Proceedings Volume 7063 is from: Logo
OPTICAL ENGINEERING + APPLICATIONS
10-14 August 2008
San Diego, California, United States
Front Matter
Proc. SPIE 7063, Front Matter: Volume 7063, 706301 (11 August 2008); doi: 10.1117/12.807652
On the Fringe
Proc. SPIE 7063, It's a (meta)material world! The final frontier?, 706302 (11 August 2008); doi: 10.1117/12.798167
Proc. SPIE 7063, Coarse frequency comb interferometry, 706304 (11 August 2008); doi: 10.1117/12.793221
Proc. SPIE 7063, Generalized quantitative approach to two-beam fringe visibility (coherence) with different polarizations and frequencies, 706305 (11 August 2008); doi: 10.1117/12.793747
Spatial and Shearing Techniques
Proc. SPIE 7063, Spatially phase-shifted digital speckle pattern interferometry (SPS-DSPI) and cryogenic structures: recent improvements, 706306 (11 August 2008); doi: 10.1117/12.797467
Proc. SPIE 7063, Instantaneous phase-shift Fizeau interferometer utilizing a synchronous frequency shift mechanism, 706307 (11 August 2008); doi: 10.1117/12.794864
Proc. SPIE 7063, Development of a multi-component shearography instrument for surface strain measurement on dynamic objects, 706308 (11 August 2008); doi: 10.1117/12.796273
Proc. SPIE 7063, Optical wavefront sensor based on sub-wavelength metallic structures, 706309 (11 August 2008); doi: 10.1117/12.795082
Speckle and Unwrapping Techniques
Proc. SPIE 7063, A dynamic in-plane deformation measurement using virtual speckle patterns, 70630A (11 August 2008); doi: 10.1117/12.791982
Proc. SPIE 7063, The spatial degree of polarization and the first-order statistical properties of polarization speckle, 70630B (11 August 2008); doi: 10.1117/12.792843
Proc. SPIE 7063, Lockin-speckle-interferometry for non-destructive testing, 70630C (11 August 2008); doi: 10.1117/12.794650
Proc. SPIE 7063, Denoising of digital speckle pattern interferometry fringes by means of Bidimensional Empirical Mode Decomposition, 70630D (11 August 2008); doi: 10.1117/12.786372
Proc. SPIE 7063, Filtering-based phase unwrapping, 70630E (11 August 2008); doi: 10.1117/12.797390
Digital Holography and Heterodyne Techniques
Proc. SPIE 7063, Investigations and improvements of digital holographic tomography applied for 3D studies of transmissive photonics microelements, 70630F (11 August 2008); doi: 10.1117/12.798314
Proc. SPIE 7063, Strain distribution measurement by digital holographic interferometry using three spherical waves, 70630G (11 August 2008); doi: 10.1117/12.798316
Proc. SPIE 7063, Modeling and optical characterization of vibrating micro- and nanostructures, 70630H (11 August 2008); doi: 10.1117/12.795061
Proc. SPIE 7063, Real-time vibration amplitude and phase imaging with heterodyne interferometry and correlation image sensor, 70630I (11 August 2008); doi: 10.1117/12.794168
Proc. SPIE 7063, Laser confocal feedback profilometry, 70630J (11 August 2008); doi: 10.1117/12.792752
Phase Analysis and Fringe Projection Techniques
Proc. SPIE 7063, New algorithms and error analysis for sinusoidal phase shifting interferometry, 70630K (11 August 2008); doi: 10.1117/12.795346
Proc. SPIE 7063, Iterative algorithm for phase shifting interferometry with finite bandwidth illumination, 70630L (11 August 2008); doi: 10.1117/12.797473
Proc. SPIE 7063, Simultaneous geometry and color texture acquisition using a single-chip color camera, 70630M (11 August 2008); doi: 10.1117/12.792003
Proc. SPIE 7063, Shape and colour measurement of colourful objects by fringe projection, 70630N (11 August 2008); doi: 10.1117/12.794561
Proc. SPIE 7063, Moiré topography using a liquid-crystal-grating based frequency modulation technique, 70630O (11 August 2008); doi: 10.1117/12.798147
Thickness Measurement
Proc. SPIE 7063, Fizeau interferometer for quasi parallel optical plate testing, 70630P (11 August 2008); doi: 10.1117/12.794488
