Front Matter
Proc. SPIE 6616, Front Matter: Volume 6616, 661601 (18 June 2007); doi: 10.1117/12.747152
Advanced Sensor Solutions: Optical Sensors
Proc. SPIE 6616, Paradigm shifts in optical coherence tomography, 661604 (18 June 2007); doi: 10.1117/12.732035
Proc. SPIE 6616, White light spectral interferometric technique used to measure thickness of thin films, 661605 (18 June 2007); doi: 10.1117/12.724619
Proc. SPIE 6616, Dual-wavelength vertical scanning low-coherence interference microscopy, 661606 (18 June 2007); doi: 10.1117/12.726108
Proc. SPIE 6616, White light interferometry in combination with a nanopositioning and nanomeasuring machine (NPMM), 661607 (18 June 2007); doi: 10.1117/12.726114
Proc. SPIE 6616, Vertical scanning interferometry with a mixed-coherence light source, 661608 (18 June 2007); doi: 10.1117/12.725108
Proc. SPIE 6616, A method for edge detection of textile preforms using a light-section sensor for the automated manufacturing of fibre-reinforced plastics, 661609 (18 June 2007); doi: 10.1117/12.726177
Proc. SPIE 6616, Real-time multicamera system for measurement of 3D coordinates by pattern projection, 66160A (18 June 2007); doi: 10.1117/12.726380
Proc. SPIE 6616, 3D shape measurement with phase correlation based fringe projection, 66160B (18 June 2007); doi: 10.1117/12.726119
Proc. SPIE 6616, Time-of-flight based pixel architecture with integrated double-cathode photodetector, 66160C (18 June 2007); doi: 10.1117/12.725655
Proc. SPIE 6616, Photon-noise limited distance resolution of optical metrology methods, 66160D (18 June 2007); doi: 10.1117/12.732040
Proc. SPIE 6616, The Confocal Raman AFM: a powerful tool for the characterization of surface coatings, 66160E (18 June 2007); doi: 10.1117/12.726059
Proc. SPIE 6616, Point-diffraction interferometer by electro-optic effect in lithium niobate crystals, 66160F (18 June 2007); doi: 10.1117/12.726150
Proc. SPIE 6616, Super-heterodyne laser interferometer using femtosecond frequency comb for linear encoder calibration system, 66160G (18 June 2007); doi: 10.1117/12.726247
Proc. SPIE 6616, Differential signal scatterometry overlay metrology: an accuracy investigation, 66160H (18 June 2007); doi: 10.1117/12.725929
Proc. SPIE 6616, Improved microinterferometric tomography method for reconstruction of refractive index, 66160I (18 June 2007); doi: 10.1117/12.726123
Proc. SPIE 6616, High-resolution tomographic interferometry of optical phase elements, 66160J (18 June 2007); doi: 10.1117/12.726103
Proc. SPIE 6616, Properties of the DMD digital micromirror device for new emerging applications in optical engineering, 66160K (18 June 2007); doi: 10.1117/12.726824
Proc. SPIE 6616, Realisation of quantitative Makyoh topography using a digital micromirror device, 66160L (18 June 2007); doi: 10.1117/12.726388
Proc. SPIE 6616, A beam halo monitor based on adaptive optics, 66160M (18 June 2007); doi: 10.1117/12.726828
Proc. SPIE 6616, Realisation of a holographic microlaser scalpel using a digital micromirror device, 66160N (18 June 2007); doi: 10.1117/12.727489
Proc. SPIE 6616, Digital micromirror device application for inline characterization of solar cells by tomographic light beam-induced current imaging, 66160O (18 June 2007); doi: 10.1117/12.726384
Proc. SPIE 6616, External-cavity diode laser utilizing a micromirror device for spectral tuning, 66160R (18 June 2007); doi: 10.1117/12.726825
Proc. SPIE 6616, In situ monitoring of periodic domain formation in ferroelectric crystals, 66160S (18 June 2007); doi: 10.1117/12.726175
Proc. SPIE 6616, Dispersive white light interferometry for 3D inspection of thin film layers of flat panel displays, 66160T (18 June 2007); doi: 10.1117/12.726040
Proc. SPIE 6616, DLP based fringe projection as an optical 3D inline measuring method for inspection in manufacturing, 66160U (18 June 2007); doi: 10.1117/12.726090
Proc. SPIE 6616, Polarization correlometry of polarization singularities of biological tissues object fields, 66160V (18 June 2007); doi: 10.1117/12.725980
Proc. SPIE 6616, Fluid mechanics measurement based on the anisotropic core structure of pseudophase singularities in analytic signal representation of speckle pattern, 66160W (18 June 2007); doi: 10.1117/12.725123
Proc. SPIE 6616, Coherent fringe projector for 3D surface profilometry, 66160X (18 June 2007); doi: 10.1117/12.726031
