PROCEEDINGS VOLUME 7064
OPTICAL ENGINEERING + APPLICATIONS | 10-14 AUGUST 2008
Interferometry XIV: Applications
Proceedings Volume 7064 is from: Logo
OPTICAL ENGINEERING + APPLICATIONS
10-14 August 2008
San Diego, California, United States
Front Matter
Proc. SPIE 7064, Front Matter: Volume 7064, 706401 (11 August 2008); doi: 10.1117/12.807461
Measurement of Dynamic Processes
Proc. SPIE 7064, Twymann Green interferometry in study of AlN material as an actuation layer in MEMS, 706402 (11 August 2008); doi: 10.1117/12.796072
Proc. SPIE 7064, Phase-shift Fizeau interferometer in presence of vibration, 706403 (11 August 2008); doi: 10.1117/12.794031
Proc. SPIE 7064, Interferometric characterization of pyroelectrically activated micro-arrays of liquid lenses in lithium niobate crystals, 706404 (11 August 2008); doi: 10.1117/12.796076
Proc. SPIE 7064, Vibration insensitive 3D-profilometry: a new type of white light interferometric microscopy, 706405 (11 August 2008); doi: 10.1117/12.797431
Precision Measurements for Industry
Proc. SPIE 7064, Application of interferometry for evaluation of the effect of contact lens material on tear film quality, 706407 (11 August 2008); doi: 10.1117/12.797674
Proc. SPIE 7064, Recurrence quantification analysis applied to sequential speckle images of machined surface for detection of chatter in turning, 706408 (11 August 2008); doi: 10.1117/12.795777
Proc. SPIE 7064, Permutation entropy based speckle analysis in metal cutting, 706409 (11 August 2008); doi: 10.1117/12.795907
Proc. SPIE 7064, Integrated quantum efficiency, reflectance, topography and stress metrology for solar cell manufacturing, 70640A (11 August 2008); doi: 10.1117/12.797541
Proc. SPIE 7064, Applications of a white light interferometer for wear measurement of cylinders, 70640B (11 August 2008); doi: 10.1117/12.796058
High Accuracy Optical Element Measurements
Proc. SPIE 7064, Measuring the phase transfer function of a phase-shifting interferometer, 70640C (11 August 2008); doi: 10.1117/12.795243
Proc. SPIE 7064, The manufacturing and testing of an unrotational-symmetric SiC mirror, 70640D (11 August 2008); doi: 10.1117/12.794022
Proc. SPIE 7064, Fabrication and testing of a high-precision concave spherical mirror, 70640E (11 August 2008); doi: 10.1117/12.793522
Proc. SPIE 7064, Phase error correction in wavefront curvature sensing via phase retrieval, 70640F (11 August 2008); doi: 10.1117/12.795852
Proc. SPIE 7064, SIM Planet Quest Lite Interferometer Guide 2 Telescope pointing control system, 70640G (11 August 2008); doi: 10.1117/12.796213
Measurement Through Transmissive Media
Proc. SPIE 7064, Tomographic studies of 3D refractive index and birefringence distribution in M-O elements replicated by hot embossing technology, 70640H (11 August 2008); doi: 10.1117/12.798318
Proc. SPIE 7064, Transparent film profiling and analysis by interference microscopy, 70640I (11 August 2008); doi: 10.1117/12.794936
Micro- and Nano-metrology
Proc. SPIE 7064, Automatic three-dimensional localization of micro-particles using digital holographic microscopy, 70640K (11 August 2008); doi: 10.1117/12.799852
Proc. SPIE 7064, Uncertainty consideration of the mirror-interferometer system in nanopositioning and nanomeasuring machines, 70640L (11 August 2008); doi: 10.1117/12.797058
Proc. SPIE 7064, Scene-based wavefront correction with spatial light modulators, 70640M (11 August 2008); doi: 10.1117/12.794860
Proc. SPIE 7064, Multi-wavelength interferometer for high accuracy measurement of long gauge blocks, 70640N (11 August 2008); doi: 10.1117/12.794871
Proc. SPIE 7064, Interferometric method for in-situ monitoring of fiber insertion in 2D fiber connectors fabricated through Deep Proton Writing, 70640O (11 August 2008); doi: 10.1117/12.794883
Poster Session
Proc. SPIE 7064, Accurately measuring a surface by using a computer-generated hologram, 70640P (11 August 2008); doi: 10.1117/12.793597
Proc. SPIE 7064, Toward automated forensic fracture matching of snap-off blade knives, 70640Q (11 August 2008); doi: 10.1117/12.794893
Proc. SPIE 7064, A sensing system for monitoring the thickness of thin films by spectrum analysis of white-light interference, 70640R (11 August 2008); doi: 10.1117/12.793269
Proc. SPIE 7064, Far-infrared Fizeau interferometer for large aspheric mirror, 70640S (11 August 2008); doi: 10.1117/12.794415
Proc. SPIE 7064, A simple method for measuring the small displacements, 70640V (11 August 2008); doi: 10.1117/12.798201
Proc. SPIE 7064, Interferometric analysis of the ablation profile in refractive surgery, 70640W (11 August 2008); doi: 10.1117/12.795501
Proc. SPIE 7064, Interference: dark rays description, 70640X (11 August 2008); doi: 10.1117/12.797566
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