PROCEEDINGS VOLUME 7132
BOULDER DAMAGE SYMPOSIUM XL ANNUAL SYMPOSIUM ON OPTICAL MATERIALS FOR HIGH POWER LASERS | 22-24 SEPTEMBER 2008
Laser-Induced Damage in Optical Materials: 2008
IN THIS VOLUME

0 Sessions, 62 Papers, 0 Presentations
Thin Film  (12)
Front Matter  (1)
Proceedings Volume 7132 is from: Logo
BOULDER DAMAGE SYMPOSIUM XL ANNUAL SYMPOSIUM ON OPTICAL MATERIALS FOR HIGH POWER LASERS
22-24 September 2008
Boulder, Colorado, United States
Fundamental Mechanisms
Proc. SPIE 7132, 40 year retrospective of fundamental mechanisms, 713201 (30 December 2008); doi: 10.1117/12.804556
Proc. SPIE 7132, Fundamental mechanisms of laser-induced damage in optical materials: understanding after 40 years of research, 713202 (30 December 2008); doi: 10.1117/12.805478
Proc. SPIE 7132, The effect of pseudo-accumulation in the measurement of fatigue laser-induced damage threshold, 713203 (30 December 2008); doi: 10.1117/12.804467
Proc. SPIE 7132, Influence of the nonlinear losses on the modifications induced by femtosecond filaments in fused silica, 713204 (30 December 2008); doi: 10.1117/12.804418
Proc. SPIE 7132, Photoionization of wide bandgap silicate glasses by ultrashort IR laser pulses, 713205 (30 December 2008); doi: 10.1117/12.804984
Proc. SPIE 7132, Energy dependence of effective electron mass and laser-induced ionization of wide band-gap solids, 713206 (30 December 2008); doi: 10.1117/12.804730
Proc. SPIE 7132, Laser damage of transparent dielectrics ionized by intensive ultrashort pulses, 713207 (7 January 2009); doi: 10.1117/12.804135
Proc. SPIE 7132, Ejection of glass rings during tightly focused femtosecond laser damage at a glass surface, 713208 (30 December 2008); doi: 10.1117/12.804154
Proc. SPIE 7132, The role of native and photoinduced defects in the multi-pulse subpicosecond damage behavior of oxide films, 713209 (30 December 2008); doi: 10.1117/12.804430
Proc. SPIE 7132, Effect of the temporal pulse duration on the initiation of damage sites on fused silica surfaces, 71320A (30 December 2008); doi: 10.1117/12.804411
Thin Film
Proc. SPIE 7132, BDS thin film damage competition, 71320C (30 December 2008); doi: 10.1117/12.806287
Proc. SPIE 7132, Pulse compression gratings for the PETAL project: a review of various technologies, 71320D (7 January 2009); doi: 10.1117/12.804413
Proc. SPIE 7132, Low stress ion-assisted coatings on fused silica substrates for large aperture laser pulse compression gratings, 71320E (30 December 2008); doi: 10.1117/12.817336
Proc. SPIE 7132, Analysis of the air-vacuum effect in dielectric coatings, 71320F (30 December 2008); doi: 10.1117/12.804095
Proc. SPIE 7132, UV damage mechanisms in oxide high reflectors, 71320G (30 December 2008); doi: 10.1117/12.804407
Proc. SPIE 7132, Laser durability improvement of deep UV fluoride coatings, 71320H (30 December 2008); doi: 10.1117/12.804465
Proc. SPIE 7132, Influence of pre-treatment conditions on the resistivity of fluoride multilayers, 71320I (30 December 2008); doi: 10.1117/12.804463
Proc. SPIE 7132, Optimization of laser-damage resistance of evaporated hafnia films at 351nm, 71320J (30 December 2008); doi: 10.1117/12.805383
Proc. SPIE 7132, Formation of a photo-oxidized protective thin film with waterproof and high-power laser tolerance properties, 71320K (30 December 2008); doi: 10.1117/12.804435
Proc. SPIE 7132, SiO2/HfO2 multilayers: impact of process parameters and stack geometry on the optical and structural properties, 71320L (30 December 2008); doi: 10.1117/12.804434
Proc. SPIE 7132, Electron spin resonance spectroscopy investigation of ion beam sputtered HfO2 and SiO2 thin films, 71320M (30 December 2008); doi: 10.1117/12.804459
Proc. SPIE 7132, The effect of annealing on the subpicosecond breakdown behavior of hafnia films, 71320N (30 December 2008); doi: 10.1117/12.804452
Materials and Measurements
Proc. SPIE 7132, Transparent-media characterization dedicated to laser damage studies: a key task, multi-faceted, and always renewed, 71320O (30 December 2008); doi: 10.1117/12.805485
Proc. SPIE 7132, Femtosecond laser breakdown of gases and transparent solid states: ultrafast space-time and spectrum-time resolved diagnostics of multicharged microplasma, 71320P (30 December 2008); doi: 10.1117/12.804396
Proc. SPIE 7132, Time-resolved imaging of material response during laser-induced bulk damage in SiO2, 71320Q (30 December 2008); doi: 10.1117/12.804245
Proc. SPIE 7132, Laser-induced deflection (LID) technique for thermal lens evaluation and direct absorption measurements, 71320R (30 December 2008); doi: 10.1117/12.804284
