Front Matter
Proc. SPIE 7155, Front Matter: Volume 7155, 715501 (7 October 2008); doi: 10.1117/12.817278
Keynote Presentations
Proc. SPIE 7155, Some answers to new challenges in optical metrology, 715503 (3 October 2008); doi: 10.1117/12.814687
Invited Presentations
Proc. SPIE 7155, Hardware-based error compensation in 3D optical metrology systems, 715505 (3 October 2008); doi: 10.1117/12.814693
Proc. SPIE 7155, Characterization of optical surfaces for the present generations of synchrotron sources, 715506 (3 October 2008); doi: 10.1117/12.814695
Holographic and Speckle Technology I
Proc. SPIE 7155, Enhanced resolution methods in shearography and holography for time-average vibration measurement, 715508 (3 October 2008); doi: 10.1117/12.814697
Proc. SPIE 7155, Characterisation of laser marks using digital holographic microscopy, 715509 (3 October 2008); doi: 10.1117/12.814729
Proc. SPIE 7155, Structure measurement of phase grating on post-magnification digital micro-holography, 71550A (3 October 2008); doi: 10.1117/12.814508
Proc. SPIE 7155, Comparison of digital holographic microscope and confocal microscope methods for characterization of micro-optical diffractive components, 71550B (3 October 2008); doi: 10.1117/12.814509
Proc. SPIE 7155, Reduction of speckle noise by multi-kinoforms in holographic three-dimensional display, 71550C (3 October 2008); doi: 10.1117/12.814510
Proc. SPIE 7155, Deformation analysis on micro objects using multiple wavelength microscopic TV holography, 71550D (3 October 2008); doi: 10.1117/12.814511
NDT Evaluation I
Proc. SPIE 7155, Applications of laser ultrasound NDT methods on composite structures in aerospace industry, 71550E (3 October 2008); doi: 10.1117/12.814512
Proc. SPIE 7155, Experimental study of unconveniant static and dynamic deformations of piezoelectric actuators, 71550F (3 October 2008); doi: 10.1117/12.814513
Proc. SPIE 7155, Long-term reliability measurements on MEMS using a laser-Doppler vibrometer, 71550G (3 October 2008); doi: 10.1117/12.814515
Proc. SPIE 7155, Defect inspection by an active 3D multiresolution technique, 71550H (3 October 2008); doi: 10.1117/12.814516
Micro-Nano Metrology
Proc. SPIE 7155, Development of a metrological atomic force microscope for nano-scale standards calibration, 71550I (3 October 2008); doi: 10.1117/12.814517
Proc. SPIE 7155, In-situ evaluation of nanoparticle diameter for visualizing self-assembly process, 71550J (3 October 2008); doi: 10.1117/12.814518
Proc. SPIE 7155, Evaluation on the probing error of a micro-coordinate measuring machine, 71550K (3 October 2008); doi: 10.1117/12.814519
Proc. SPIE 7155, High-resolution interferometry with Nd:YAG laser for local probe microscopy, 71550L (3 October 2008); doi: 10.1117/12.814520
Image Processing
Proc. SPIE 7155, High throughput measurement techniques for wafer level yield inspection of MEMS devices, 71550M (3 October 2008); doi: 10.1117/12.814724
Proc. SPIE 7155, Frequency-shifting method for phase retrieval from fringe patterns, 71550N (3 October 2008); doi: 10.1117/12.814522
Proc. SPIE 7155, Fast auto-focusing based on partial image characteristics, 71550O (3 October 2008); doi: 10.1117/12.814523
Proc. SPIE 7155, Inspection method for directional texture defects on steel strip surface, 71550P (3 October 2008); doi: 10.1117/12.814524
Proc. SPIE 7155, General structure for real-time fringe pattern preprocessing and implementation of median filter and average filter on FPGA, 71550Q (3 October 2008); doi: 10.1117/12.814525
Interferometric and Diffractive Methods I
Proc. SPIE 7155, Phase measurement via in-line digital holographic microscopy, 71550R (3 October 2008); doi: 10.1117/12.814526
Proc. SPIE 7155, Random-phase-shift Fizeau interferometer, 71550S (3 October 2008); doi: 10.1117/12.814528
Proc. SPIE 7155, Faster window Fourier transform filters for fringe pattern analysis, 71550T (3 October 2008); doi: 10.1117/12.814529
Proc. SPIE 7155, Application of plate vibration and DSPI in evaluation of elastic modulus, 71550U (3 October 2008); doi: 10.1117/12.814530
Special Session: High Resolution Metrology
Proc. SPIE 7155, Optical metrology of micro- and nanostructures at PTB: status and future developments, 71550V (3 October 2008); doi: 10.1117/12.814531
Proc. SPIE 7155, Influence of line edge roughness (LER) on angular resolved and on spectroscopic scatterometry, 71550W (3 October 2008); doi: 10.1117/12.814532
Proc. SPIE 7155, Detection and active stabilization of beams position at a high-resolution laser interferometer, 71550X (3 October 2008); doi: 10.1117/12.814533