Proc. SPIE 7063, Angle-resolved reflectometer for thickness measurement of multi-layered thin-film structures, 70630Q (11 August 2008); doi: 10.1117/12.797523
Proc. SPIE 7063, Uncertainty analysis on the absolute thickness of a cavity using a commercial wavelength scanning interferometer, 70630R (11 August 2008); doi: 10.1117/12.793772
Proc. SPIE 7063, Measurement of absolute optical thickness distribution of a mask-glass by wavelength tuning interferometry, 70630S (11 August 2008); doi: 10.1117/12.797594
Multi Wavelength Interferometry
Proc. SPIE 7063, Dual frequency sweeping interferometry with range-invariant accuracy for absolute distance metrology, 70630T (11 August 2008); doi: 10.1117/12.794620
Proc. SPIE 7063, Micro Fabry-Perot sensor for surface measurement, 70630U (11 August 2008); doi: 10.1117/12.798135
Proc. SPIE 7063, Optimum wavelength selection for the method of excess fractions, 70630V (11 August 2008); doi: 10.1117/12.795211
Proc. SPIE 7063, Multiple wavelength interferometry for surface profiling, 70630W (11 August 2008); doi: 10.1117/12.793571
Proc. SPIE 7063, A hybrid technique for ultra-high dynamic range interferometry, 70630X (11 August 2008); doi: 10.1117/12.795293
Complex Structures and Ultra Short Pulse Measurement
Proc. SPIE 7063, Surface profile detection of nanostructures using a Mueller matrix polarimeter, 70630Y (11 August 2008); doi: 10.1117/12.798143
Proc. SPIE 7063, 3D profilometer employing white-light interferometry for microstructures with large-bevel inclines in brightness-enhanced films, 70630Z (11 August 2008); doi: 10.1117/12.797595
Proc. SPIE 7063, Surface metrology of silicon wafers using a femtosecond pulse laser, 706310 (11 August 2008); doi: 10.1117/12.797040
Proc. SPIE 7063, Noncollinear autocorrelation with radially symmetric nondiffracting beams, 706311 (11 August 2008); doi: 10.1117/12.792731
Testing of Aspheric Surfaces
Proc. SPIE 7063, Testing of a diamond-turned off-axis parabolic mirror, 706312 (11 August 2008); doi: 10.1117/12.793510
Proc. SPIE 7063, Distortion mapping correction in aspheric null testing, 706313 (11 August 2008); doi: 10.1117/12.798151
Proc. SPIE 7063, Interferometric null test of a parabolic reflector generating a Hertzian dipole field, 706314 (11 August 2008); doi: 10.1117/12.797423
Proc. SPIE 7063, Optical testing by means of one-dimensional interferograms performed with a point-diffraction interferometer, 706315 (11 August 2008); doi: 10.1117/12.795582
Testing of Aspheric Surfaces and Wavefront Collimation
Proc. SPIE 7063, Stitching of off-axis sub-aperture null measurements of an aspheric surface, 706316 (11 August 2008); doi: 10.1117/12.795094
Proc. SPIE 7063, Measurements of aspheric surfaces, 706317 (11 August 2008); doi: 10.1117/12.804731
Proc. SPIE 7063, Wide dynamic beam size range lateral-shear interferometer, 706318 (11 August 2008); doi: 10.1117/12.794604
Poster Session
Proc. SPIE 7063, Interferometer design for optical stochastic cooling demonstration at Bates, 706319 (11 August 2008); doi: 10.1117/12.795064
Proc. SPIE 7063, Optical heterodyne laser encoder for in-plane nanopositioning, 70631A (11 August 2008); doi: 10.1117/12.793710
Proc. SPIE 7063, Temporal phase detection of interferograms without frequency carrier, 70631B (11 August 2008); doi: 10.1117/12.793785
Proc. SPIE 7063, Spatial coherence wavelets and the phase-space representation of holography, 70631C (11 August 2008); doi: 10.1117/12.797567
Proc. SPIE 7063, Method for distant diagnostics of layered media inner structure, 70631D (11 August 2008); doi: 10.1117/12.796514
Proc. SPIE 7063, Dynamic measurement of strain in test specimen by fringe projection, 70631E (11 August 2008); doi: 10.1117/12.798278
Proc. SPIE 7063, An ESPI technique based on panoramic interferometry with paraboloid mirrors, 70631F (11 August 2008); doi: 10.1117/12.802547
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