PROCEEDINGS VOLUME 7101
OPTICAL SYSTEMS DESIGN | 2-5 SEPTEMBER 2008
Advances in Optical Thin Films III
Proceedings Volume 7101 is from: Logo
OPTICAL SYSTEMS DESIGN
2-5 September 2008
Glasgow, Scotland, United Kingdom
Front Matter
Proc. SPIE 7101, Front Matter: Volume 7101, 710101 (15 October 2008); doi: 10.1117/12.817244
Optical Coatings and Design
Proc. SPIE 7101, Progress in optical coatings, 710102 (20 September 2008); doi: 10.1117/12.796001
Proc. SPIE 7101, Design principles for broadband AR coatings, 710103 (25 September 2008); doi: 10.1117/12.797708
Proc. SPIE 7101, Estimation for the number of layers of broad band anti-reflection coatings, 710104 (25 September 2008); doi: 10.1117/12.796590
Proc. SPIE 7101, 'Gedankenspektrum' methods in optical coatings, 710105 (25 September 2008); doi: 10.1117/12.797564
Proc. SPIE 7101, Frequency filtering in optical thin film design revisited, 710106 (25 September 2008); doi: 10.1117/12.797754
Deposition Processes
Proc. SPIE 7101, New plasma processes for antireflective structures on plastics, 710107 (25 September 2008); doi: 10.1117/12.796705
Proc. SPIE 7101, Closed field magnetron sputtering: new generation sputtering process for optical coatings, 710108 (25 September 2008); doi: 10.1117/12.797152
Proc. SPIE 7101, Plasma ion-assisted deposition with radio frequency powered plasma sources, 710109 (25 September 2008); doi: 10.1117/12.797818
Proc. SPIE 7101, New developments in magnetron sputter processes for precision optics, 71010B (25 September 2008); doi: 10.1117/12.797190
Monitoring
Proc. SPIE 7101, State of the art in deterministic production of optical thin films, 71010C (25 September 2008); doi: 10.1117/12.797264
Proc. SPIE 7101, All-optical in-situ monitoring of PIAD deposition processes, 71010D (25 September 2008); doi: 10.1117/12.797454
Proc. SPIE 7101, Forces in rotary motion systems, 71010E (25 September 2008); doi: 10.1117/12.797479
Proc. SPIE 7101, A method for the determination of substrate temperature during thin film coating deposition, 71010F (25 September 2008); doi: 10.1117/12.797764
Proc. SPIE 7101, Computer simulation of coating processes with monochromatic monitoring, 71010G (25 September 2008); doi: 10.1117/12.797612
Filters and Manufacturing I
Proc. SPIE 7101, Advanced optical coatings for telecom and spectroscopic applications, 71010H (25 September 2008); doi: 10.1117/12.797949
Proc. SPIE 7101, High performance notch filter coatings produced with PIAD and magnetron sputtering, 71010I (25 September 2008); doi: 10.1117/12.797699
Proc. SPIE 7101, Sputter process with time-variant reactive gas mixture for the deposition of optical multilayer and gradient layer systems, 71010J (25 September 2008); doi: 10.1117/12.797693
Proc. SPIE 7101, Optimization and characterization of transparent photocatalytic TiO2 thin films prepared by ion-assisted deposition, 71010K (25 September 2008); doi: 10.1117/12.797719
Proc. SPIE 7101, Metal fluoride coatings prepared by ion-assisted deposition, 71010L (25 September 2008); doi: 10.1117/12.797422
Filters and Manufacturing II
Proc. SPIE 7101, Toward picometer optical figuring of ultra-precision optical components using multi-aperture deposition techniques, 71010M (25 September 2008); doi: 10.1117/12.800402
Proc. SPIE 7101, Structural and electrical properties of low temperature deposited ITO films, 71010O (25 September 2008); doi: 10.1117/12.797255
Proc. SPIE 7101, Reliable production of steep edge interference filters, 71010P (25 September 2008); doi: 10.1117/12.797459
Proc. SPIE 7101, Characterization of the optical properties of hydrophobic coatings and realization of high performance AR coatings with dust- and water-repellent properties, 71010Q (25 September 2008); doi: 10.1117/12.797688
Characterisation
Proc. SPIE 7101, Measurement of optical constants of thin films by non conventional ellipsometry, photothermal deflection spectroscopy and plasmon resonance spectroscopy, 71010R (25 September 2008); doi: 10.1117/12.797660
Proc. SPIE 7101, Determination of thermal and elastic coefficients of optical thin-film materials, 71010S (25 September 2008); doi: 10.1117/12.797707
Proc. SPIE 7101, Measurement of thermal expansion coefficient and biaxial modulus of DWDM filters using phase-shift interferometer, 71010T (25 September 2008); doi: 10.1117/12.798743
Proc. SPIE 7101, Extraction of film interface surfaces from scanning white light interferometry, 71010U (25 September 2008); doi: 10.1117/12.797978
