PROCEEDINGS VOLUME 7282
AOMATT 2008 - 4TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING | 19-21 NOVEMBER 2008
4th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies
IN THIS VOLUME

0 Sessions, 141 Papers, 0 Presentations
Front Matter  (1)
Session 2-1  (9)
Session 2-2  (9)
Poster Session  (122)
AOMATT 2008 - 4TH INTERNATIONAL SYMPOSIUM ON ADVANCED OPTICAL MANUFACTURING
19-21 November 2008
Chengdu, Chengdu, China
Front Matter
Proc. SPIE 7282, Front Matter: Volume 7282, 728201 (22 May 2009); doi: 10.1117/12.834721
Session 2-1
Proc. SPIE 7282, Direct diamond turning of steel molds for optical replication, 728202 (21 May 2009); doi: 10.1117/12.830778
Proc. SPIE 7282, Double-swing method used for polishing off-axis aspherical mirrors, 728203 (21 May 2009); doi: 10.1117/12.830781
Proc. SPIE 7282, A mechanistic cutting force model for diamond fly-cutting of microstructured surface, 728204 (21 May 2009); doi: 10.1117/12.830782
Proc. SPIE 7282, Precision compression molding process of low Tg glass aspheric lenses, 728205 (21 May 2009); doi: 10.1117/12.830783
Proc. SPIE 7282, Fabrication of microglass lens mould by using ultraprecision microgrinding process, 728206 (21 May 2009); doi: 10.1117/12.830785
Proc. SPIE 7282, Polishing of silicon based advanced ceramics, 728207 (21 May 2009); doi: 10.1117/12.830786
Proc. SPIE 7282, Freeform turning lathe with direct drives and aerostatic bearing, 728208 (21 May 2009); doi: 10.1117/12.830788
Proc. SPIE 7282, Influence of slurry pH on material removal rate and surface roughness of super-precision polishing of LBO crystal, 728209 (21 May 2009); doi: 10.1117/12.830789
Proc. SPIE 7282, Material removal rate based on edge effects in ultraprecision polishing process, 72820A (21 May 2009); doi: 10.1117/12.830791
Session 2-2
Proc. SPIE 7282, Finite element simulation and experimental research in cutting forces of KDP crystal, 72820B (21 May 2009); doi: 10.1117/12.830793
Proc. SPIE 7282, Experimental investigation on the effect of abrasive grain size on the lapping uniformity of a sapphire wafer, 72820C (21 May 2009); doi: 10.1117/12.830794
Proc. SPIE 7282, Study on the influence and disposal method of the micro-cracks of optical components, 72820D (21 May 2009); doi: 10.1117/12.830795
Proc. SPIE 7282, Experimental investigation on polishing of ultrasmooth surface in nanoparticle colloid jet machining, 72820E (21 May 2009); doi: 10.1117/12.830796
Proc. SPIE 7282, Optical design and optimization of zoom optics with diffractive optical element, 72820F (21 May 2009); doi: 10.1117/12.830797
Proc. SPIE 7282, Effects of velocity and pressure distributions on material removal rate in polishing process, 72820G (21 May 2009); doi: 10.1117/12.830798
Proc. SPIE 7282, Development of an ultraprecision three axis micromilling machine, 72820H (21 May 2009); doi: 10.1117/12.830799
Proc. SPIE 7282, Deterministic magnetorheological finishing of optical aspheric mirrors, 72820I (21 May 2009); doi: 10.1117/12.830800
Proc. SPIE 7282, Image density property of optical information recording microcapsule material, 72820J (21 May 2009); doi: 10.1117/12.830801
Poster Session
Proc. SPIE 7282, Study on experiment of grinding SiC mirror with fixed abrasive, 72820K (21 May 2009); doi: 10.1117/12.830802
Proc. SPIE 7282, Structures and graphics of spacial spherical parallel grids with laser direct writing, 72820L (21 May 2009); doi: 10.1117/12.830803
Proc. SPIE 7282, Transfer matrix method and dispersive formula of light in thin films, 72820M (21 May 2009); doi: 10.1117/12.830804
Proc. SPIE 7282, Design of aspherical surfaces for panoramic imagers using multi-populations genetic algorithm, 72820N (21 May 2009); doi: 10.1117/12.830805
Proc. SPIE 7282, Three regions in the material removal rate with the increase of the concentration of abrasives slurry, 72820O (21 May 2009); doi: 10.1117/12.830806
Proc. SPIE 7282, Annealing induced optical properties of YSZ thin films prepared by EB-PVD, 72820P (21 May 2009); doi: 10.1117/12.830807
Proc. SPIE 7282, Study of PZT actuated deformable aspheric polishing lap, 72820Q (21 May 2009); doi: 10.1117/12.830808
Proc. SPIE 7282, Infrared antireflection DLC films by femtosecond pulsed laser deposition, 72820R (21 May 2009); doi: 10.1117/12.830809
Proc. SPIE 7282, Influence of cutting velocity on surface roughness of KDP, 72820S (21 May 2009); doi: 10.1117/12.830810