Proc. SPIE 7155, Model-free and model-based methods for dimensional metrology during the lifetime of a product, 71550Y (3 October 2008); doi: 10.1117/12.814534
Proc. SPIE 7155, Determination of flatness on patterned wafer surfaces using wavefront sensing methods, 71550Z (3 October 2008); doi: 10.1117/12.814535
Photoelasticity and Birefringence Technology
Proc. SPIE 7155, New simplified measuring method for distributed low-level birefringence, 715510 (3 October 2008); doi: 10.1117/12.814536
Proc. SPIE 7155, Phase shift polarimetry for non-invasive detection of laser-induced damage, 715511 (3 October 2008); doi: 10.1117/12.814537
Proc. SPIE 7155, Residual stress in silicon wafer using IR polariscope, 715512 (3 October 2008); doi: 10.1117/12.814538
Shape Measurement Reverse Engineering
Proc. SPIE 7155, Absolute and dynamic position and shape measurement of fast moving objects employing novel laser Doppler techniques, 715513 (3 October 2008); doi: 10.1117/12.814539
Proc. SPIE 7155, An endoscopic optical system for inner cylindrical measurement using fringe projection, 715514 (3 October 2008); doi: 10.1117/12.814540
Proc. SPIE 7155, Surface measurement with Shack-Hartmann wavefront sensing technology, 715515 (3 October 2008); doi: 10.1117/12.814541
Proc. SPIE 7155, A simple method to estimate surface reflectance parameters for three light photometric stereo, 715516 (3 October 2008); doi: 10.1117/12.814542
Proc. SPIE 7155, A low-cost antenna reflector shape and distortion measuring system with high accuracy, 715517 (3 October 2008); doi: 10.1117/12.814543
Interferometric and Diffractive Methods II
Proc. SPIE 7155, The comparison of different temporal phase analysis algorithms in optical dynamic measurement, 715518 (3 October 2008); doi: 10.1117/12.814544
Proc. SPIE 7155, A polarization sensitive interferometer for stress analysis, 715519 (3 October 2008); doi: 10.1117/12.814545
Proc. SPIE 7155, A double-prism lateral shear interferometer for wavefront analysis and collimation testing, 71551A (3 October 2008); doi: 10.1117/12.814546
Proc. SPIE 7155, A cube splitter interferometer for phase shifting interferometry and birefringence analysis, 71551B (3 October 2008); doi: 10.1117/12.814547
Proc. SPIE 7155, Model building and measurement of the temporal noise for thermal infrared imager, 71551C (3 October 2008); doi: 10.1117/12.814548
Dimensional Measurements
Proc. SPIE 7155, Speckle noise suppression in shape and deformation measurements by phase-shifting digital holography, 71551D (3 October 2008); doi: 10.1117/12.814549
Proc. SPIE 7155, A hybrid x-ray and microscopy method for diametrical profile measurement of internal holes in steel components, 71551E (3 October 2008); doi: 10.1117/12.814550
Proc. SPIE 7155, Full-field swept-source optical coherence tomography with Gaussian spectral shaping, 71551F (3 October 2008); doi: 10.1117/12.814551
Proc. SPIE 7155, Phase shifting interferograms processing for fiber point-diffraction interferometer, 71551G (3 October 2008); doi: 10.1117/12.814552
Proc. SPIE 7155, Study on a new method for measuring volumetric error of CMM, 71551H (3 October 2008); doi: 10.1117/12.814553
Holographic and Speckle Technology II
Proc. SPIE 7155, Phase retrieval in digital holographic interferometry based on complex phasor and short time Fourier transform, 71551I (3 October 2008); doi: 10.1117/12.814555
Proc. SPIE 7155, Power loss due to beam splitter cascade in the simultaneous sampling of a volume speckle field for phase retrieval, 71551J (3 October 2008); doi: 10.1117/12.814556
Proc. SPIE 7155, On-line digital holographic measurement of size and shape of microparticles for crystallization processes, 71551K (3 October 2008); doi: 10.1117/12.814557
Proc. SPIE 7155, Reduction of speckle noise in digital holographic images using wavelet transform, 71551L (3 October 2008); doi: 10.1117/12.814558
NDT Evaluation II
Proc. SPIE 7155, The characterization of the double fiber Bragg grating fiber ring laser and its applications in a real time fiber sensing system, 71551M (3 October 2008); doi: 10.1117/12.814559
Proc. SPIE 7155, NDT detection and quantification of induced defects on composite helicopter rotor blade and UAV wing sections, 71551N (3 October 2008); doi: 10.1117/12.814560
Proc. SPIE 7155, Development of an inexpensive optical method for studies of dental erosion process in vitro, 71551O (3 October 2008); doi: 10.1117/12.814561
Proc. SPIE 7155, Modeling of coupling coefficient as a function of coupling ratio, 71551P (3 October 2008); doi: 10.1117/12.814562