Proc. SPIE 7132, TIR-based photothermal/photoacoustic deflection, 71320S (30 December 2008); doi: 10.1117/12.804092
Proc. SPIE 7132, Measuring surface deformation of optical components with surface thermal lens technique, 71320T (30 December 2008); doi: 10.1117/12.804175
Proc. SPIE 7132, Accurate high reflectivity measurement based on a novel optical feedback cavity ring-down technique, 71320U (30 December 2008); doi: 10.1117/12.804178
Proc. SPIE 7132, The HMDS coating flaw removal tool, 71320V (30 December 2008); doi: 10.1117/12.804458
Proc. SPIE 7132, System for detection of small inclusions in large optics, 71320W (30 December 2008); doi: 10.1117/12.804456
Proc. SPIE 7132, Presentation and comparison of damage test procedures for fused silica and KDP crystals, 71320X (30 December 2008); doi: 10.1117/12.804471
Proc. SPIE 7132, Statistical interpretation of S-on-1 data and the damage initiation mechanism, 71320Y (30 December 2008); doi: 10.1117/12.804422
Proc. SPIE 7132, Calculation of error bars for laser damage observations, 71320Z (30 December 2008); doi: 10.1117/12.804247
Proc. SPIE 7132, Defect classification using machine learning, 713210 (30 December 2008); doi: 10.1117/12.817418
Proc. SPIE 7132, Effect of thermal annealing on laser damage resistance of KDP at 3ω, 713211 (30 December 2008); doi: 10.1117/12.804297
Proc. SPIE 7132, Interactions between x-ray induced transient defects and pre-existing damage precursors in DKDP crystals, 713212 (30 December 2008); doi: 10.1117/12.804246
Proc. SPIE 7132, Solvent effect on optical limiting and anti-damage properties of dicyanomethylene derivatives at 1064nm, 713213 (30 December 2008); doi: 10.1117/12.804410
Proc. SPIE 7132, Comparative damage study on ytterbium-doped materials for diode-pumped high energy lasers, 713214 (30 December 2008); doi: 10.1117/12.804431
Proc. SPIE 7132, Investigation of bulk laser damage in transparent YAG ceramics controlled with microstructural refinement, 713215 (30 December 2008); doi: 10.1117/12.804416
Proc. SPIE 7132, Interaction of high-power infrared radiation with germanium, 713216 (30 December 2008); doi: 10.1117/12.816611
Proc. SPIE 7132, Reliability of multi-stripe laser arrays, 713217 (7 January 2009); doi: 10.1117/12.804483
Proc. SPIE 7132, Measurement of laser power resistance of fibers for PIV systems, 713219 (30 December 2008); doi: 10.1117/12.804696
Proc. SPIE 7132, Investigation in the degradation of CaF2 outcouplers in excimer lasers operating at 193nm, 71321A (30 December 2008); doi: 10.1117/12.804428
Mini-Symposium: Damage to Fused Silica
Proc. SPIE 7132, Fracture related initiation and growth of surface laser damage in fused silica, 71321B (30 December 2008); doi: 10.1117/12.804419
Proc. SPIE 7132, Using shaped pulses to probe energy deposition during laser-induced damage of SiO2 surfaces, 71321C (30 December 2008); doi: 10.1117/12.804460
Proc. SPIE 7132, Picosecond-nanosecond bulk damage of fused silica at 1064nm, 71321E (30 December 2008); doi: 10.1117/12.804129
Proc. SPIE 7132, Photothermal measurement of absorption and wavefront deformations in fused silica, 71321F (30 December 2008); doi: 10.1117/12.804565
Proc. SPIE 7132, Accelerated life time testing of fused silica upon ArF laser irradiation, 71321G (30 December 2008); doi: 10.1117/12.804286
Proc. SPIE 7132, Laser damage growth in fused silica with simultaneous 351nm and 1053nm irradiation, 71321H (30 December 2008); doi: 10.1117/12.804432
Proc. SPIE 7132, Optimizing fused silica polishing processes for 351nm high-power laser application, 71321I (30 December 2008); doi: 10.1117/12.804414
Surfaces, Mirrors, and Contamination
Proc. SPIE 7132, Laser-induced surface damage of optical materials: absorption sources, initiation, growth, and mitigation, 71321J (30 December 2008); doi: 10.1117/12.804499
Proc. SPIE 7132, Laser damage threshold measurements of microstructure-based high reflectors, 71321K (30 December 2008); doi: 10.1117/12.804397
Proc. SPIE 7132, Growth mechanisms for laser induced contamination on space optics in vacuum, 71321L (30 December 2008); doi: 10.1117/12.804423
Proc. SPIE 7132, Increased laser damage threshold by protecting and cleaning optics using first contact polymer stripcoatings: preliminary data, 71321M (30 December 2008); doi: 10.1117/12.804018
Proc. SPIE 7132, Laser-based cleaning methods for optics and electronics, 71321N (30 December 2008); doi: 10.1117/12.804334
Proc. SPIE 7132, Short pulse laser damage testing on nitrocellulose and polyimide thin films in vacuum with application to laser debris shields, 71321O (30 December 2008); doi: 10.1117/12.803825