PROCEEDINGS VOLUME 6704
OPTICAL ENGINEERING + APPLICATIONS | 26-30 AUGUST 2007
Advances in Metrology for X-Ray and EUV Optics II
IN THIS VOLUME

0 Sessions, 18 Papers, 0 Presentations
Front Matter  (1)
Session 1  (5)
Session 2  (4)
Session 3  (4)
Session 4  (4)
Proceedings Volume 6704 is from: Logo
OPTICAL ENGINEERING + APPLICATIONS
26-30 August 2007
San Diego, California, United States
Front Matter
Proc. SPIE 6704, Front Matter: Volume 6704, 670401 (2 October 2007); doi: 10.1117/12.773355
Session 1
Proc. SPIE 6704, Suppressing vibration errors in phase-shifting interferometry, 670402 (27 September 2007); doi: 10.1117/12.731421
Proc. SPIE 6704, High order harmonics wavefront measurement and optimization, 670403 (1 October 2007); doi: 10.1117/12.732339
Proc. SPIE 6704, Hard x-ray wavefront measurement and control for hard x-ray nanofocusing, 670404 (1 October 2007); doi: 10.1117/12.733749
Proc. SPIE 6704, Microstitching interferometer and relative angle determinable stitching interferometer for half-meter-long x-ray mirror, 670405 (1 October 2007); doi: 10.1117/12.733476
Proc. SPIE 6704, A microstitching interferometer for evaluating the surface profile of precisely figured x-ray K-B mirrors, 670406 (1 October 2007); doi: 10.1117/12.736384
Session 2
Proc. SPIE 6704, Optimized use and calibration of autocollimators in deflectometry, 670407 (20 September 2007); doi: 10.1117/12.732384
Proc. SPIE 6704, Binary pseudo-random grating as a standard test surface for measurement of modulation transfer function of interferometric microscopes, 670408 (20 September 2007); doi: 10.1117/12.732557
Proc. SPIE 6704, Precision tiltmeter as a reference for slope measuring instruments, 670409 (20 September 2007); doi: 10.1117/12.732610
Proc. SPIE 6704, Proposal for a universal test mirror for characterization of slope measuring instruments, 67040A (20 September 2007); doi: 10.1117/12.732719
Session 3
Proc. SPIE 6704, Second metrology round-robin of APS, ESRF and SPring-8 laboratories of elliptical and spherical hard-x-ray mirrors, 67040B (27 September 2007); doi: 10.1117/12.736171
Proc. SPIE 6704, Comparison of slope and height profiles for flat synchrotron x-ray mirrors measured with a long trace profiler and a PMI Fizeau interferometer, 67040C (20 September 2007); doi: 10.1117/12.734816
Proc. SPIE 6704, Surface gradient integrated profiler for x-ray and EUV optics: self calibration method of measured position for an off-axis parabolic mirror (f=150mm) measurement, 67040D (20 September 2007); doi: 10.1117/12.735973
Proc. SPIE 6704, Progress in the x-ray optics and metrology lab at Diamond Light Source, 67040E (20 September 2007); doi: 10.1117/12.737843
Session 4
Proc. SPIE 6704, Recent developments on the Daresbury Laboratory long trace profiler, 67040F (20 September 2007); doi: 10.1117/12.733762
Proc. SPIE 6704, New procedures for the adjustment of elliptically bent mirrors with the long trace profiler, 67040G (20 September 2007); doi: 10.1117/12.736860
Proc. SPIE 6704, Systematic error reduction: non-tilted reference beam method for long trace profiler, 67040I (2 October 2007); doi: 10.1117/12.740440
Proc. SPIE 6704, Flat-field calibration of CCD detector for long trace profiler, 67040J (20 September 2007); doi: 10.1117/12.732618
Back to Top