PROCEEDINGS VOLUME 6600
SPIE FOURTH INTERNATIONAL SYMPOSIUM ON FLUCTUATIONS AND NOISE | 20-24 MAY 2007
Noise and Fluctuations in Circuits, Devices, and Materials
Proceedings Volume 6600 is from: Logo
SPIE FOURTH INTERNATIONAL SYMPOSIUM ON FLUCTUATIONS AND NOISE
20-24 May 2007
Florence, Italy
Front Matter
Proc. SPIE 6600, Front Matter: Volume 6600, 660001 (22 June 2007); doi: 10.1117/12.753163
Plenary Session
Proc. SPIE 6600, Origins of randomness in statistical and quantum mechanics, 660002 (8 June 2007); doi: 10.1117/12.727076
Proc. SPIE 6600, Thermal noise informatics: totally secure communication via a wire, zero-power communication, and thermal noise driven computing, 660003 (8 June 2007); doi: 10.1117/12.727078
Noise in Mesoscopic and Quantum Devices I
Proc. SPIE 6600, Stationary and non-stationary noise in superconducting quantum devices, 660005 (8 June 2007); doi: 10.1117/12.725639
Proc. SPIE 6600, Shot noise in transport through quantum dots: ballistic versus diffractive scattering, 660006 (8 June 2007); doi: 10.1117/12.725646
Proc. SPIE 6600, A deterministic solver for the Langevin Boltzmann equation including the Pauli principle, 660007 (8 June 2007); doi: 10.1117/12.724514
Proc. SPIE 6600, Adiabatic ac-drive as a tool for acceleration of diffusion in spatially periodic structures and of reset process in threshold devices, 660008 (8 June 2007); doi: 10.1117/12.726339
Proc. SPIE 6600, Numerical investigation of noise and transport properties of multiple mesoscopic cavities, 660009 (8 June 2007); doi: 10.1117/12.725652
Low-Frequency Noise in Electron Devices I
Proc. SPIE 6600, Assessing the 1/f noise contributions of accidental defects in advanced semiconductor devices, 66000A (8 June 2007); doi: 10.1117/12.724471
Proc. SPIE 6600, Resistive switching and noise in conductive polymers for non-volatile organic memories, 66000B (8 June 2007); doi: 10.1117/12.725570
Proc. SPIE 6600, On the mechanisms of low-frequency noise in vertical silicon pnp BJTs, 66000C (8 June 2007); doi: 10.1117/12.724648
Proc. SPIE 6600, Low-frequency noise characterizations of GaN-based visible-blind UV detectors fabricated using a double buffer layer structure, 66000D (8 June 2007); doi: 10.1117/12.724978
Proc. SPIE 6600, A semiconductor device noise model: integration of Poisson type stochastic Ohmic contact conditions with semiclassical transport, 66000E (8 June 2007); doi: 10.1117/12.724661
Low-Frequency Noise in Electron Devices II
Proc. SPIE 6600, On the origin of 1/f noise in MOSFETs, 66000F (8 June 2007); doi: 10.1117/12.725665
Proc. SPIE 6600, Low-frequency noise and random telegraph signal noise in SiGe:C heterojunction bipolar transistors: impact of carbon concentration, 66000G (22 June 2007); doi: 10.1117/12.724559
Proc. SPIE 6600, 1/f noise in SiGe HBTs fabricated on CMOS-compatible thin-film SOI, 66000H (8 June 2007); doi: 10.1117/12.724678
Proc. SPIE 6600, Current and optical low-frequency noise of GaInN/GaN green light emitting diodes, 66000I (22 June 2007); doi: 10.1117/12.724282
Proc. SPIE 6600, Impact of BOX/substrate interface on low frequency noise in FD-SOI devices, 66000J (8 June 2007); doi: 10.1117/12.724671
Proc. SPIE 6600, A very low noise voltage reference for high sensitivity noise measurements, 66000K (8 June 2007); doi: 10.1117/12.725522
Proc. SPIE 6600, Noise characteristic and quality investigation of ultrafast avalanche photodiodes, 66000L (8 June 2007); doi: 10.1117/12.724626
Proc. SPIE 6600, Very long decay time for electron velocity distribution in semiconductors and consequent 1/f noise, 66000M (8 June 2007); doi: 10.1117/12.729352
Noise in Materials I
Proc. SPIE 6600, Polarization fluctuations in an epoxy system above and below the glass transition, 66000P (22 June 2007); doi: 10.1117/12.724677
Proc. SPIE 6600, Numerical simulations of low-frequency noise in RuO2-glass films, 66000Q (22 June 2007); doi: 10.1117/12.726235
Noise in Mesoscopic and Quantum Devices II
Proc. SPIE 6600, Shot-noise of quantum chaotic systems in the classical limit, 66000R (8 June 2007); doi: 10.1117/12.724670
Proc. SPIE 6600, The noise susceptibility of a coherent conductor, 66000T (8 June 2007); doi: 10.1117/12.724656
Proc. SPIE 6600, Non-Gaussian noise in quantum wells, 66000U (22 June 2007); doi: 10.1117/12.723611
Noise in Sensing and Measurements
Proc. SPIE 6600, Fluctuation-enhanced sensing, 66000V (8 June 2007); doi: 10.1117/12.726838
Proc. SPIE 6600, Noise optimization of an active pixel sensor for real-time digital x-ray fluoroscopy, 66000Y (8 June 2007); doi: 10.1117/12.717545
