PROCEEDINGS VOLUME 6816
ELECTRONIC IMAGING | 27-31 JANUARY 2008
Sensors, Cameras, and Systems for Industrial/Scientific Applications IX
IN THIS VOLUME

0 Sessions, 24 Papers, 0 Presentations
Front Matter  (1)
Sensors I  (6)
Modeling  (5)
Sensors II  (3)
Proceedings Volume 6816 is from: Logo
ELECTRONIC IMAGING
27-31 January 2008
San Jose, California, United States
Front Matter
Proc. SPIE 6816, Front Matter: Volume 6816, 681601 (19 March 2008); doi: 10.1117/12.787664
Sensors I
Proc. SPIE 6816, A wide dynamic range CMOS image sensor with an adjustable logarithmic response, 681602 (21 February 2008); doi: 10.1117/12.760394
Proc. SPIE 6816, Methods to extend the dynamic range of snapshot active pixel sensors, 681603 (29 February 2008); doi: 10.1117/12.761600
Proc. SPIE 6816, A low-noise wide dynamic range CMOS image sensor with low and high temperatures resistance, 681604 (29 February 2008); doi: 10.1117/12.765871
Proc. SPIE 6816, A linear response 200-dB dynamic range CMOS image sensor with multiple voltage and current readout operations, 681605 (29 February 2008); doi: 10.1117/12.767109
Proc. SPIE 6816, A wide dynamic range CMOS image sensor with dual charge storage in a pixel and a multiple sampling technique, 681606 (29 February 2008); doi: 10.1117/12.767252
Proc. SPIE 6816, Ionizing radiation effects on CMOS imagers manufactured in deep submicron process, 681607 (29 February 2008); doi: 10.1117/12.767484
Modeling
Proc. SPIE 6816, FDTD-based optical simulations methodology for CMOS image sensor pixels architecture and process optimization, 681609 (29 February 2008); doi: 10.1117/12.766391
Proc. SPIE 6816, Characterization of pixel defect development during digital imager lifetime, 68160A (19 March 2008); doi: 10.1117/12.767011
Proc. SPIE 6816, Measurements of dark current in a CCD imager during light exposures, 68160B (4 March 2008); doi: 10.1117/12.769082
Proc. SPIE 6816, Dark current measurements in a CMOS imager, 68160C (29 February 2008); doi: 10.1117/12.769079
Proc. SPIE 6816, Noise calculation model and analysis of high-gain readout circuits for CMOS image sensors, 68160D (29 February 2008); doi: 10.1117/12.777641
Applications I
Proc. SPIE 6816, An automated system for performance assessment of airport lighting, 68160E (29 February 2008); doi: 10.1117/12.760423
Proc. SPIE 6816, Integrated daylight harvesting and occupancy detection using digital imaging, 68160F (29 February 2008); doi: 10.1117/12.765961
Proc. SPIE 6816, Image formation in metamirror channel structures, 68160H (29 February 2008); doi: 10.1117/12.766289
Proc. SPIE 6816, Diffusion dark current in CCDs and CMOS image sensors, 68160I (29 February 2008); doi: 10.1117/12.787729
Applications II
Proc. SPIE 6816, Reference beam method for source modulated Hadamard multiplexing, 68160J (29 February 2008); doi: 10.1117/12.766063
Proc. SPIE 6816, Continuously trackable PIV (particle image velocimetry) with correlation image sensor, 68160L (29 February 2008); doi: 10.1117/12.766926
Proc. SPIE 6816, Adaptive optical flow detection using correlation image sensor and frequency-tuned complex-sinusoidal reference signals, 68160M (29 February 2008); doi: 10.1117/12.767141
Proc. SPIE 6816, A new adaptive image fusion technique for IKONOS satellite imagery, 68160N (29 February 2008); doi: 10.1117/12.766401
Sensors II
Proc. SPIE 6816, Mitigating polarization effects in on-die diffractive optics for a CMOS image sensor, 68160Q (29 February 2008); doi: 10.1117/12.765927
Proc. SPIE 6816, A 800(H) x 600(V) high sensitivity and high full well capacity CMOS image sensor with active pixel readout feedback operation, 68160R (29 February 2008); doi: 10.1117/12.766027
Proc. SPIE 6816, Auto-adaptative LSB technique for in-pixel analog to digital conversion, 68160S (29 February 2008); doi: 10.1117/12.782525
Interactive Paper and Symposium Demonstration Session
Proc. SPIE 6816, In vivo microscopic x-ray imaging in rat and mouse using synchrotron radiation, 68160U (29 February 2008); doi: 10.1117/12.765828
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