Proc. SPIE 6616, W-band speckle contrast images for inspection of concealed objects, 66160Y (18 June 2007); doi: 10.1117/12.726146
Proc. SPIE 6616, About the possibility of using optical bistability effect in metrology systems, 66160Z (18 June 2007); doi: 10.1117/12.725987
Advanced Sensor Solutions: Phase Retrieval
Proc. SPIE 6616, Reaching lambda/100 resolution in static fringes interferometry using linear prediction, 661610 (18 June 2007); doi: 10.1117/12.726037
Proc. SPIE 6616, Composition of virtual speckle pattern for spatial fringe analysis method in ESPI by using single camera, 661611 (18 June 2007); doi: 10.1117/12.726018
Proc. SPIE 6616, Phase measurement errors due to holographic interferograms compression, 661612 (18 June 2007); doi: 10.1117/12.725858
Proc. SPIE 6616, Fourier-based design of asynchronous phase detection algorithms, 661613 (18 June 2007); doi: 10.1117/12.725668
Proc. SPIE 6616, Phase retrieval based on wavefront modulation, 661614 (18 June 2007); doi: 10.1117/12.726381
Proc. SPIE 6616, Real-time dual-wavelength digital holographic microscopy with a single hologram, 661615 (18 June 2007); doi: 10.1117/12.726083
Proc. SPIE 6616, Fast demodulation technique for a quasi-distributed temperature sensor, 661616 (18 June 2007); doi: 10.1117/12.726157
Advanced Sensor Solutions: Algorithms
Proc. SPIE 6616, Stability analysis for the TMS method: Influence of high spatial frequencies, 661618 (18 June 2007); doi: 10.1117/12.726116
Proc. SPIE 6616, Characterization and compensation of decorrelations in interferometric set-ups using active optics, 661619 (18 June 2007); doi: 10.1117/12.726054
Proc. SPIE 6616, S-transform analysis of projected fringe patterns, 66161A (18 June 2007); doi: 10.1117/12.725786
Proc. SPIE 6616, An efficient mesh oriented algorithm for 3D measurement in multiple camera fringe projection, 66161B (18 June 2007); doi: 10.1117/12.724805
Proc. SPIE 6616, A complete digital optics applied to digital holographic microscopy: application to chromatic aberration compensation, 66161C (18 June 2007); doi: 10.1117/12.726052
Proc. SPIE 6616, 3D defect detection using optical wide-field microscopy, 66161D (18 June 2007); doi: 10.1117/12.725772
Proc. SPIE 6616, A novel algorithm to stitch adjacent cloud of points of long cylindrical surfaces, 66161E (18 June 2007); doi: 10.1117/12.726166
Advanced Sensor Solutions: Poster Session
Proc. SPIE 6616, White light spectral interferometric techniques used to measure the group dispersion of isotropic and anisotropic optical elements, 66161F (18 June 2007); doi: 10.1117/12.724620
Proc. SPIE 6616, Designing a new optical sensor using wide band speckle patterns, 66161G (18 June 2007); doi: 10.1117/12.724870
Proc. SPIE 6616, Implementation a new real-time structure for driving an IRFPA and image enhancement, 66161H (18 June 2007); doi: 10.1117/12.725130
Proc. SPIE 6616, New features of Doppler-free saturated-absorption resonance in field of counterpropagating waves, 66161I (18 June 2007); doi: 10.1117/12.725127
Proc. SPIE 6616, Multidirectional holographic interferometer with dodecagon geometry, 66161J (18 June 2007); doi: 10.1117/12.726131
Proc. SPIE 6616, Multi-resolution optical 3D sensor, 66161K (18 June 2007); doi: 10.1117/12.726138
Proc. SPIE 6616, Effective dynamic range measurement for a CCD in full-field industrial x-ray imaging applications, 66161L (18 June 2007); doi: 10.1117/12.726165
Proc. SPIE 6616, White light Fourier spectrometer: Monte Carlo noise analysis and test measurements, 66161M (18 June 2007); doi: 10.1117/12.726301
Proc. SPIE 6616, Non-contact torsion transducer based on the measurement of Moire patterns using plastic optical fibres, 66161N (18 June 2007); doi: 10.1117/12.726326
Proc. SPIE 6616, Special lenslet array with long focal length range for Shack-Hartmann Wavefront Sensor, 66161O (18 June 2007); doi: 10.1117/12.726043
Proc. SPIE 6616, Influences of linear birefringence on bulk glass current sensors with return-back optical paths, 66161Q (18 June 2007); doi: 10.1117/12.723716
Proc. SPIE 6616, Influences of reciprocal parameters upon a Faraday-mirror typed OCT, 66161R (18 June 2007); doi: 10.1117/12.723717
Proc. SPIE 6616, Orthogonal conjugate reflecting current sensor, 66161S (18 June 2007); doi: 10.1117/12.723718