PROCEEDINGS VOLUME 7210
SPIE MOEMS-MEMS: MICRO- AND NANOFABRICATION | 24-29 JANUARY 2009
Emerging Digital Micromirror Device Based Systems and Applications
Proceedings Volume 7210 is from: Logo
SPIE MOEMS-MEMS: MICRO- AND NANOFABRICATION
24-29 January 2009
San Jose, California, United States
Front Matter
Proc. SPIE 7210, Front Matter: Volume 7210, 721001 (5 March 2009); doi: 10.1117/12.828568
Photomedical Applications for Advanced Research and Improved Patient Care
Proc. SPIE 7210, Dynamic high-resolution patterning for biomedical, materials, and semiconductor research, 721002 (14 February 2009); doi: 10.1117/12.809122
Proc. SPIE 7210, Ophthalmic applications of the digital micromirror device (DMD), 721003 (14 February 2009); doi: 10.1117/12.806296
Proc. SPIE 7210, Force versus position profiles of HeLa cells trapped in phototransistor-based optoelectronic tweezers, 721004 (14 February 2009); doi: 10.1117/12.809513
Proc. SPIE 7210, Application of digital micromirror devices to vision science: shaping the spectrum of stimuli, 721005 (14 February 2009); doi: 10.1117/12.810201
Proc. SPIE 7210, DLP hyperspectral imaging for surgical and clinical utility, 721006 (14 February 2009); doi: 10.1117/12.810068
Hyperspectral Imaging and Multi-Object Sensing
Proc. SPIE 7210, Programmable matched filter and Hadamard transform hyperspectral imagers based on micromirror arrays, 721007 (14 February 2009); doi: 10.1117/12.808060
Proc. SPIE 7210, DMD-based adaptive spectral imagers for hyperspectral imagery and direct detection of spectral signatures, 721008 (14 February 2009); doi: 10.1117/12.809129
Proc. SPIE 7210, Applications of DMDs for astrophysical research, 72100A (14 February 2009); doi: 10.1117/12.809542
Proc. SPIE 7210, DMD based hyperspectral augmentation for multi-object tracking systems, 72100B (14 February 2009); doi: 10.1117/12.811551
Optical Techniques for 3D-Metrology, Calibration, and Microscopy
Proc. SPIE 7210, DLP-based 3D metrology by structured light or projected fringe technology for life sciences and industrial metrology, 72100C (14 February 2009); doi: 10.1117/12.807709
Proc. SPIE 7210, DMD diffraction measurements to support design of projectors for test and evaluation of multispectral and hyperspectral imaging sensors, 72100D (14 February 2009); doi: 10.1117/12.808990
Proc. SPIE 7210, Real-time 3D shape recording by DLP-based all-digital surface encoding, 72100E (14 February 2009); doi: 10.1117/12.807573
Proc. SPIE 7210, Optical calibration of a digital micromirror device (DMD)-based compressive imaging (CI) system, 72100F (14 February 2009); doi: 10.1117/12.807996
Proc. SPIE 7210, Compressive confocal microscopy: 3D reconstruction algorithms, 72100G (14 February 2009); doi: 10.1117/12.809438
Advanced Micromirror Projection Applications
Proc. SPIE 7210, Imaging and display applications using fast light, 72100H (14 February 2009); doi: 10.1117/12.810589
Proc. SPIE 7210, Dynamic infrared scene projectors based upon the DMD, 72100I (14 February 2009); doi: 10.1117/12.808329
Proc. SPIE 7210, Two-band DMD-based infrared scene simulator, 72100J (14 February 2009); doi: 10.1117/12.809379
Proc. SPIE 7210, Development of MOEMS technology in maskless lithography, 72100K (14 February 2009); doi: 10.1117/12.809549
Back to Top