Proc. SPIE 6600, Utilising jitter noise in the precise synchronisation of laser pulses, 66000Z (8 June 2007); doi: 10.1117/12.724686
Proc. SPIE 6600, Vibration-induced conductivity fluctuation measurement for soil bulk density analysis, 660010 (11 June 2007); doi: 10.1117/12.724667
Proc. SPIE 6600, SNDR enhancement in noisy sinusoidal signals by non-linear processing elements, 660011 (11 June 2007); doi: 10.1117/12.724688
Proc. SPIE 6600, Four channels cross correlation method for high sensitivity current noise measurements, 660012 (11 June 2007); doi: 10.1117/12.725528
Proc. SPIE 6600, Noise properties of high-T<sub>c</sub> superconducting transition edge bolometers with electrothermal feedback, 660014 (22 June 2007); doi: 10.1117/12.725356
Proc. SPIE 6600, Mechanical-thermal noise characterization of a new micromachined acoustic sensor, 660015 (11 June 2007); doi: 10.1117/12.720185
Proc. SPIE 6600, Signal recovery from mixed coherent signal and noise, 660016 (11 June 2007); doi: 10.1117/12.724381
Proc. SPIE 6600, Usage of microplasma signal noise for solar cells diagnostic, 660017 (22 June 2007); doi: 10.1117/12.724585
Proc. SPIE 6600, Impact of self-heating in LF noise measurements with voltage amplifiers, 660018 (11 June 2007); doi: 10.1117/12.724665
Noise in Materials II
Proc. SPIE 6600, Imaging spatio-temporal fluctuations and local susceptibility in disordered polymers, 66001A (11 June 2007); doi: 10.1117/12.726961
Proc. SPIE 6600, Noise and hysteresis in charged stripe, checkerboard, and clump forming systems, 66001B (8 June 2007); doi: 10.1117/12.724614
Proc. SPIE 6600, Noise evidence for intermittent channeled vortex motion in laser-processed YBaCuO thin films, 66001C (11 June 2007); doi: 10.1117/12.723802
Proc. SPIE 6600, Fluctuation-induced first order transition due to Griffiths anomalies of the cluster glass phase, 66001D (11 June 2007); doi: 10.1117/12.724572
Noise Modeling and Measurements in Devices
Proc. SPIE 6600, Numerical modeling of electron noise in nanoscale Si devices, 66001E (11 June 2007); doi: 10.1117/12.724399
Proc. SPIE 6600, Microscopic modeling of impact-ionization noise in SiGe heterojunction bipolar transistors, 66001F (11 June 2007); doi: 10.1117/12.724631
Proc. SPIE 6600, Noise characteristics and reliability of light emitting diodes based on nitrides, 66001H (11 June 2007); doi: 10.1117/12.724538
Proc. SPIE 6600, Theoretical aspects of nonlinear thermal fluctuations, 66001I (11 June 2007); doi: 10.1117/12.722155
Proc. SPIE 6600, Generation-recombination noise in forward-biased 4H-SiC p-n diode, 66001J (22 June 2007); doi: 10.1117/12.723444
Proc. SPIE 6600, Main sources of electron mobility fluctuations in semiconductors, 66001K (11 June 2007); doi: 10.1117/12.724567
Proc. SPIE 6600, Noises of p-i-n UV photodetectors, 66001L (11 June 2007); doi: 10.1117/12.724623
Proc. SPIE 6600, Noise spectroscopy of new silicon solar cells with double-sided texture, 66001M (11 June 2007); doi: 10.1117/12.724624
Noise in Field Effect Devices
Proc. SPIE 6600, Low frequency gate noise modeling of ultrathin oxide MOSFETs, 66001O (11 June 2007); doi: 10.1117/12.726920
Proc. SPIE 6600, Challenges in HF noise characterization and modeling of sub-100nm MOSFETs for RF ICs, 66001P (11 June 2007); doi: 10.1117/12.725641
Proc. SPIE 6600, Characterization and model enablement of high-frequency noise in 90-nm CMOS technology, 66001Q (11 June 2007); doi: 10.1117/12.724709
Proc. SPIE 6600, Performance limits of simulation models for noise characterization of mm-wave devices, 66001R (11 June 2007); doi: 10.1117/12.725093
Noise in Circuits
Proc. SPIE 6600, Correlation technique to reach ultimate resolution in noise measurements, 66001S (11 June 2007); doi: 10.1117/12.727043
Proc. SPIE 6600, Application of physical models to circuit simulations, 66001T (11 June 2007); doi: 10.1117/12.725549
Proc. SPIE 6600, Measurements to reveal phase-noise producing mechanisms in resonator-oscillators, 66001U (11 June 2007); doi: 10.1117/12.724636
Proc. SPIE 6600, Digital switching noise as a stochastic process, 66001V (11 June 2007); doi: 10.1117/12.726292
Proc. SPIE 6600, Effects of circuit elements and harmonic oscillation power on fundamental PM noise power of FET oscillator, 66001W (11 June 2007); doi: 10.1117/12.725794
Noise in Materials III
Proc. SPIE 6600, Does measurement noise increase as a phase transition is approached?, 66001Y (11 June 2007); doi: 10.1117/12.725521