polarization modulator, 638205 (12 October 2006); doi: 10.1117/12.689279
2D Inspection Methods
Proc. SPIE 6382, Optical crack following on tunnel surfaces, 638207 (20 October 2006); doi: 10.1117/12.685987
Proc. SPIE 6382, Optical inspection of holes in jet engine blades, 638208 (12 October 2006); doi: 10.1117/12.686260
3D Methods and Techniques I
Proc. SPIE 6382, 3D vision methods and selected experiences in micro and macro applications, 638209 (13 October 2006); doi: 10.1117/12.693635
Proc. SPIE 6382, Passive range measurement through wavefront coding, 63820A (12 October 2006); doi: 10.1117/12.682025
Proc. SPIE 6382, Regularization of the deflectometry problem using shading data, 63820B (12 October 2006); doi: 10.1117/12.685388
Proc. SPIE 6382, Edge measurement using stereovision and phase-shifting methods, 63820C (12 October 2006); doi: 10.1117/12.685423
Proc. SPIE 6382, Inner profile measurement of pipes and holes using a ring beam device, 63820D (12 October 2006); doi: 10.1117/12.689317
Proc. SPIE 6382, Depth-from-defocus: blur equalization technique, 63820E (12 October 2006); doi: 10.1117/12.688615
3D Methods and Techniques II
Proc. SPIE 6382, Accuracy problems in phase shift based 3D machine vision inspection systems, 63820F (12 October 2006); doi: 10.1117/12.685494
Proc. SPIE 6382, Metric projector camera calibration for measurement applications, 63820G (12 October 2006); doi: 10.1117/12.686000
Proc. SPIE 6382, On improving the accuracy of structured light systems, 63820H (6 November 2006); doi: 10.1117/12.692631
Proc. SPIE 6382, Automated geometry measurement of wheel rims based on optical 3D metrology, 63820I (12 October 2006); doi: 10.1117/12.685547
Proc. SPIE 6382, Embedded 3D vision system for automated micro-assembly, 63820J (12 October 2006); doi: 10.1117/12.686675
Proc. SPIE 6382, Multiresolution 3D measurement using a hybrid fringe projection and moire approach, 63820K (12 October 2006); doi: 10.1117/12.687183
Poster Session
Proc. SPIE 6382, An improved achromatic half-wave plate phase shifter for white light interferometry, 63820L (12 October 2006); doi: 10.1117/12.685080
Proc. SPIE 6382, A flexible photogrammetric stereo vision system for capturing the 3D shape of extruded profiles, 63820M (12 October 2006); doi: 10.1117/12.685546
Proc. SPIE 6382, Dynamic out-of-plane profilometry for nanoscale full field characterization of MEMS with automatic detection of vibratory modes and MHz-scale measurement bandwidth, 63820N (12 October 2006); doi: 10.1117/12.685976
Proc. SPIE 6382, Stereovision-based vegetable row recognition algorithm for agricultural vehicles, 63820O (12 October 2006); doi: 10.1117/12.686013
Proc. SPIE 6382, Optical on-line product inspection system and its application, 63820P (12 October 2006); doi: 10.1117/12.686030
Proc. SPIE 6382, Image enhancement for phase shift analysis sensors, 63820Q (13 October 2006); doi: 10.1117/12.686354
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