PROCEEDINGS VOLUME 7065
OPTICAL ENGINEERING + APPLICATIONS | 10-14 AUGUST 2008
Reflection, Scattering, and Diffraction from Surfaces
Proceedings Volume 7065 is from: Logo
OPTICAL ENGINEERING + APPLICATIONS
10-14 August 2008
San Diego, California, United States
Front Matter
Proc. SPIE 7065, Front Matter: Volume 7065, 706501 (23 September 2008); doi: 10.1117/12.806360
Theory and Analysis I
Proc. SPIE 7065, Reduced Rayleigh equations in the scattering of s-polarized light from and its transmission through a film with two one-dimensional rough surfaces, 706505 (29 August 2008); doi: 10.1117/12.813443
Proc. SPIE 7065, The design of random surfaces that produce nonstandard refraction of light, 706506 (29 August 2008); doi: 10.1117/12.796093
Instruments and Applications I
Proc. SPIE 7065, Utilization of the Scheimpflug-principle in scatterometer design, 706507 (29 August 2008); doi: 10.1117/12.794939
Proc. SPIE 7065, Variable-angle directional emissometer for moderate-temperature emissivity measurements, 706508 (29 August 2008); doi: 10.1117/12.796507
Proc. SPIE 7065, Improved hyperspectral imagery using diffuse illumination or a polarizer, 706509 (29 August 2008); doi: 10.1117/12.791778
Theory and Analysis II
Proc. SPIE 7065, Modeling scatter in composite media, 70650B (29 August 2008); doi: 10.1117/12.792572
Proc. SPIE 7065, Goos-Haenchen effect applied for the design of Collett-Wolf beams, 70650D (29 August 2008); doi: 10.1117/12.784994
Proc. SPIE 7065, Unification of geometric and diffractive scattering from random rough surfaces, 70650E (29 August 2008); doi: 10.1117/12.793672
Instruments and Applications II
Proc. SPIE 7065, An infrared laser-based reflectometer for low reflectance measurements of samples and cavity structures, 70650F (29 August 2008); doi: 10.1117/12.796186
Proc. SPIE 7065, Controlling and measuring the polarization state of light using compound gratings and other plasmonic/photonic crystal structures and applications to polarimetric sensors, 70650G (29 August 2008); doi: 10.1117/12.794256
Proc. SPIE 7065, Rough surface scatterometry of bodies with rotational symmetry, 70650H (29 August 2008); doi: 10.1117/12.795891
Proc. SPIE 7065, A fast and accurate image-based measuring system for isotropic reflection materials, 70650I (29 August 2008); doi: 10.1117/12.793970
Optical Diagnostics I
Proc. SPIE 7065, Control of a tiny dew droplet deposited on a copper plate by scattered laser light, 70650L (29 August 2008); doi: 10.1117/12.794309
Proc. SPIE 7065, An optical accessory for absolute reflection and transmission measurements in the wavelength region from 0.24&mgr;m to 25&mgr;m, 70650M (29 August 2008); doi: 10.1117/12.796397
Tissue Optics and Drug Analysis
Proc. SPIE 7065, Scattering depolarization by a bio-medium with anisotropic bio-molecules, 70650O (29 August 2008); doi: 10.1117/12.794988
Proc. SPIE 7065, Polarization of dipole scattering by isotropic medium, 70650P (29 August 2008); doi: 10.1117/12.795048
Proc. SPIE 7065, Spatially resolved spectral imaging of pharmaceutical powders, 70650Q (29 August 2008); doi: 10.1117/12.795447
Optical Diagnostics II
Proc. SPIE 7065, Light-scattering properties of a woven shade-screen material used for daylighting and solar heat-gain control, 70650R (29 August 2008); doi: 10.1117/12.795575
Proc. SPIE 7065, Analysis of the uniqueness of an inverse grating characterization method, 70650T (29 August 2008); doi: 10.1117/12.793688
Proc. SPIE 7065, NIR reflectance method to determine moisture content in food products, 70650U (29 August 2008); doi: 10.1117/12.793267
Theory and Analysis III
Proc. SPIE 7065, Representative layer theory: describing absorption by particulate samples, 70650V (29 August 2008); doi: 10.1117/12.799241
Proc. SPIE 7065, A procedural model of reflection from random rough surfaces, 70650W (29 August 2008); doi: 10.1117/12.796142
Proc. SPIE 7065, Modeling of femtosecond pulse propagation through dense scattering media, 70650X (29 August 2008); doi: 10.1117/12.794980
Optical Diagnostics III
Proc. SPIE 7065, A comparison of optical properties between high density and low density sintered PTFE, 70650Y (29 August 2008); doi: 10.1117/12.798138
Proc. SPIE 7065, Pump probe experiment for high scattering media diagnostics, 70650Z (29 August 2008); doi: 10.1117/12.794774
Poster Session
Proc. SPIE 7065, Steel hardness and their optical properties, 706512 (29 August 2008); doi: 10.1117/12.795966
Proc. SPIE 7065, Measurement method of optical scatter using a STAR GEM as a scatterometer, 706515 (29 August 2008); doi: 10.1117/12.796599
Proc. SPIE 7065, Determining thickness of films on a curved substrate by use of ellipsometric measurement, 706516 (29 August 2008); doi: 10.1117/12.794178
Proc. SPIE 7065, Temperature fiber optic sensor using a thermosensible hydrogel, 706517 (29 August 2008); doi: 10.1117/12.798916
Proc. SPIE 7065, Optical diffraction by inhomogeneous volume objects, 706518 (29 August 2008); doi: 10.1117/12.798917
Proc. SPIE 7065, Combining CPP-ACP with fluoride: a synergistic remineralization potential of artificially demineralized enamel or not?, 70651A (29 August 2008); doi: 10.1117/12.805611
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