Proc. SPIE 7282, Influence of tool presetting error on surface accuracy in ultraprecision machining, 72820T (21 May 2009); doi: 10.1117/12.830811
Proc. SPIE 7282, Research on realization technique of precision forming for laser shock, 72820U (21 May 2009); doi: 10.1117/12.830812
Proc. SPIE 7282, Experiment and simulation of micromilling process for plastic material, 72820V (21 May 2009); doi: 10.1117/12.830813
Proc. SPIE 7282, IAD-Si coatings on RB-SiC space mirrors for ultrasmooth surfaces, 72820W (21 May 2009); doi: 10.1117/12.830814
Proc. SPIE 7282, Research of optical flats in pad polishing, 72820X (21 May 2009); doi: 10.1117/12.830815
Proc. SPIE 7282, Improved two-dimensional orthogonal cylindrical lens arrays optical system with controllable focus profile for uniform irradiation, 72820Y (21 May 2009); doi: 10.1117/12.830816
Proc. SPIE 7282, Research on the surface of a nonspherical lens with photosensitive colophony, 72820Z (21 May 2009); doi: 10.1117/12.830817
Proc. SPIE 7282, Manufacturing of the 1070mm F/1.5 ellipsoid mirror, 728210 (21 May 2009); doi: 10.1117/12.830818
Proc. SPIE 7282, Fast tool servo system for online compensation of error motion on an ultraprecision lathe, 728211 (21 May 2009); doi: 10.1117/12.830820
Proc. SPIE 7282, Smoothing treatment of high order aspherical surface, 728212 (21 May 2009); doi: 10.1117/12.830821
Proc. SPIE 7282, Methods for increasing the etching uniformity of ion beam multiple mask, 728213 (21 May 2009); doi: 10.1117/12.830822
Proc. SPIE 7282, Novel method for optimizing polishing tool-path in CCOS based on weighted-iterative algorithm, 728214 (21 May 2009); doi: 10.1117/12.830823
Proc. SPIE 7282, Effects of thickness and substrate temperature on the electrical and optical properties of In2O3-ZnO films, 728215 (21 May 2009); doi: 10.1117/12.830824
Proc. SPIE 7282, Investigation of conductive and transparent Al-doped ZnO/metal dual-layer films by magnetron sputtering, 728216 (21 May 2009); doi: 10.1117/12.830860
Proc. SPIE 7282, Optical and electrochemical properties of the protonic state electrochromic device: NiOx/Ta2O5/WO3-x, 728217 (21 May 2009); doi: 10.1117/12.830861
Proc. SPIE 7282, Optimization of actuator forces in shaping aspheric surfaces on ultrathin mirrors, 728218 (21 May 2009); doi: 10.1117/12.830862
Proc. SPIE 7282, Moment acting on workpiece in solid abrasive plane lapping, 728219 (21 May 2009); doi: 10.1117/12.830863
Proc. SPIE 7282, Influences of cutting section and corner radius to cutting force in diamond turning, 72821A (21 May 2009); doi: 10.1117/12.830865
Proc. SPIE 7282, Research on high-speed deposition thermodynamics characteristic for DLC thin film by RF-PECVD, 72821B (21 May 2009); doi: 10.1117/12.830867
Proc. SPIE 7282, Transparent conductive titanium-doped indium oxide films prepared by direct current magnetron sputtering, 72821C (21 May 2009); doi: 10.1117/12.830868
Proc. SPIE 7282, Optical properties of In-doped TiO2 thin films, 72821D (21 May 2009); doi: 10.1117/12.830869
Proc. SPIE 7282, Research on ultrathin mirror fabrication and demonstration of an Ø500mm ultrathin mirror, 72821E (21 May 2009); doi: 10.1117/12.830870
Proc. SPIE 7282, Wide-angle and broadband nonpolarizing parallel plate beam splitter, 72821F (21 May 2009); doi: 10.1117/12.830871
Proc. SPIE 7282, Effect of substrate bias and arc current on AlN films, 72821G (21 May 2009); doi: 10.1117/12.830872
Proc. SPIE 7282, Primary optical system design for the optimization of light-emitting diode packages, 72821H (21 May 2009); doi: 10.1117/12.830875
Proc. SPIE 7282, Design of a detection system of highlight LED arrays' effect on the human organization, 72821I (21 May 2009); doi: 10.1117/12.830876
Proc. SPIE 7282, Analyzing and processing the images of self-organized patterns, 72821J (21 May 2009); doi: 10.1117/12.830877
Proc. SPIE 7282, Optical design of long focal length and wide field on an aerial CCD camera, 72821K (21 May 2009); doi: 10.1117/12.830878
Proc. SPIE 7282, LED optical engine based on a rectangular CPC for microprojection display, 72821L (21 May 2009); doi: 10.1117/12.830879
Proc. SPIE 7282, Vector analysis of the characteristics of diffractive microlens having common focus for a number of wavelengths, 72821M (21 May 2009); doi: 10.1117/12.830880
Proc. SPIE 7282, Indium-tin oxide conductive films on flexible substrates deposited by the DC magnetron sputtering method, 72821N (21 May 2009); doi: 10.1117/12.830881