Proc. SPIE 7101, Light scattering to isolate a single interface within a multilayer, 71010V (25 September 2008); doi: 10.1117/12.797634
Proc. SPIE 7101, Characterization of the optical constants of materials from the visible to the soft x-rays, 71010W (25 September 2008); doi: 10.1117/12.797419
UV and X-ray Coatings
Proc. SPIE 7101, Coatings for next generation lithography, 71010X (25 September 2008); doi: 10.1117/12.796944
Proc. SPIE 7101, Low-loss HR coatings on fused silica substrates for 193 nm micro-lithography applications, 71010Y (25 September 2008); doi: 10.1117/12.797820
Proc. SPIE 7101, High performance EUV multilayer optics, 71010Z (25 September 2008); doi: 10.1117/12.796150
Proc. SPIE 7101, Non-periodic multilayer coatings in EUV, soft x-ray and x-ray range, 710110 (25 September 2008); doi: 10.1117/12.797156
Applications
Proc. SPIE 7101, Optical thin films on polarization preserving cube corner retroreflectors, 710112 (25 September 2008); doi: 10.1117/12.796659
Proc. SPIE 7101, Thin-film filters for a high resolution miniaturized spectrometer, 710113 (25 September 2008); doi: 10.1117/12.797286
Proc. SPIE 7101, Mid-infrared filters for astronomical and remote sensing instrumentation, 710114 (25 September 2008); doi: 10.1117/12.796635
Coatings and Lasers
Proc. SPIE 7101, Status of NIF mirror technologies for completion of the NIF facility, 710115 (25 September 2008); doi: 10.1117/12.797470
Proc. SPIE 7101, 1.5 octave dispersive dielectric multilayers for pulse compression, 710116 (25 September 2008); doi: 10.1117/12.797468
Proc. SPIE 7101, Theoretical and experimental analysis of the laser irradiation parameters influence on the LIDT of optical coatings, 710117 (25 September 2008); doi: 10.1117/12.797709
Proc. SPIE 7101, Non-destructive evaluation on optical components for high power density applications, 710118 (25 September 2008); doi: 10.1117/12.797485
Proc. SPIE 7101, Design and monitoring of narrow bandpass filters composed of non-quarter-wave thicknesses, 710119 (25 September 2008); doi: 10.1117/12.792361
Innovative Concepts
Proc. SPIE 7101, Spatial dispersion of optical thin films, 71011A (25 September 2008); doi: 10.1117/12.796688
Proc. SPIE 7101, Resonant gratings for narrow band pass filtering applications, 71011B (25 September 2008); doi: 10.1117/12.797655
Proc. SPIE 7101, Photochromic mesoporous hybrid coatings, 71011C (25 September 2008); doi: 10.1117/12.796486
Proc. SPIE 7101, Bulk-micromachined dielectric tunable optical filter realized with inductively coupled plasma chemical vapour deposition, 71011D (25 September 2008); doi: 10.1117/12.797755
Poster Session
Proc. SPIE 7101, Reactively sputtered aluminium nitride films for spectral emission control, 71011F (25 September 2008); doi: 10.1117/12.797068
Proc. SPIE 7101, Optical and structural properties of Nb<sub>x</sub>Si<sub>y</sub>O composite films prepared by metallic co-sputtering process, 71011G (25 September 2008); doi: 10.1117/12.797162
Proc. SPIE 7101, A simple system for measuring small phase retardation of an optical thin film, 71011H (26 September 2008); doi: 10.1117/12.797180
Proc. SPIE 7101, Optimizing the phase retardation caused by optical coatings, 71011I (25 September 2008); doi: 10.1117/12.797186
Proc. SPIE 7101, Metal layer beamsplitters with one dielectric achromatisation layer, 71011J (25 September 2008); doi: 10.1117/12.797295
Proc. SPIE 7101, ZnS films for infrared optical coatings: improvement of adhesion to Ge substrates, 71011K (25 September 2008); doi: 10.1117/12.797413
Proc. SPIE 7101, Next generation end hall ion source in the optical thin film production process, 71011L (25 September 2008); doi: 10.1117/12.797596
Proc. SPIE 7101, Fabrication of far infrared rib waveguides based on Te-Ge-Ga films deposited by co-thermal evaporation, 71011N (25 September 2008); doi: 10.1117/12.797643
Proc. SPIE 7101, Synthesis and study of structure and nonlinear optical properties of silicon carbide nanocrystal films, 71011O (25 September 2008); doi: 10.1117/12.797627
Proc. SPIE 7101, AZO films prepared by r.f. magnetron sputtering: structural, electrical, and optical properties, 71011Q (25 September 2008); doi: 10.1117/12.797665
Proc. SPIE 7101, Laser induced fluorescence and absorption measurements for DUV optical thin film characterization, 71011R (26 September 2008); doi: 10.1117/12.797676
Proc. SPIE 7101, Nonlinear refraction of gold island films, 71011S (25 September 2008); doi: 10.1117/12.797677