PROCEEDINGS VOLUME 7079
OPTICAL ENGINEERING + APPLICATIONS | 10-14 AUGUST 2008
Hard X-Ray, Gamma-Ray, and Neutron Detector Physics X
Proceedings Volume 7079 is from: Logo
OPTICAL ENGINEERING + APPLICATIONS
10-14 August 2008
San Diego, California, United States
Front Matter
Proc. SPIE 7079, Front Matter: Volume 7079, 707901 (8 October 2008); doi: 10.1117/12.815093
CZT Detectors
Proc. SPIE 7079, Spectral responses of virtual Frisch-grid CdZnTe detectors and their relation to IR microscopy and x-ray diffraction topography data, 707903 (4 September 2008); doi: 10.1117/12.796232
Proc. SPIE 7079, Reliability of pixellated CZT detector modules used for medical imaging and homeland security, 707905 (10 September 2008); doi: 10.1117/12.795252
Neutron Detectors
Proc. SPIE 7079, Designs for micro-structured semiconductor neutron detectors, 707906 (10 September 2008); doi: 10.1117/12.797477
Proc. SPIE 7079, Prospects for thermal neutron detection and imaging with the GammaTracker handheld radioisotope identifier, 707907 (4 September 2008); doi: 10.1117/12.798795
Proc. SPIE 7079, A novel solid state self-powered neutron detector, 707908 (4 September 2008); doi: 10.1117/12.797036
CZT Growth and Characterization I
Proc. SPIE 7079, Modeling the growth of CZT by the EDG process, 70790A (4 September 2008); doi: 10.1117/12.793315
Proc. SPIE 7079, Final surface treatment effect on performance of CdZnTe Frisch collar gamma-ray detectors, 70790B (4 September 2008); doi: 10.1117/12.795366
Proc. SPIE 7079, Investigation of CdZnTe crystal defects using scanning spreading resistance microscopy, 70790C (4 September 2008); doi: 10.1117/12.796253
CdTe Crystals and Detectors
Proc. SPIE 7079, Photon counting x-ray CT with 3D holograms by CdTe line sensor, 70790F (4 September 2008); doi: 10.1117/12.796908
Proc. SPIE 7079, Features of characteristics and stability of CdTe nuclear radiation detectors fabricated by laser doping technique, 70790G (4 September 2008); doi: 10.1117/12.799233
Proc. SPIE 7079, X-ray computed tomography system using a multipixel photon counter, 70790H (4 September 2008); doi: 10.1117/12.795434
Proc. SPIE 7079, Application of the dual energy technique by using a photon counting CdTe detector, 70790I (4 September 2008); doi: 10.1117/12.794634
Other Wide Bandgap Semiconductors I
Proc. SPIE 7079, Evaluation of TlBr detectors with Tl electrodes, 70790J (4 September 2008); doi: 10.1117/12.794381
Proc. SPIE 7079, Purification, crystal growth and detector performance of TlBr, 70790K (4 September 2008); doi: 10.1117/12.794838
Proc. SPIE 7079, A systematic study of mercuric iodide platelet growth in horizontal furnaces, 70790L (4 September 2008); doi: 10.1117/12.795326
Other Wide Bandgap Semiconductors II
Proc. SPIE 7079, CdMnTe crystals for x-ray and gamma-ray detection, 70790N (4 September 2008); doi: 10.1117/12.793366
Proc. SPIE 7079, Layered III-VI chalcogenide semiconductor crystals for radiation detectors, 70790O (4 September 2008); doi: 10.1117/12.796235
Proc. SPIE 7079, Unipolar charge sensing using Frisch grid technique for amorphous selenium radiation detectors, 70790P (4 September 2008); doi: 10.1117/12.796211
Proc. SPIE 7079, Theoretical studies of defect states in GaSe and GaTe, 70790Q (4 September 2008); doi: 10.1117/12.796229
CZT Growth and Characterization II
Proc. SPIE 7079, AFM characterization of laser-induced damage on CdZnTe crystal surfaces, 70790R (4 September 2008); doi: 10.1117/12.798574
Proc. SPIE 7079, Characterization of detector grade CdZnTe material from Redlen Technologies, 70790T (4 September 2008); doi: 10.1117/12.798921
Proc. SPIE 7079, Defect measurements of CdZnTe detectors using I-DLTS, TCT, I-V, C-V and gamma-ray spectroscopy, 70790U (4 September 2008); doi: 10.1117/12.797865
Scintillators
Proc. SPIE 7079, Precision crystal calorimeters in high-energy physics: past, present, and future, 70790W (4 September 2008); doi: 10.1117/12.796834
Proc. SPIE 7079, Transparent ceramic scintillator fabrication, properties, and applications, 70790X (4 September 2008); doi: 10.1117/12.797398
Proc. SPIE 7079, SrI[sub]2[/sub]: a novel scintillator crystal for nuclear isotope identifiers, 70790Y (4 September 2008); doi: 10.1117/12.798335
Imaging I
Proc. SPIE 7079, Energy-discriminating x-ray camera utilizing a cadmium telluride detector, 70790Z (4 September 2008); doi: 10.1117/12.795480
Proc. SPIE 7079, Performance of an improved readout IC for multi-energy photon-counting x-ray detector arrays, 707911 (4 September 2008); doi: 10.1117/12.795607
Proc. SPIE 7079, CdTe x-ray image sensor driven by field emitter array, 707912 (4 September 2008); doi: 10.1117/12.795654
Proc. SPIE 7079, New two-dimensional ASICs for solid state pixel detectors, 707913 (10 September 2008); doi: 10.1117/12.799392
Imaging II
Proc. SPIE 7079, A CMOS-based large-area high-resolution imaging system for high-energy x-ray applications, 707914 (5 September 2008); doi: 10.1117/12.795449
Proc. SPIE 7079, An explosives detection system for airline security using coherent x-ray scattering technology, 707915 (5 September 2008); doi: 10.1117/12.796174
Post-Deadline Papers
Proc. SPIE 7079, Strontium iodide scintillators for high energy resolution gamma ray spectroscopy, 707917 (5 September 2008); doi: 10.1117/12.806291
Poster Session
Proc. SPIE 7079, New application of scintillator ZnSe(Te) in scintielectronic detectors for detection of neutrons, medical imaging, explosive detection, and NDT, 70791A (5 September 2008); doi: 10.1117/12.794722
Proc. SPIE 7079, Dynamic characterizations of an 8-frame half-strip high-speed x-ray microchannel plate imager, 70791B (5 September 2008); doi: 10.1117/12.795720
Proc. SPIE 7079, High spatial resolution x-ray mapping of CdZnTe detectors, 70791D (5 September 2008); doi: 10.1117/12.796595
Proc. SPIE 7079, Effect of chemical etching on the surface roughness of CdZnTe and CdMnTe gamma radiation detectors, 70791E (4 September 2008); doi: 10.1117/12.796797
Proc. SPIE 7079, Performance of RENA-3 IC with position-sensitive solid-state detectors, 70791F (4 September 2008); doi: 10.1117/12.797750
Proc. SPIE 7079, Model compounds for cadmium zinc telluride (CZT) impurities, 70791G (4 September 2008); doi: 10.1117/12.798941
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